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System and method for installing a tamper barrier wrap in a PCB assembly, including a PCB assembly having improved heat sinking 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B65B-011/58
  • B65B-011/00
출원번호 US-0868335 (2004-06-15)
발명자 / 주소
  • Perreault,Paul G
  • Clark,Douglas A
  • Heitmann,Kjell A
출원인 / 주소
  • Pitney Bowes Inc.
인용정보 피인용 횟수 : 50  인용 특허 : 22

초록

A method of attaching a tamper wrap to a printed circuit board using an installation tool that is placed over the main body portion of the tamper wrap. The side tabs of the tamper wrap are folded up against the side walls of the installation tool, and the tamper wrap and the installation tool are in

대표청구항

What is claimed is: 1. A method of attaching a flexible tamper wrap to a printed circuit board, said tamper wrap having a main body portion and a plurality of side tabs extending from said main body portion, said method comprising the steps of: laying said tamper wrap out flatly; placing an install

이 특허에 인용된 특허 (22)

  1. Candelore Brant, Anti-tamper integrated circuit.
  2. Stahlecker Werner,DEX, Apparatus for producing and applying a protective covering to a cut edge of an opening of a container wall.
  3. Kleijne Theodoor A. (Dreumel NLX) de Bruin Johannes A. J. (Montfoort NLX) Goossens Jan B. (De Bilt NLX), Data security device for protecting stored data.
  4. Petsinger Julie Ann, Electromagnetic shield to prevent surreptitious access to contactless smartcards.
  5. Johnson Roberta L. (Atlanta GA), Insulated shipping container.
  6. van de Haar Rijk (Joure NLX) Thomassen Johan H. C. (Zeist NLX), Packing method and a blank for use therein.
  7. JP Leon, Postage metering system.
  8. Koyama, Yasuhiro; Bando, Takeshi; Iida, Yukiko; Saitou, Ikuya, Process and apparatus for manufacturing packages.
  9. Imer Rodney Haydn,ESX, Rectangular thin film pack.
  10. Kleijne Theodoor A. (Dreumel NLX), Security device for sensitive data.
  11. Kleijne Theodoor A. (Dreumel NLX) Goossens Jan B. (De Bilt NLX), Security device for stored sensitive data.
  12. Kleijne Theodoor A. (ZA Dreumel NLX), Security device for the secure storage of sensitive data.
  13. Hiroyuki Tomooka JP, Security sensor having disturbance detecting capability.
  14. Stoltz Dennis J. (Austell GA), Self-centering laminated process for corrugated containers and blank therefor.
  15. Rivenberg Howard Christopher (Mercer NJ) Levine Aaron William (Mercer NJ) Desai Nitin Vithalbhai (Mercer NJ), Tamper detection device.
  16. Comerford Liam D. (Carmel NY) Ledermann Peter G. (Pleasantville NY) Levy Lawrence I. (Yorktown Heights NY) White Steve R. (New York NY), Tamper resistant packaging for information protection in electronic circuitry.
  17. Tuttle John R. ; Wood ; Jr. Clifton W. ; McCabe Arthur Barney, Tamper resistant smart card and method of protecting data in a smart card.
  18. MacPherson Hugh,GBX, Tamper respondent enclosure.
  19. Simpson Carolyn N. (1946 E. 6400 South Salt Lake City UT 84121) Perry John A. (1838 Wasatch Dr. Salt Lake City UT 84104), Tamper-proof wrap.
  20. Weingart Steve H. (Peekskill NY), Tamper-resistant packaging for protection of information stored in electronic circuitry.
  21. Piosenka Gerald V. (Scottsdale AZ) Harrison David M. (Mesa AZ) Chandos Ronald V. (Tempe AZ), Tamperproof arrangement for an integrated circuit device.
  22. Piosenka Gerald V. (Scottsdale AZ) Harrison David M. (Mesa AZ) Chandos Ronald V. (Tempe AZ), Tamperproof arrangement for an integrated circuit device.

