초록 ▼

The invention relates to a method for the contactless measurement of an object in at least one dimension. An object is scanned in a spatially restricted effective zone of a scanning beam field and the size of the object in terms of the measured dimension is deduced by the detection of one or more in

The invention relates to a method for the contactless measurement of an object in at least one dimension. An object is scanned in a spatially restricted effective zone of a scanning beam field and the size of the object in terms of the measured dimension is deduced by the detection of one or more interruptions in the scanning beams. The scanning beam field is constructed from a number of directly addressable individual beams. The beam-assisted scanning of the spatially restricted effective zone of the scanning beam field is carried out according to a predefinable pattern of steps, using a non-linear soiling method.

대표청구항 ▼

What is claimed is: 1. Process for contactless measurement of an object in at least one dimension, comprising: scanning the object in a three-dimensionally limited action area of a scanning beam field; and detecting one or more interruptions of scanning beams and deducing a size of the object in th

What is claimed is: 1. Process for contactless measurement of an object in at least one dimension, comprising: scanning the object in a three-dimensionally limited action area of a scanning beam field; and detecting one or more interruptions of scanning beams and deducing a size of the object in the measured dimension, wherein the scanning beam field is built up using a number of directly addressable individual beams, and wherein scanning takes place according to a definable step pattern and a non-linear sorting process. 2. Process as claimed in claim 1, wherein determination of the size of the object takes place in at least one dimension by scanning the scanning beam field in regions according to a binary search principle. 3. Process as claimed in claim 2, wherein the size of the object is determined in more than one dimension and the three-dimensionally limited action area of the scanning beam field is scanned by a combination of principles of linear and binary search. 4. Process as claimed in claim 1, wherein the object is placed in the action area of a beam curtain which is fixed by individual scanning beams or of a two-dimensional or three-dimensional beam grating. 5. Process as claimed in claim 1, wherein the object is moved into a scanning beam field of electromagnetic radiation or of ultrasonic radiation. 6. Process as claimed in claim 1, wherein the object is moved into a scanning beam field of electromagnetic radiation in the visible or invisible spectral range or radar radiation. 7. Process as claimed in claim 1, wherein an image of the object which is to be measured is scanned. 8. Process as claimed in claim 7, wherein the image of the object is fixed by a picture area of an imaging system which can be scanned one-or two-dimensionally, using at least one of a recording camera, an image of a scanning tunnel microscope or an electron-power microscope, or a capacitive or inductive measurement which is implemented graphically. 9. Process as claimed in claim 1, wherein the number of scanning beams for each dimension of the object to be measured is at least eight. 10. Process as claimed in claim 1, wherein the object is moved into the three-dimensionally limited action area of the scanning beam field such that in at least one of its dimensions which are to be determined an object boundary coincides with an edge boundary of the three-dimensionally limited action area of the scanning beam field. 11. Process as claimed in claim 1, wherein during measurement, relative motion takes place between the object which is to be measured and the scanning beam field. 12. Process as claimed in claim 11, wherein the object which is to be measured is transported during the measurement, continuously, through the action area of the scanning beam field. 13. Process as claimed in claim 11, wherein the image of the object is recorded, stored and evaluated for measurement, and in a following step determined measurement data are used for control of handling and treatment processes for the object. 14. Process as claimed in claim 12, wherein the image of the object is recorded, stored and evaluated for measurement, and in a following step determined measurement data are used for control of handling and treatment processes for the object.