초록 ▼

In order to provide an atmospheric pressure ionization mass spectrometer system which allows for equal high sensitivity analysis for LCs with different flow rates, there is provided an atmospheric pressure ionization mass spectrometer system comprising: an atmospheric pressure ion source for ionizin

In order to provide an atmospheric pressure ionization mass spectrometer system which allows for equal high sensitivity analysis for LCs with different flow rates, there is provided an atmospheric pressure ionization mass spectrometer system comprising: an atmospheric pressure ion source for ionizing a sample solution under atmospheric pressure, a mass spectrometer for mass analyzing the ions in an evacuated space, a fine hollow tube on a partition wall between the atmospheric pressure ion source and the mass spectrometer, the ions generated in the atmospheric pressure ion source being introduced through the fine tube into the mass spectrometer to be mass analyzed, wherein the fine tube consists of a first fine tube and a second fine tube which are different in diameter, the second fine tube being inserted in the first fine tube, the ions and gas generated in the atmospheric pressure ion source are introduced into the mass spectrometer through the second fine tube, and a gas is fed into a space between the first fine tube and the second fine tube. The present invention allows for high sensitivity measurements of mass spectrometer systems including the micro LC, CE, and nanospray with very low flow rate and the conventional LC with much higher flow rate. In addition, the clogged fine tube can be exchanged without stopping the vacuum pumping, providing the simplified maintenance.

대표청구항 ▼

What is claimed is: 1. An atmospheric pressure ionization mass spectrometer system comprising: an atmospheric pressure ion source having a spray probe for generating ions of a sample solution by spraying said sample solution from said spray probe into a space under the atmospheric pressure so as to

What is claimed is: 1. An atmospheric pressure ionization mass spectrometer system comprising: an atmospheric pressure ion source having a spray probe for generating ions of a sample solution by spraying said sample solution from said spray probe into a space under the atmospheric pressure so as to ionize said sample solution sprayed in said space under said atmospheric pressure; a mass spectrometer for mass analyzing the ions in an evacuated space; a fine hollow tube provided through a partition wall between said atmospheric pressure ion source and said mass spectrometer and gaseous ions generated in said atmospheric pressure ion source being introduced through said fine tube into said mass spectrometer to be mass analyzed, wherein said fine tube comprises a first fine tube and a second fine tube which are different in diameter, said second fine tube being inserted in said first fine tube, a first space formed between said first fine tube and said second fine tube and a second space formed in said second fine tube respectively have respective inlet ends and respective outlet ends, and said respective inlet ends are arranged in said space under the atmospheric pressure of said atmospheric pressure ion source and said respective outlet ends are arranged in evacuated space of said mass spectrometer, said gaseous ions generated in said atmospheric pressure ion source and gas are fed into said inlet end of said second space, and sheath gas is fed into said inlet end of said first space, and said gaseous ions and said gas guided into said second space are coaxially emitted from said outlet end of said first space into a flow of said sheath gas flown with a sound velocity formed in a vacuum chamber evacuated. 2. An atmospheric pressure ionization mass spectrometer system according to claim 1, further comprising: a gas feeding tube for feeding said sheath gas between said first fine tube and second fine tube, a gas source connected to said gas feeding tube, and adjusting means on said gas feeding tube, for adjusting said sheath gas flow rate. 3. An atmospheric pressure ionization mass spectrometer system according to claim 2, further comprising heating means on said gas feeding tube, for heating the gas. 4. An atmospheric pressure ionization mass spectrometer system according to claim 1, wherein said first fine tube has an end on the mass spectrometer side, said second fine tube has an end on the mass spectrometer side, and said second fine tube end projects past said first fine tube end toward the mass spectrometer. 5. An atmospheric pressure ionization mass spectrometer system according to claim 1, wherein said first fine tube has an end on the atmospheric pressure ion source side, said second fine tube has an end on the atmospheric pressure ion source side, and said second fine tube end projects past said first fine tube end toward the atmospheric pressure ion source. 6. An atmospheric pressure ionization mass spectrometer system according to claim 5, wherein said first fine tube is not in communication with the atmospheric pressure ion source side. 7. An atmospheric pressure ionization mass spectrometer system according to claim 1, wherein said second fine tube is a fused silica capillary. 8. An atmospheric pressure ionization mass spectrometer system according to claim 1, wherein said second fine tube can be removed and exchanged, with holding said first fine tube on said partition wall. 9. An atmospheric pressure ionization mass spectrometer system according to claim 1, further comprising heating means, which surround said first fine tube and second fine tube, for heating them. 10. An atmospheric pressure ionization mass spectrometer system according to claim 2, wherein the mass analysis is carried out with said second fine tube removed, for a sample solution flow rate of 0. 3 mL/min or more. 11. An atmospheric pressure ionization mass spectrometer system according to claim 2, wherein the mass analysis is carried out with said second fine tube having an inside diameter of 0.2 mm or less, for a sample solution flow rate of 0.3 mL/min or less. 12. An atmospheric pressure ionization mass spectrometer system according to claim 2, wherein the mass analysis is carried out with said second fine tube having an inside diameter of 0.1 mm or less, for a sample solution flow rate of 0.01 mL/min or less. 13. An atmospheric pressure ionization mass spectrometer system according to claim 2, wherein the mass analysis is carried out with said second fine tube having an inside diameter of 0.02 mm or less, for a sample solution flow rate of 0.001 mL/min or less. 14. An atmospheric pressure ionization mass spectrometer system according to claim 1, wherein said atmospheric pressure ion source is an ESI ion source. 15. An atmospheric pressure ionization mass spectrometer system according to claim 1, wherein said atmospheric pressure ion source is an APCI ion source.