이 특허를 인용한 특허 (50)

  1. Pham, Cuong V.; Chubin, David E.; Clarke, Robert A.; Kuan, Aaron D., Anti-tamper mesh.
  2. Fisher, Michael J.; Long, David C.; Merte, Donald; Weiss, Robert; Weiss, Thomas, Applying pressure to adhesive using CTE mismatch between components.
  3. Brodsky, William L.; Dragone, Silvio; Krabbenhoft, Roger S.; Long, David C.; Oggioni, Stefano S.; Peets, Michael T.; Santiago-Fernandez, William, Circuit boards and electronic packages with embedded tamper-respondent sensor.
  4. Brodsky, William L.; Dragone, Silvio; Krabbenhoft, Roger S.; Long, David C.; Oggioni, Stefano S.; Peets, Michael T.; Santiago-Fernandez, William, Circuit boards and electronic packages with embedded tamper-respondent sensor.
  5. Brodsky, William L.; Busby, James A.; Cohen, Edward N.; Isaacs, Phillip Duane, Circuit layouts of tamper-respondent sensors.
  6. Brodsky, William L.; Busby, James A.; Cohen, Edward N.; Isaacs, Phillip Duane, Circuit layouts of tamper-respondent sensors.
  7. Bonnet, Eric; Gary, Didier; Dedieu, Philippe, Device for the protection of an electronic component.
  8. Isaacs, Phillip D.; Peets, Michael T.; Wei, Xiaojin, Electronic package with heat transfer element(s).
  9. Brodsky, William L.; Dangler, John R.; Dreiss, Zachary T.; Long, David C.; Peets, Michael T.; Santiago-Fernandez, William; Weiss, Thomas, Enclosure with inner tamper-respondent sensor(s).
  10. Brodsky, William L.; Dangler, John R.; Dreiss, Zachary T.; Long, David C.; Peets, Michael T.; Santiago-Fernandez, William; Weiss, Thomas, Enclosure with inner tamper-respondent sensor(s).
  11. Fisher, Michael J.; Long, David C.; Peets, Michael T.; Weiss, Thomas, Enclosure with inner tamper-respondent sensor(s) and physical security element(s).
  12. Fisher, Michael J.; Long, David C.; Peets, Michael T.; Weiss, Thomas, Enclosure with inner tamper-respondent sensor(s) and physical security element(s).
  13. Fisher, Michael J.; Long, David C.; Peets, Michael T.; Weiss, Thomas, Enclosure with inner tamper-respondent sensor(s) and physical security element(s).
  14. Isaacs, Phillip D.; Peets, Michael T.; Wei, Xiaojin, Manufacturing electronic package with heat transfer element(s).
  15. Dangler, John R.; Isaacs, Phillip Duane; Long, David C., Method of fabricating tamper-respondent sensor.
  16. Heitmann,Kjell A; Clark,Douglas A; Perreault,Paul G, Method of making tamper detection circuit for an electronic device.
  17. Busby, James A.; Isaacs, Phillip Duane; Santiago-Fernandez, William, Multi-layer stack with embedded tamper-detect protection.
  18. Busby, James A.; Isaacs, Phillip Duane; Santiago-Fernandez, William, Multi-layer stack with embedded tamper-detect protection.
  19. Busby, James A.; Isaacs, Phillip Duane; Santiago-Fernandez, William, Multi-layer stack with embedded tamper-detect protection.
  20. Busby, James A.; Isaacs, Phillip Duane; Santiago-Fernandez, William, Multi-layer stack with embedded tamper-detect protection.
  21. Busby, James A.; Isaacs, Phillip Duane; Santiago-Fernandez, William, Multi-layer stack with embedded tamper-detect protection.
  22. Brodsky, William L.; Dangler, John R.; Isaacs, Phillip Duane; Long, David C.; Peets, Michael T., Overlapping, discrete tamper-respondent sensors.
  23. Hunter,Steve B.; Murray,Dale D.; Voltz,John A.; Wylie,Harold S., Reusable tamper respondent enclosure.
  24. Clark,Douglas A; Heitmann,Kjell A; Perreault,Paul G, Tamper barrier enclosure with corner protection.
  25. Heitmann,Kjell A; Clark,Douglas A; Perreault,Paul G, Tamper barrier for electronic device.
  26. Steiner, Timothy Wayne, Tamper respondent apparatus.
  27. Hunter, Steve B.; Voltz, John A; Lewis, Brent W.; Wylie, Harold S., Tamper respondent sensor and enclosure.
