[미국특허]
Projection optical system and projection exposure apparatus
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G02B-003/00
G02B-009/00
출원번호
US-0992853
(2004-11-22)
우선권정보
JP-2000-037981(2000-02-16)
발명자
/ 주소
Terasawa,Chiaki
Ishii,Hiroyuki
Kato,Takashi
출원인 / 주소
Canon Kabushiki Kaisha
대리인 / 주소
Fitzpatrick, Cella, Harper &
인용정보
피인용 횟수 :
33인용 특허 :
21
초록▼
A projection optical system for projecting an image of an object onto an image plane. The projection optical system includes a first imaging optical system for forming an image of the object in which the first imaging optical system includes a first mirror for reflecting and collecting abaxial light
A projection optical system for projecting an image of an object onto an image plane. The projection optical system includes a first imaging optical system for forming an image of the object in which the first imaging optical system includes a first mirror for reflecting and collecting abaxial light from the object, a second imaging optical system for re-imaging the image upon the image plane, a second mirror for reflecting light from the first mirror to the image plane side, whereby the abaxial light is caused to pass outside of an effective diameter of the first mirror, and a field optical system including three lenses each having a positive refractive power. The abaxial light passed through the outside of the effective diameter of the first mirror is refracted by the three lenses toward a direction nearing an optical axis of the three lenses. Light that has passed through the three lenses is directed to the second imaging optical system, and the first and second imaging optical systems are disposed along a common optical axis.
대표청구항▼
What is claimed is: 1. A projection optical system for projecting an image of an object onto an image plane, said projection optical system comprising: a first imaging optical system for forming an image of the object, said first imaging optical system including a first mirror for reflecting and co
What is claimed is: 1. A projection optical system for projecting an image of an object onto an image plane, said projection optical system comprising: a first imaging optical system for forming an image of the object, said first imaging optical system including a first mirror for reflecting and collecting abaxial light from the object; a second imaging optical system for re-imaging the image upon the image plane; a second mirror for reflecting the abaxial light from said first mirror to the image plane side, whereby the abaxial light is caused to pass outside of an effective diameter of said first mirror; and a field optical system including three lenses each having a positive refractive power, wherein the abaxial light passed through the outside of the effective diameter of said first mirror is refracted by said three lenses toward a direction nearing an optical axis of said three lenses, wherein, in a meridional plane, the abaxial light passes through only one side of said three lenses with respect to the optical axis, wherein light that has passed through said three lenses is directed to said second imaging optical system, and wherein said first and second imaging optical systems are disposed along a common optical axis. 2. A projection optical system according to claim 1, wherein said field optical system includes one lens having a negative refractive power. 3. A projection exposure apparatus for projecting a pattern of a mask onto a substrate through a projection optical system as recited in claim 1. 4. A projection exposure apparatus according to claim 3, wherein laser light from one of an ArF excimer laser and an F2 excimer laser is used for the projection optical system. 5. A device manufacturing method, comprising the steps of: printing a device pattern on a wafer by exposure, using a projection exposure apparatus as recited in claim 3. 6. A projection exposure apparatus for projecting an image of an object onto an image plane, said apparatus comprising: a first imaging optical system for forming an intermediate image of the object, said first imaging optical system including (i) a first lens unit having a positive power, (ii) a first optical unit having a first mirror for reflecting and collecting abaxial light from the object, (iii) a second optical unit having a second mirror for reflecting light from said first mirror to the image plane side, with which the abaxial light is caused to pass an outside of an effective diameter of said first mirror, and (iv) a second lens unit having a negative power and being disposed between said first and second mirrors; a second imaging optical system for re-imaging the intermediate image upon the image plane, said second imaging optical system being composed of a plurality of lenses; and a field optical system disposed between said first imaging optical system and said second imaging optical system, for projecting a pupil of said first imaging optical system onto said second imaging optical system, said field optical system including three lenses each having a positive power, wherein, in a meridional plane, the abaxial light passes through only one side of said three lenses with respect to the optical axis, and wherein said first imaging optical system, said second imaging optical system and said field optical system are disposed along a common straight optical axis. 7. A projection exposure apparatus according to claim 6, further comprising a projection optical system for projecting a pattern of a mask onto a substrate. 8. A device manufacturing method, comprising the steps of: printing a device pattern on a wafer by exposure, using a projection exposure apparatus as recited in claim 7; and developing the exposed wafer.
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