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Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0911624 (2004-08-05) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 9 인용 특허 : 561 |
High quality epitaxial layers of compound semiconductor materials can be grown overlying large silicon wafers by first growing an accommodating buffer layer on a silicon wafer. The accommodating buffer layer is a layer of monocrystalline oxide spaced apart from the silicon wafer by an amorphous inte
High quality epitaxial layers of compound semiconductor materials can be grown overlying large silicon wafers by first growing an accommodating buffer layer on a silicon wafer. The accommodating buffer layer is a layer of monocrystalline oxide spaced apart from the silicon wafer by an amorphous interface layer of silicon oxide. The amorphous interface layer dissipates strain and permits the growth of a high quality monocrystalline oxide accommodating buffer layer. Any lattice mismatch between the accommodating buffer layer and the underlying silicon substrate is taken care of by the amorphous interface layer.
The invention claimed is: 1. A monolithic integrated circuit comprising: an MOS circuit formed at least partially in a monocrystalline substrate; a monocrystalline compound semiconductor layer overlying the monocrystalline substrate; and a tunnel diode formed at least partially in the monocrystalli
The invention claimed is: 1. A monolithic integrated circuit comprising: an MOS circuit formed at least partially in a monocrystalline substrate; a monocrystalline compound semiconductor layer overlying the monocrystalline substrate; and a tunnel diode formed at least partially in the monocrystalline compound semiconductor layer, the tunnel diode electrically coupled to the MOS circuit. 2. The monolithic integrated circuit of claim 1 wherein the MOS circuit comprises an MOS transistor having a drain region and the tunnel diode is electrically coupled to the drain region. 3. The monolithic integrated circuit of claim 2 further comprising a second tunnel diode coupled to the drain region in series with the tunnel diode. 4. The monolithic integrated circuit of claim 1 wherein the MOS circuit comprises an MOS transistor having a drain region and the tunnel diode is formed overlying and electrically coupled to the drain region. 5. The monolithic integrated circuit of claim 1 wherein the MOS circuit comprises an MOS transistor having a gate electrode and the tunnel diode is formed overlying and electrically coupled to the gate electrode. 6. The monolithic integrated circuit of claim 1 wherein the MOS circuit comprises a digital circuit. 7. The monolithic integrated circuit of claim 1 wherein the tunnel diode comprises an interband tunnel diode. 8. The monolithic integrated circuit of claim 1 wherein the tunnel diode comprises an intraband tunnel diode.
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