[미국특허]
Exchange coupling film and magnetoresistive element using the same
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G11B-005/66
G11B-005/39
출원번호
US-0207702
(2005-08-17)
우선권정보
JP-2000-209468(2000-07-11)
발명자
/ 주소
Hasegawa,Naoya
Saito,Masamichi
출원인 / 주소
Alps Electric Co., Ltd.
대리인 / 주소
Brinks Hofer Gilson &
인용정보
피인용 횟수 :
0인용 특허 :
13
초록▼
An exchange coupling film including an antiferromagnetic layer and a ferromagnetic layer in contact with the antiferromagnetic layer so as to generate an exchange coupling magnetic field is provided. A PtMn alloy is used as the material of the antiferromagnetic layer. Crystal planes of the antifer
An exchange coupling film including an antiferromagnetic layer and a ferromagnetic layer in contact with the antiferromagnetic layer so as to generate an exchange coupling magnetic field is provided. A PtMn alloy is used as the material of the antiferromagnetic layer. Crystal planes of the antiferromagnetic layer and the ferromagnetic layer preferentially aligned parallel to the interface are crystallographically identical and crystallographically identical axes lying in these crystal planes are oriented, at least partly, in different directions between the antiferromagnetic layer and the ferromagnetic layer. Thus, a proper order transformation occurs in the antiferromagnetic layer as a result of heat treatment and an increased exchange coupling magnetic field can be obtained.
대표청구항▼
In the claims: 1. An exchange coupling film comprising an antiferromagnetic layer and a ferromagnetic layer in contact with the antiferromagnetic layer, an exchange coupling magnetic field generated at the interface between the antiferromagnetic layer and the ferromagnetic layer magnetized by the a
In the claims: 1. An exchange coupling film comprising an antiferromagnetic layer and a ferromagnetic layer in contact with the antiferromagnetic layer, an exchange coupling magnetic field generated at the interface between the antiferromagnetic layer and the ferromagnetic layer magnetized by the antiferromagnetic layer in a particular direction, wherein the antiferromagnetic layer comprises an antiferromagnetic material containing Mn and X, wherein X is at least one element selected from the group consisting Pt, Pd, Ir, Rh, Ru, and Os, and wherein crystal planes of the antiferromagnetic layer and the ferromagnetic layer preferentially aligned parallel to the interface are crystallographically identical, and crystallographically identical axes lying in said crystal planes are oriented, at least partly, in different directions between the antiferromagnetic layer and the ferromagnetic layer. 2. An exchange coupling film according to claim 1, wherein the crystal planes are the crystallographically identical planes generically described as the {111} planes. 3. An exchange coupling film according to claim 2, wherein the crystallographically identical axes are the axes generically described as the <110> axes. 4. An exchange coupling film according to claim 1, wherein the antiferromagnetic layer and the ferromagnetic layer are deposited in that order from the bottom, the exchange coupling film further comprising a seed layer provided below the antiferromagnetic layer, the seed layer mainly having a face-centered cubic structure and having one of the crystallographically identical planes generically described as the {111} planes preferentially aligned parallel to the interface. 5. An exchange coupling film according to claim 4, wherein the seed layer comprises one of a NiFe alloy and a Ni--Fe--Y alloy, wherein Y is at least one element selected from the group consisting of Cr, Rh, Ta, Hf, Nb, Zr, and Ti. 6. An exchange coupling film according to claim 4, wherein the seed layer is nonmagnetic at room temperature. 7. An exchange coupling film according to claim 4, further comprising an underlayer provided under the seed layer, the underlayer comprising at least one element selected from the group consisting of Ta, Hf, Nb, Zr, Ti, Mo, and W. 8. An exchange coupling film according to claim 4, wherein at least part of the interface between the antiferromagnetic layer and the seed layer is in a lattice-mismatching state. 9. An exchange coupling film according to claim 1, the antiferromagnetic material further comprising X', wherein X' is at least one element selected from the group consisting of Ne, Ar, Kr, Xe, Be, B, C, N, Mg, Al, Si, P, Ti, V, Cr, Fe, Co, Ni, Cu, Zn, Ga, Ge, Zr, Nb, Mo, Ag, Cd, Sn, Hf, Ta, W, Re, Au, Pb, and rare earth elements. 10. An exchange coupling film according to claim 9, wherein the antiferromagnetic material is an interstitial solid solution in which said X' is inserted to interstices in the lattice formed by X and Mn or a substitutional solid solution in which said X' partly displaces the lattice points in the crystal lattice formed by X and Mn. 11. An exchange coupling film according to claim 10, wherein the X or X+X' content in the antiferromagnetic material is in the range of 45 to 60 atomic percent. 12. An exchange coupling film according to claim 1, wherein at least part of the interface between the antiferromagnetic layer and the ferromagnetic layer is in a lattice-mismatching state. 13. A magnetoresistive element comprising: an exchange coupling film according to claim 1; a free magnetic layer formed on the pinned magnetic layer separated by a nonmagnetic interlayer; and bias layers for magnetizing the free magnetic layer in a direction substantially orthogonal to the magnetization vector of the pinned magnetic layer. 14. A magnetoresistive element comprising: an antiferromagnetic layer; a pinned magnetic layer in contact with the antiferromagnetic layer, the magnetization vectors of the pinned magnetic layer being pinned by an exchange anisotropic magnetic field generated in relation to the antiferromagnetic layer; a free magnetic layer formed on the pinned magnetic layer separated by a nonmagnetic interlayer; and antiferromagnetic exchange bias layers formed above or below the free magnetic layer, the exchange bias layers being separated from one another in a track width direction by a gap therebetween, wherein the exchange bias layers and the free magnetic layer comprise an exchange coupling film according to claim 1, the exchange bias layers corresponding to the antiferromagnetic layer and the free magnetic layer corresponding to the ferromagnetic layer, so as to magnetize the free magnetic layer in a particular direction. 15. A magnetoresistive element comprising: nonmagnetic interlayers provided above and below a free magnetic layer; pinned magnetic layers, one thereof being provided on the pinned magnetic layer formed on the free magnetic layer and the other being provided under the pinned magnetic layer formed under the free magnetic layer; antiferromagnetic layers for pinning the magnetization vectors of the pinned magnetic layers, one of the antiferromagnetic layers being provided on one of the pinned magnetic layers and the other being provided under the other of the pinned magnetic layers; and bias layers for orienting the magnetization vector of the free magnetic layer in a direction substantially orthogonal to the magnetization vector of the pinned magnetic layer, wherein each antiferromagnetic layer and the pinned magnetic layer in contact with the antiferromagnetic layer comprise an exchange coupling film according to claim 1, the pinned magnetic layer corresponding to the ferromagnetic layer. 16. A magnetoresistive element comprising: a magnetoresistive layer; a soft magnetic layer provided on the magnetoresistive layer separated by a nonmagnetic layer therebetween; and antiferromagnetic layers provided above or below the magnetoresistive layer, the antiferromagnetic layers being separated from one another in a track width direction with a gap therebetween, wherein the antiferromagnetic layers and the magnetoresistive layer comprise an exchange coupling film according to claim 1, the magnetoresistive layer corresponding to the ferromagnetic layer.
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