국가/구분 |
United States(US) Patent
등록
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국제특허분류(IPC7판) |
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출원번호 |
US-0934442
(2004-09-07)
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우선권정보 |
DE-103 44 264(2003-09-23) |
발명자
/ 주소 |
- Borgmeier,Frieder
- Rosowski,Frank
- Lintz,Hans G체nther
- Grisstede,Ina
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출원인 / 주소 |
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대리인 / 주소 |
Oblon, Spivak, McClelland, Maier &
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인용정보 |
피인용 횟수 :
3 인용 특허 :
20 |
초록
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A process for preparing (meth)acrylic acid by conducting a saturated hydrocarbon precursor compound through a catalyst bed I whose catalysts I have, as the active composition, a multimetal oxide I which has a specific X-ray diffractogram and contains the elements Mo and V, at least one of the elemen
A process for preparing (meth)acrylic acid by conducting a saturated hydrocarbon precursor compound through a catalyst bed I whose catalysts I have, as the active composition, a multimetal oxide I which has a specific X-ray diffractogram and contains the elements Mo and V, at least one of the elements Te and Sb, and also at least one of the elements from the group consisting of Nb, Ta, W, Ce and Ti, wherein the catalyst bed I is interrupted by at least one catalyst bed II whose catalysts II have, as the active composition, a multimetal oxide II which contains the elements Mo, Bi and Fe.
대표청구항
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We claim: 1. A process for preparing (meth)acrylic acid by heterogeneously catalyzed gas phase partial oxidation of at least one saturated hydrocarbon precursor compound at elevated temperature, by conducting a starting reaction gas mixture comprising the at least one saturated hydrocarbon precurso
We claim: 1. A process for preparing (meth)acrylic acid by heterogeneously catalyzed gas phase partial oxidation of at least one saturated hydrocarbon precursor compound at elevated temperature, by conducting a starting reaction gas mixture comprising the at least one saturated hydrocarbon precursor compound, molecular oxygen and at least one inert gas through at least one catalyst bed I whose catalysts I are such that their active composition is at least one multimetal oxide I which contains the elements Mo and V, at least one of the elements Te and Sb, and at least one of the elements from the group consisting of Nb, Ta, W, Ce and Ti, and whose X-ray diffractogram is an X-ray diffractogram I which has reflections h, i and k whose peak locations are at the reflection angles (2Θ) of 22.2짹0.5째 (h), 27.3짹0.5째 (i) and 28.2짹0. 5째 (k), the reflection h being the most intense within the X-ray diffractogram I and also having a half-height width of at most 0.5째, and the half-height width of the reflection i and of the reflection k each being ≦1째, wherein the gas phase partial oxidation of the reaction gas mixture over the catalysts I in the at least one catalyst bed I is interrupted at least once by continuing the gas phase partial oxidation in at least one catalyst bed II whose catalysts II are such that their active composition is at least one multimetal oxide II whose X-ray diffractogram is different to the X-ray diffractogram I and has a stoichiometry of the general formula A, description="In-line Formulae" end="lead"Mo 12BiaFebX1cX2d X3eX4fOn (A)description="In-line Formulae" end="tail" where X1=nickel and/or cobalt, X2=thallium, an alkali metal and/or an alkaline earth metal, X3=zinc, phosphorus, arsenic, boron, antimony, tin, cerium, lead and/or tungsten, X4=silicon, aluminum, titanium and/or zirconium, a=from 0.2 to 5, b=from 0.01 to 5, c=from 0 to 10, d=from 0 to 2, e=from 0 to 8, f=from 0 to 10 and n=a number which is determined by the valency and frequency of the elements in A other than oxygen, or a stoichiometry of the general formula B description="In-line Formulae" end="lead"[Y1 a'Y2b'Ox']p[Y3 c'Y4d'Y5e'Y6f' Y7g'Y2h'Oy']q (B) description="In-line Formulae" end="tail" where Y1=only bismuth or bismuth