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Method and apparatus for predicting failure in a system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-011/30
출원번호 US-0043712 (2002-01-08)
발명자 / 주소
  • Tryon, III,Robert G.
  • Dey,Animesh
  • Nasser,A. Lorenz
출원인 / 주소
  • Vextec Corporation
대리인 / 주소
    Fish &
인용정보 피인용 횟수 : 54  인용 특허 : 12

초록

The invention regards a system reliability or failure predicting apparatus and method that incorporates known information about system component failure into a system model and uses the model with or without other acquired system data to predict the probability of system failure. An embodiment of th

대표청구항

We claim: 1. A computer-implemented method for predicting failure in a system, the method comprising: receiving data associated with a system, the received data including sensed data indicative of a system response to a specific load on the system while the system is in operation other than undergo

이 특허에 인용된 특허 (12)

  1. Saxena Sharad ; Vasanth Karthik ; Burch Richard G. ; Mozumder Purnendu K. ; Rao Suraj ; Davis Joseph C., Design of microelectronic process flows for manufacturability and performance.
  2. Maguire ; Jr. Harold T. (Pittsburgh PA) Wiesemann John S. (Monroeville PA) Frost David R. (Plum Borough PA) Nath Raymond J. (Murrysville PA) Candris Aristides S. (O\Hara PA), Deterministic, probabilistic and subjective modeling system.
  3. Quist Nancy L. ; Bonnett Austin H. ; Lynch James P. ; Kline ; Sr. Joseph A. ; Henderson Michael I. ; Hannula ; Jr. Ronald Ivar ; Grudkowski Thomas W. ; Divljakovic Vojislav ; Buckley George William ;, Distributed diagnostic system.
  4. Gollomp Bernard P. (West Lawrence NY), Fault diagnostic system incorporating behavior models.
  5. Smyth Padhraic J. (Altadena CA), Hidden markov models for fault detection in dynamic systems.
  6. Bajpai Atul (Warren MI) Marczewski Richard W. (Rochester MI) Marek Melissa M. (Royal Oak MI) Shrivastava Anil B. (Troy MI) Amble Charles S. (Prudenville MI) Joyce Robert H. (San Jose CA) Kishore Nand, Method and apparatus for diagnosing machines.
  7. Leuthausser Ulrich,DEX ; Sellen Jurgen,DEX, Method for estimating the failure rate of components of technical devices.
  8. Eastman Donald G. ; Elgin Richard L. ; Hao Beilene, Method of maintaining components subject to fatigue failure.
  9. Sagar Arvindbhai Patel ; Vinay Bhaskar Jammu, Process and system for developing predictive diagnostics algorithms in a machine.
  10. Calabro Salvatore R. (76 Earway Ave. Bellville NJ 07109) Calabro John A. (101-14 Ascan Ave. Forest Hills NY 11375) Hsu Chun (4811 Bradfurd Blvd. Huntsville AL 35805), Reliability and maintainability indicator.
  11. Husseiny Abdo A. (LaPlace LA), System for prognosis and diagnostics of failure and wearout monitoring and for prediction of life expectancy of helicopt.
  12. Kaufer, Stephen; Emrich, Marco A.; Sivakumar, Arunachallam Sivaprakasam; Palka, Thomas, Time management and task completion and prediction software.

이 특허를 인용한 특허 (54)

