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[미국특허] Hand held voltage detection probe 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
출원번호 US-0952982 (2004-09-29)
발명자 / 주소
  • Douglas,Philip Norris
출원인 / 주소
  • Santronics, Inc.
인용정보 피인용 횟수 : 100  인용 특허 : 2

초록 ▼

A switchless, hand-held probe and method for detecting and alerting a user to the presence of an AC voltage on a conductor that minimizes the intermittent activation of the probe's indicator due to static charge build-up. The probe includes an antenna, an indicator, and activation and detection circ

대표청구항 ▼

The invention claimed is: 1. A probe for alerting a user to the presence of electrical energy on a conductive member, the probe comprising: an antenna to sense electrical energy; an indicator to alert a user when activated by activation and detection circuitry; activation and detection circuitry co

이 특허에 인용된 특허 (2) 인용/피인용 타임라인 분석

  1. Douglas, Phillip Norris, Hand-held voltage detection probe.
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  2. Kraz Vladimir, Portable electro-magnetic field detection and measurement apparatus for near-field test and measurements.
    상세보기

이 특허를 인용한 특허 (100) 인용/피인용 타임라인 분석

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
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  2. Strid,Eric; Gleason,K. Reed, Active wafer probe.
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  3. Agar, Joram; Viale-Rigo Capuzzo, Hector Alfredo; Farchy, David, Antenna detection probe for a storage tank.
    상세보기
  4. Agar, Joram; Viale-Rigo Capuzzo, Hector Alfredo; Farchy, David, Antenna detection probe for a storage tank.
    상세보기
  5. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
    상세보기
  6. Dunklee, John, Chuck for holding a device under test.
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  7. Dunklee, John, Chuck for holding a device under test.
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  8. Dunklee, John, Chuck for holding a device under test.
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  9. Dunklee,John, Chuck for holding a device under test.
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  10. Dunklee,John, Chuck for holding a device under test.
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  11. Dunklee,John, Chuck for holding a device under test.
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  12. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
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  13. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
    상세보기
  14. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
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  15. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
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  16. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
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  17. Radle,Patrick J.; Peterson,Christopher L.; Gilbert,Anthony W.; Maraia,Micah L.; Brockman,Daryl C.; Braganza,Austin R.; Wiesemann,David L.; Onachilla,Michael David, Detector module.
    상세보기
  18. Fox, Michael; Nussmeier, Mark; Kurth, Eric A.; Högasten, Nicholas; Hoelter, Theodore R.; Strandemar, Katrin; Boulanger, Pierre; Sharp, Barbara; Frank, Jeffrey D.; Teich, Andrew C.; Dumpert, Dwight; Blakeley, Gerald W., Device attachment with infrared imaging sensor.
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  19. Frank, Jeffrey D.; Högasten, Nicholas; Hoelter, Theodore R.; Strandemar, Katrin; Boulanger, Pierre; Sharp, Barbara; Teich, Andrew C.; Dumpert, Dwight; Nussmeier, Mark; Kurth, Eric A., Device attachment with infrared imaging sensor.
    상세보기
  20. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
    상세보기
  21. Strid, Eric; Campbell, Richard, Differential signal probing system.
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  22. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
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  23. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
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  24. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
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  25. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
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  26. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
    상세보기
  27. Chun,James K., Illuminated voltage sensor.
    상세보기
  28. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
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  29. McFadden,Bruce, Localizing a temperature of a device for testing.
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  30. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
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  31. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
    상세보기
  32. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
    상세보기
  33. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
    상세보기
  34. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
    상세보기
  35. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth; Lesher,Timothy; Koxxy,Martin, Membrane probing system.
    상세보기
  36. Smith,Kenneth; Gleason,Reed, Membrane probing system.
    상세보기
  37. Smith,Kenneth; Gleason,Reed, Membrane probing system.
    상세보기
  38. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
    상세보기
  39. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
    상세보기
  40. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
    상세보기
  41. Gleason,Reed; Bayne,Michael A.; Smith,Kenneth, Method for constructing a membrane probe using a depression.
    상세보기
  42. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
    상세보기
  43. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
    상세보기
  44. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
    상세보기
  45. Wong,Kingston T., Non-contact voltage tester.
    상세보기
  46. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
    상세보기
  47. Harris,Daniel L.; McCann,Peter R., Optical testing device.
    상세보기
  48. Ketzer, Stefan, Oscilloscope probe.
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  49. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
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  50. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
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  51. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
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  52. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
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  53. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
    상세보기
  54. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
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  55. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
    상세보기
  56. Schwindt,Randy, Probe holder for testing of a test device.
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  57. Schwindt,Randy, Probe holder for testing of a test device.
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  58. Nordgren, Greg; Dunklee, John, Probe station.
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  59. Nordgren, Greg; Dunklee, John, Probe station.
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  60. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
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  61. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
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  62. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
    상세보기
  63. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
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  64. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  65. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
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  66. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
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  67. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
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  68. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
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  69. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
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  70. Lesher, Timothy E., Probe testing structure.
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  71. Lesher,Timothy E., Probe testing structure.
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  72. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
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  73. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
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  74. Unmuessig, Klaus; Berard, Armin; Rodehorst, Lutz, Shielded antenna for system test of a non-contact voltage detector.
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  75. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
    상세보기
  76. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
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  77. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
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  78. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
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  79. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  80. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  81. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
    상세보기
  82. Jones, Mike N.; Nguyen, Evans H.; Bublitz, Scott D.; Crowe, Jason R., Slidably attachable non-contact voltage detector.
    상세보기
  83. Dunklee,John, Switched suspended conductor and connection.
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  84. Dunklee,John, Switched suspended conductor and connection.
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  85. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
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  86. Andrews, Peter; Hess, David, System for testing semiconductors.
    상세보기
  87. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
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  88. Campbell, Richard, Test structure and probe for differential signals.
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  89. Campbell,Richard, Test structure and probe for differential signals.
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  90. Rumbaugh,Scott, Thermal optical chuck.
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  91. Rumbaugh,Scott, Thermal optical chuck.
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  92. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
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  93. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
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  94. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
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  95. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
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  96. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
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  97. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
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  98. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
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  99. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
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  100. Campbell, Richard, Wideband active-passive differential signal probe.
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