  28. Busby, James A.; Dragone, Silvio; Fisher, Michael J.; Gaynes, Michael A.; Long, David C.; Rodbell, Kenneth P.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-proof electronic packages formed with stressed glass.
  29. Busby, James A.; Dragone, Silvio; Fisher, Michael J.; Gaynes, Michael A.; Long, David C.; Rodbell, Kenneth P.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-proof electronic packages formed with stressed glass.
  30. Busby, James A.; Dragone, Silvio; Gaynes, Michael A.; Rodbell, Kenneth P.; Santiago-Fernandez, William, Tamper-proof electronic packages with stressed glass component substrate(s).
  31. Busby, James A.; Dragone, Silvio; Gaynes, Michael A.; Rodbell, Kenneth P.; Santiago-Fernandez, William, Tamper-proof electronic packages with stressed glass component substrate(s).
  32. Campbell, Levi A.; David, Milnes P.; Demetriou, Dustin W.; Ellsworth, Jr., Michael J., Tamper-proof electronic packages with two-phase dielectric fluid.
  33. Campbell, Levi A.; David, Milnes P.; Demetriou, Dustin W.; Ellsworth, Jr., Michael J., Tamper-proof electronic packages with two-phase dielectric fluid.
  34. Brodsky, William L.; Busby, James A.; Isaacs, Phillip Duane; Long, David C., Tamper-respondent assemblies.
  35. Brodsky, William L.; Busby, James A.; Isaacs, Phillip Duane; Long, David C., Tamper-respondent assemblies.
  36. Brodsky, William L.; Busby, James A.; Dreiss, Zachary T.; Fisher, Michael J.; Long, David C.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with bond protection.
  37. Brodsky, William L.; Busby, James A.; Dreiss, Zachary T.; Fisher, Michael J.; Long, David C.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with bond protection.
  38. Brodsky, William L.; Busby, James A.; Dreiss, Zachary T.; Fisher, Michael J.; Long, David C.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with bond protection.
  39. Brodsky, William L.; Busby, James A.; Cohen, Edward N.; Dragone, Silvio; Fisher, Michael J.; Long, David C.; Peets, Michael T.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with enclosure-to-board protection.
  40. Brodsky, William L.; Busby, James A.; Cohen, Edward N.; Dragone, Silvio; Fisher, Michael J.; Long, David C.; Peets, Michael T.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with enclosure-to-board protection.
  41. Brodsky, William L.; Busby, James A.; Cohen, Edward N.; Dragone, Silvio; Fisher, Michael J.; Long, David C.; Peets, Michael T.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with enclosure-to-board protection.
  42. Brodsky, William L.; Busby, James A.; Cohen, Edward N.; Dragone, Silvio; Fisher, Michael J.; Long, David C.; Peets, Michael T.; Santiago-Fernandez, William; Weiss, Thomas, Tamper-respondent assemblies with enclosure-to-board protection.
  43. Dangler, John R.; Long, David C.; Peets, Michael T., Tamper-respondent assemblies with region(s) of increased susceptibility to damage.
  44. Busby, James A.; Fisher, Michael J.; Gaynes, Michael A.; Long, David C.; Weiss, Thomas, Tamper-respondent assemblies with trace regions of increased susceptibility to breaking.
  45. Busby, James A.; Isaacs, Phillip Duane, Tamper-respondent assembly with nonlinearity monitoring.
  46. Busby, James A.; Isaacs, Phillip Duane, Tamper-respondent assembly with nonlinearity monitoring.
  47. Isaacs, Phillip Duane, Tamper-respondent assembly with protective wrap(s) over tamper-respondent sensor(s).
  48. Fisher, Michael J.; Long, David C.; Peets, Michael T.; Weiss, Robert; Weiss, Thomas; Tersigni, James E., Tamper-respondent assembly with vent structure.
  49. Fisher, Michael J.; Long, David C.; Peets, Michael T.; Weiss, Robert; Weiss, Thomas; Tersigni, James E., Tamper-respondent assembly with vent structure.
  50. Dangler, John R.; Isaacs, Phillip Duane; Long, David C., Tamper-respondent sensors with formed flexible layer(s).
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