  1. Reich, Alton; Shaw, James, Adaptive motor resistance video game exercise apparatus and method of use thereof.
  2. Holmes, Richard; Tryon, III, Robert G.; Pope, John E.; Nasser, Daniel A.; Oja, Michael; Dey, Animesh; Hamler, Jesse; Brooks, Jonathan; Tryon, James, Apparatus and methods for testing performance of a material for use in a jet engine.
  3. Chuang, Hsing-Yen; Chauvin, Dewey, Ball bat including a reinforced, low-durability region for deterring barrel alteration.
  4. Chuang, Hsing-Yen; Chauvin, Dewey, Ball bat including a reinforced, low-durability region for deterring barrel alteration.
  5. Chuang, Hsing-Yen; Chauvin, Dewey, Ball bat including multiple failure planes.
  6. Chuang, Hsing-Yen; Chauvin, Dewey, Ball bat including multiple failure planes.
  7. Chuang, Hsing-Yen; Chauvin, Dewey, Ball bat including multiple failure planes.
  8. Chuang, Hsing-Yen; Chauvin, Dewey, Ball bat including multiple failure planes.
  9. Teixeira, Rodrigo, Biomedical parameter probabilistic estimation method and apparatus.
  10. Twerdochlib, Michael, Blade shroud vibration monitor.
  11. Goldfine, Neil J.; Sheiretov, Yanko K.; Washabaugh, Andrew P.; Zilberstein, Vladimir A.; Grundy, David C.; Lyons, Robert J.; Jablonski, David A.; Spencer, Floyd W., Component adaptive life management.
  12. Fitzgerald, Stephen Bruce; St. Laurent, Frederic, Composite ball bat including a barrel with structural regions separated by a porous non-adhesion layer.
  13. Beeson, Danny L.; LeBleu, Jr., James B., Corrosion resistant alloy weldments in carbon steel structures and pipelines to accommodate high axial plastic strains.
  14. Ciplickas,Dennis; Davis,Joe; Hess,Christopher; Lee,Sherry; Malavasi,Enrico; Mohammad,Abdulmobeen; Radojcic,Ratibor; Stine,Brian; Vallishayee,Rakesh; Zanella,Stefano; Dragone,Nicola; Guardiani,Carlo; Quarantelli,Michel; Tonello,Stefano; Aniruddha,Joshi, Designing an integrated circuit to improve yield using a variant design element.
  15. Gross,Kenny C.; Votta, Jr.,Lawrence G.; Porter,Adam, Detecting and correcting a failure sequence in a computer system before a failure occurs.
  16. Benoit, Olivier, Detection of a fault by long disturbance.
  17. Twig, Yuval; Feigenblat, Guy, Determining the impact of elements in a technology system.
  18. Uwatoko, Koki; Yasukawa, Kaoru; Satonaga, Tetsuichi, Failure diagnosis system, image forming apparatus, computer readable medium and data signal.
  19. Murphy, Elissa E. S.; Nichols, David A.; Mehr, John D., Failure-model-driven repair and backup.
  20. Billau, Ronald L.; Cillis, Canio, Macro diversity in a mobile data network with edge breakout.
  21. Billau, Ronald L.; Cillis, Canio, Macro diversity in a mobile data network with edge breakout.
  22. Höfig, Kai; Joanni, Andreas; Montrone, Francesco, Maintenance system and method for analyzing functional failures of a system.
  23. Wookey,Michael J., Managing and predicting component failure based on pattern recognition of subcomponent exposure to failure.
  24. Wookey,Michael J., Managing and predicting risk for computer devices using exposure management techniques.
  25. Wookey,Michael J.; Bingham, Jr.,Paris E.; Helgren,Matthew J., Managing exposure to failure for computer-based systems.
  26. Tryon, III, Robert G.; Dey, Animesh; Nasser, Loren A.; Krishnan, Ganapathi, Materials-based failure analysis in design of electronic devices.
  27. Tryon, III, Robert G.; Dey, Animesh; Nasser, Loren A.; Krishnan, Ganapathi, Materials-based failure analysis in design of electronic devices, and prediction of operating life.
  28. Teixeira, Rodrigo E.; Reich, Alton, Mechanical health monitor apparatus and method of operation therefor.
  29. Gross, Kenny C.; Whisnant, Keith A.; Urmanov, Aleksey M., Method and apparatus for predicting remaining useful life for a computer system.
  30. Tryon, III, Robert G., Method and apparatus for predicting the failure of a component.
  31. Lopez,Leoncio D.; McElfresh,David K.; Vacar,Dan; Gross,Kenny C., Method and apparatus for proactive fault monitoring in interconnects.
  32. Roux,Willem, Method and system for distinguishing effects due to bifurcation from effects due to design variable changes in finite element analysis.
  33. Haas, Peter J.; Lake, John M.; Lohman, Guy M.; Singh, Ashutosh; Syeda-Mahmood, Tanveer F., Method for monitoring dependent metric streams for anomalies.
  34. Mesec, Gilbert Ronald, Method to detect mechanical faults and dynamic instability in rotor systems of helicopters, tilt rotor aircraft, and whirl towers.
  35. Ahuja, Bharat; Collins, Bruce, Methods and apparatus for use of data object popularity measurements for improved quality of service perception in wireless broadcast systems.
  36. Parker, David H.; Payne, John M., Methods for measuring and modeling the process of prestressing concrete during tensioning/detensioning based on electronic distance measurements.
  37. Parker, David H.; Payne, John M., Methods for measuring and modeling the structural health of pressure vessels based on electronic distance measurements.
  38. Parker, David H.; Payne, John M.; Lin, legal representative, Sophie, Methods for modeling the structural health of a civil structure based on electronic distance measurements.
  39. Catt, Christopher Joseph; Howard, Julia Ann, Methods for predicting a speed brake system fault.
  40. Carlin, Jeremiah D.; Kalmbach, Michael T.; Schroeder, Mark D., Mitigating effects of predicted failures in a mobile network basestation due to weather.
  41. Carlin, Jeremiah D.; Kalmbach, Michael T.; Schroeder, Mark D., Mitigating effects of predicted failures in a mobile network basestation due to weather.
  42. Anthony, Jr., Bruce O.; Billau, Ronald L.; Cillis, Canio; Nicholson, Robert B., Mobile network services in a mobile data network.
  43. Anthony, Jr., Bruce O.; Billau, Ronald L.; Cillis, Canio; Nicholson, Robert B., Mobile network services in a mobile data network.
  44. Kagawa,Tetsuya, Network communication terminal apparatus with capability of outputting error occurrence indication.
  45. Shao, Qingqiu Ginger; Magnuson, Randy R.; Miller, Dave; Barton, Bradley John; Kolbet, David Michael, Noisy monitor detection and intermittent fault isolation.
  46. Lingenfelder, Christoph; Pompey, Pascal; Wurst, Michael, Predictive modeling.
  47. Teixeira, Rodrigo E., Probabilistic biomedical parameter estimation apparatus and method of operation therefor.
  48. Teixeira, Rodrigo E., Probabilistic parameter estimation using fused data apparatus and method of use thereof.
  49. Goldfine, Neil J.; Zilberstein, Vladimir A.; Weiss, Volker; Sheiretov, Yanko K., Remaining life prediction for individual components from sparse data.
  50. Reich, Alton; Shaw, James, Remote adaptive motor resistance training exercise apparatus and method of use thereof.
  51. Teixeira, Rodrigo E., Sensor fusion and probabilistic parameter estimation method and apparatus.
  52. Joshi, Rajiv V.; Kanj, Rouwaida N.; Nassif, Sani R.; Radens, Carl J., Statistical design with importance sampling reuse.
  53. Singh, Amandeep; Nikolaidis, Efstratios; Mourelatos, Zissimos P., System and method for importance sampling based time-dependent reliability prediction.
  54. Beck, Folker; Bischoff, Lutz, Vibration control with operating state measurement.
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