and at least one of the elements tellurium, antimony, tin and copper, Y2=molybdenum or molybdenum and tungsten, Y3=an alkali metal, thallium and/or samarium, Y4=an alkaline earth metal, nickel, cobalt, copper, manganese, zinc, tin, cadmium and/or mercury, Y5=iron or iron and at least one of the elements vanadium, chromium and cerium, Y6=phosphorus, arsenic, boron and/or antimony, Y7=a rare earth metal, titanium, zirconium, niobium, tantalum, rhenium, ruthenium, rhodium, silver, gold, aluminum, gallium, indium, silicon, germanium, lead, thorium and/or uranium, a'=from 0.01 to 8, b'=from 0.1 to 30, c'=from 0 to 4, d'=from 0 to 20, e'=from >0 to 20, f'=from 0 to 6, g'=from 0 to 15, h'=from 8 to 16, x', y'=numbers which are determined by the valency and frequency of the elements in B other than oxygen and p, q=numbers whose p/q ratio is from 0.1 to 10. 2. A process as claimed in claim 1, wherein the at least one catalyst bed I and the at least one catalyst bed II are each one fixed bed. 3. The process of claim 1, wherein the multimetal oxide I has an X-ray diffractogram wherein the intensity Pi of the reflection i and the intensity Pk of the reflection k have a ratio R of 0.55≦R≦0.85 where R is defined by R=Pi/(Pi+Pk). 4. The process according to claim 3, wherein 0. 65≦R≦0.85. 5. The process according to claim 3, wherein R is from 0.69 to 0.75. 6. The process according to claim 1, wherein the multimetal oxide I has further reflection angles (2θ) of 9.0짹0.4째 (l) 6.7짹0.4째 (o); and 7.9짹0.4째 (p). 7. The process according to claim 1, wherein the multimetal oxide I has a formula: description="In-line Formulae" end="lead"MO1 VaM1bM2cM3d Ondescription="In-line Formulae" end="tail" where M1 is at least one of Te and Sb; M2 is at least one of Nb, Ti, W, Ta and Ce; M3 is at least one selected from the group consisting of Pb, Ni, Co, Bi, Pd, Ca, Mg, Fe, Mn, Ag, Pt, Cu, Au, Ga, Zn, Sn, In, Re, Ir, Sm, Sc, Y, Pr, Nd, and Tb; a is from 0.01 to 1; b is from 0.01 to 1; c is from 0.01 to 1; d is from 0 to 0.5; and n is determined by the valency and frequency of the elements other than oxygen. 8. The process according to claim 7 wherein: a is from 0.05 to 0.6; b is from 0.01 to 1; c is from 0.01 to 1; and d is from 0.0005 to 0.5. 9. The process according to claim 7, wherein: a is from 0.1 to 0.6; b is from 0.1 to 0.5; c is from 0.05 to 0.1; and d is from 0.01 to 0.5. 10. The process according to claim 7, wherein M1 is Te; and M2 is Nb. 11. The process according to claim 1, wherein the X-ray diffractogram of the multimetal oxide I has no 2θ reflection at 50짹0.3째. 12. The process according to claim 1, wherein the gas mixture comprises from 1 to 20% by volume of at least one saturated hydrocarbon precursor, from 0 to 50% by volume of steam, and from 10 to 80% by volume of air. 13. The process according to claim 1, wherein the gas mixture comprises from 1 to 10% by volume of at least one saturated hydrocarbon precursor, from 5 to 25% by volume of steam, and from 10 to 80% by volume of air. 14. The process according to claim 1, wherein the gas mixture comprises from a 2 to 10% by volume of the saturated hydrocarbon precursor, from 5 to 20% by volume of steam, from 60 to 85% by volume of nitrogen, and from 5 to 15% by volume of oxygen. 15. The process according to claim 14, wherein the saturated hydrocarbon precursor compound comprises propane. 16. The process according to claim 1, wherein the multimetal oxide I is present in the form of an annular unsupported catalyst wherein the pores having a diameter less than 0.03 μm are from 0 to 5% by volume of the total pore volume. 17. The process according to claim 1, wherein the multimetal oxide I is present in the form of an unsupported annular catalyst wherein the pores having a diameter in the range of from 0.3 to 0.1 μm are from 20 to 15% by volume of the total pore volume. 18. The process according to claim 1, wherein the multimetal oxide I is present in the form of an unsupported annular catalyst wherein pores having a diameter in the range of from >0.1 to <1 μm are greater than 75% of the total volume of the pores.
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