IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0042765
(2005-01-24)
|
우선권정보 |
DE-10 2004 003 487(2004-01-23) |
발명자
/ 주소 |
|
출원인 / 주소 |
- Dr. Johannes Heidenhain GmbH
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
2 인용 특허 :
4 |
초록
▼
A probe system includes a transceiver unit and a probe head that is mobile with respect to the transceiver unit and has a feeler. The probe head has a circuit which includes a sensor unit, a CPU, a transmitting stage and a direct-voltage source. In response to a deflection of the feeler, the sensor
A probe system includes a transceiver unit and a probe head that is mobile with respect to the transceiver unit and has a feeler. The probe head has a circuit which includes a sensor unit, a CPU, a transmitting stage and a direct-voltage source. In response to a deflection of the feeler, the sensor unit triggers an electrical signal which is converted in the transmitting stage into an electromagnetic signal. The circuit is configured such that, between the direct-voltage source and the transmitting stage, a voltage transformer is connected by which a voltage is able to be generated which is greater than the output voltage of the direct-voltage source and is applied to the transmitting stage. A method is for operating a probe system.
대표청구항
▼
What is claimed is: 1. A probe system, comprising: a transceiver unit; and a probe head movable with respect to the transceiver unit, the probe head including a feeler and a circuit, the circuit including a sensor unit, a CPU, a transmitting stage and a direct-voltage source configured to supply en
What is claimed is: 1. A probe system, comprising: a transceiver unit; and a probe head movable with respect to the transceiver unit, the probe head including a feeler and a circuit, the circuit including a sensor unit, a CPU, a transmitting stage and a direct-voltage source configured to supply energy to the sensor unit, the CPU and the transmitting stage, the sensor unit configured to trigger an electrical signal in response to a deflection of the feeler, the transmitting stage configured to convert the electrical signal into an electromagnetic signal, the transceiver unit configured to receive the electromagnetic signal, the circuit including a voltage transformer arranged between the direct-voltage source and the transmitting stage, the voltage transformer configured to generate a voltage greater than an output voltage of the direct-voltage source and to apply the voltage to the transmitting stage. 2. The probe system according to claim 1, wherein the direct-voltage source includes at least one battery. 3. The probe system according to claim 1, wherein, at a value of the output voltage of the direct-voltage source below 5 V, the voltage transformer is configured to generate the voltage applied to the transmitting stage to operate the transmitting stage. 4. The probe system according to claim 1, wherein, at a value of the output voltage of the direct-voltage source below 3 V, the voltage transformer is configured to generate the voltage applied to the transmitting stage to operate the transmitting stage. 5. The probe system according to claim 1, wherein, at a value of the output voltage of the direct-voltage source between 5 V and 16 V, the voltage transformer is configured to generate the voltage applied to the transmitting state to operate the transmitting stage. 6. The probe system according to claim 1, wherein, at a value of the output voltage of the direct-voltage source between 3 V and 16 V, the voltage transformer is configured to generate the voltage applied to the transmitting state to operate the transmitting stage. 7. The probe system according to claim 1, wherein the voltage of the voltage transformer is settable to a first value configured to produce a measuring-operation mode and to a second value configured to produce a standby mode, the first value greater than the second value. 8. The probe system according to claim 1, wherein the circuit includes a voltage limiter, the voltage transformer and the voltage limiter connected between the direct-voltage source and the CPU, the voltage limiter connected between the voltage transformer and the CPU to reduce an input voltage of the CPU. 9. The probe system according to claim 1, wherein the circuit includes a voltage limiter, voltage transformer and the voltage limiter connected between the direct-voltage source and the sensor unit, the voltage limiter connected between the voltage transformer and the sensor unit to reduce an input voltage of the sensor unit. 10. The probe system according to claim 1, further comprising a voltage limiter connected in series to and in front of the sensor unit, the voltage limiter configured to interrupt an electrical connection between the direct-voltage source and the sensor unit to produce a standby mode. 11. The probe system according to claim 1, wherein the voltage transformer includes a boost circuit and a voltage limiter configured to protect the boost circuit from an excessively high voltage. 12. A probe system, comprising: a transceiver unit; and a probe head movable with respect to the transceiver unit, the probe head including a feeler and a circuit, the circuit including a transmitting stage and a direct-voltage source configured to supply energy to the transmitting stage, the transmitting stage configured to convert an electrical signal, triggered in response to a deflection of the feeler, into an electromagnetic signal, the transceiver unit configured to receive the electromagnetic signal, the circuit including a voltage transformer arranged between the direct-voltage source and the transmitting stage, the voltage transformer configured to generate a voltage applied to the transmitting stage greater than an output voltage of the direct-voltage source, the voltage of the voltage transformer settable to a first value configured to produce a measuring-operation mode and to a second value configured to produce a standby mode, the first value greater than the second value.
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