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Probe with integral vent, sampling port and filter element 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-001/14
출원번호 US-0393290 (2003-03-21)
발명자 / 주소
  • Brassell, Gilbert
  • Wickland, Terry J.
  • Popish, Darold M.
출원인 / 주소
  • Nuclear Filter Technology
대리인 / 주소
    Millen, White, Zelano &
인용정보 피인용 횟수 : 62  인용 특허 : 22

초록

A probe with an integral filtered vent and sampling port has a hollow shaft configured as a drill bit which in use passes through the lid of a drum containing waste products within a liner. The hollow shaft has a penetrating tip and at lest two radial bores, one of which is positioned to open to the

대표청구항

1. A probe with an integral vent and sampling port, comprising:a hollow shaft with an axial bore therethrough, the shaft having a penetrating tip at a first end and a radially extending head at a second end; at least one first radial port extending through the hollow shaft and in communication with

이 특허에 인용된 특허 (22)

  1. Brassell Gilbert W. (13237 W. Eighth Ave. Golden CO 80401), Assembly useful for retaining components such as a filter to a container and a corresponding combination.
  2. Brassell Gilbert W. (13237 W. 8th Ave. Golden CO 80401) Brugger Ronald P. (Lafayette CO), Bonded carbon or ceramic fiber composite filter vent for radioactive waste.
  3. Brassell Gilbert W. (13237 W. Eighth Ave. Golden CO 80401), Combination of a filter and a material permeable to gases but impermeable to liquids.
  4. Ward William H. (171A Overmount Ave. Kinnelon NJ 07405) Ward ; Jr. William H. (171A Overmount Ave. West Paterson NJ 07424), Container closure spout construction and method of forming same.
  5. Vodila James M. (North Huntingdon PA) Bergersen Jeffrey A. (Idaho Falls ID), Device and method for remotely venting a container.
  6. Terry J. Wickland ; Michael D. Peterson, Drum vent filter.
  7. Brassell Gilbert W. (13237 W. Eighth Ave. Golden CO 80401), Filter for hazardous waste containers.
  8. Johnston Roger G. ; Garcia Anthony R. E. ; Martinez Ronald K., Fluid sampling tool.
  9. Wickland Terry J. ; Stephens Carl, HEPA filtered storage canisters.
  10. Wickland Terry J. ; Stephens Carl, Hepa filtered storage canisters.
  11. Felbaum John Wayne ; Treadwell David William ; Tassone Joseph, Inert-metal lined, seamless steel-body cylinder.
  12. Renslow Bruce E., Liquid sample collector and liquid return apparatus.
  13. Pinson Paul A., Method for contamination control and barrier apparatus with filter for containing waste materials that include dangerou.
  14. Temus Charles J. (Puyallup WA), Method of installing a vent in a nuclear waste storage system.
  15. Brassell Gilbert W. ; Warren John L. ; Wickland Charles E. ; Sanchez Harold ; Castagneri Mark A., Methods of and apparatus for testing and venting drums.
  16. Brassell Gilbert W. ; Warren John L. ; Wickland Charles E. ; Sanchez Harold J. ; Castagneri Mark A., Methods of and apparatus for testing and venting drums.
  17. Shaw Mark D. ; Bierce Laurence M. ; Heyman J. Tad, Multi-stage vent filter.
  18. Canfield Michael H. (406 Normandy Rd. Versailles KY 40383), Tool for sampling oil from electric distribution transformer tanks for PCB contamination.
  19. Wickland Terry J. ; Brassell Emily, Vent assemblies for waste disposal bags.
  20. Seibert Jeffrey M. (Cortland NY) Rahimi Riazuddin S. (Town of Homer NY), Vent filter assembly.
  21. Terry J. Wickland ; Michael D. Peterson ; David E. Joseffy ; Gilbert A. Brassell, Vent filter with direct sample capability.
  22. Rits Miriam, Vented flask cap for absorbing radioactive gases.

이 특허를 인용한 특허 (62)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Strid,Eric; Gleason,K. Reed, Active wafer probe.
  3. Meikle, Peter John; Leslie, Paul Basil; Vythoulkas, John; Korsa, Matthew Stephen; Al-Farra, Tawfeeq Gehad; Knox, Ronald, Air sampling system for a low-temperature space that enables removal of ice build-up within a sampling conduit.
  4. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  5. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  6. Strid, Eric; Campbell, Richard, Differential signal probing system.
  7. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  8. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  9. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  10. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  11. Coleman, Dennis; Todd, Coleman, Low dead-volume core-degassing apparatus.
  12. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  13. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  14. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  15. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  16. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
  17. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
  18. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  19. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  20. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  21. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  22. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  23. Gleason,K. Reed; Smith,Kenneth R.; Bayne,Mike, Membrane probing system with local contact scrub.
  24. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth, Method for constructing a membrane probe using a depression.
  25. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  26. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  27. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  28. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  29. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  30. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  31. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  32. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  33. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Probe for testing a device under test.
  34. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  35. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  36. Schwindt,Randy, Probe holder for testing of a test device.
  37. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  38. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  39. Crumpton, Eric, Sample retrieval apparatus and method.
  40. Dykes, Jr., H. Waite H., Sampling adapter.
  41. Coleman, Todd; Rice, Corben; Coleman, Dennis, Sampling container for collection of fluids.
  42. Coleman, Todd; Rice, Corben; Coleman, Dennis, Sampling container for collection of fluids.
  43. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  44. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  45. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  46. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  47. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  48. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  49. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  50. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  51. Wickland, Terry; Popish, Parold; Peterson, Michael Dean; Popish, Fred Louis, Spherical storage containers.
  52. Wickland, Terry J.; Popish, Darold M.; Peterson, Michael D.; Popish, Fred Louis, Storage container.
  53. Andrews, Peter; Hess, David, System for testing semiconductors.
  54. Blouin, Matthew; Murphy, Gregory; Mackenzie, Diana; Weeks, Alan; Kobrenski, Daniel, Telescoping closed-tube sampling assembly.
  55. Blouin, Matthew; Murphy, Gregory; Mackenzie, Diana; Weeks, Alan; Kobrenski, Daniel, Telescoping closed-tube sampling assembly.
  56. Campbell, Richard, Test structure and probe for differential signals.
  57. Campbell,Richard, Test structure and probe for differential signals.
  58. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  59. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  60. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  61. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  62. Campbell, Richard, Wideband active-passive differential signal probe.
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