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The probe card comprises a primary circuit board with a plurality of signal contacts, a probe assembly including a plurality of probes electrically connected to the signal contact and an adjusting assembly for adjusting the coplanarity between the probe assembly and a device under test. The adjustin

The probe card comprises a primary circuit board with a plurality of signal contacts, a probe assembly including a plurality of probes electrically connected to the signal contact and an adjusting assembly for adjusting the coplanarity between the probe assembly and a device under test. The adjusting assembly comprises a groove plate with a plurality of grooves, a wedge positioned in the groove, at least one adjusting pin connecting the wedge and the probe assembly and at least one screw positioned at one side of the wedge. The wedge comprises an inclined surface, and one end of the adjusting pin contacts the inclined surface of the wedge and the other end contacts the probe assembly. The circuit probe card moves the wedge laterally to further move the adjusting pin upwards and downwards, so that to the coplanarity between the probe assembly and the device under test can be adjusted.

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What is claimed as new and desired to be protected by Letters Patent of the United States is: 1. An integrated circuit probe card, comprising: a primary circuit board with a plurality of signal contacts; a probe assembly including a plurality of probes electrically connected to the signal contacts

What is claimed as new and desired to be protected by Letters Patent of the United States is: 1. An integrated circuit probe card, comprising: a primary circuit board with a plurality of signal contacts; a probe assembly including a plurality of probes electrically connected to the signal contacts; and an adjusting assembly comprising a wedge for adjusting the coplanarity between the probe assembly and an integrated circuit device under test a groove plate having a plurality of grooves, and an adjusting pin with two ends connected to the wedge and the probe assembly. 2. The integrated circuit probe card according to claim 1, wherein the adjusting assembly further comprises at least one screw connected to one side of the wedge for moving the wedge by rotation. 3. The integrated circuit probe card according to claim 2, wherein the screw contacts the side of the wedge through a sphere. 4. The integrated circuit probe card according to claim 2, wherein one end of the screw is semi-circular to contact the side of the wedge. 5. The integrated circuit probe card according to claim 2, wherein the adjusting assembly further comprises a spring positioned on another side of the wedge. 6. The integrated circuit probe card according to claim 1, wherein the adjusting assembly further comprises a guiding plate with a plurality of openings, and the adjusting pin is positioned in the opening. 7. The integrated circuit probe card according to claim 1, wherein one end of the adjusting pin contacts an inclined surface of the wedge through a sphere. 8. The integrated circuit probe card according to claim 1, wherein one end of the adjusting pin is semi-circular. 9. An integrated circuit probe card, comprising: a primary circuit board with a plurality of signal contacts; a probe assembly, comprising: a plurality of probes for acquiring electrical properties of an integrated circuit device under test; and an elastic connector electrically connected to the signal contacts and the probes; a space transformer including an upper surface with a plurality of upper connection sites thereon for connecting the signal contacts of the primary circuit board; a bottom surface with a plurality of bottom connection sites thereon for electrical connecting the probes; an interface circuit board for electrical connecting the signal contacts of the primary circuit board and the upper connection sites of the space transformer; and an adjusting assembly for adjusting the coplanarity between the probe assembly and the integrated circuit device under test, the adjusting assembly comprising: a groove plate with a plurality of grooves; a wedge positioned in the groover; and at least one adjusting pin with two ends connecting the wedge and the probe assembly. 10. The integrated circuit probe card according to claim 9, further comprising: a spacer positioned on a bottom surface of the primary circuit board; and a bottom cover positioned on the spacer for supporting the probe assembly. 11. The integrated circuit probe card according to claim 9, further comprising: a spacer positioned on the bottom surface of the primary circuit board; a bottom cover for supporting the probe assembly; and at least one spring sheet positioned on the spacer for supporting the bottom cover. 12. The integrated circuit probe card according to claim 9, wherein the adjusting assembly further comprises a guiding plate with a plurality of openings, and the adjusting pin is positioned in the opening. 13. The integrated circuit probe card according to claim 9, wherein one end of the adjusting pin contacts an inclined surface of the wedge through a sphere. 14. The integrated circuit probe card according to claim 9, further comprising a stress dispersion plate positioned on the relay circuit board, wherein the adjusting pin contacts the stress dispersion plate through a sphere. 15. The integrated circuit probe card according to claim 9, wherein one end of the adjusting pin is semi-circular. 16. The integrated circuit probe card according to claim 9, wherein the adjusting assembly further comprises at least one screw connected to one side of the wedge for moving the wedge by rotation. 17. The integrated circuit probe card according to claim 16, wherein the screw contacts the side of the wedge through a sphere. 18. The integrated circuit probe card according to claim 16, wherein one end of the screw is semi-circular to contact the side of the wedge. 19. The integrated circuit probe card according to claim 16, wherein the adjusting assembly further comprises a spring positioned at another side of the wedge. 20. The integrated circuit probe card according to claim 9, wherein the elastic connector comprises: fixing plate with a plurality of openings; and an elastic pin positioned in the opening for electrical connecting the signal contact of the primary circuit board and the probe of the probe assembly. 21. The integrated circuit probe card according to claim 20, wherein the elastic pin comprises: a housing; a spring with two ends positioned in the housing; and two connecting pins connected to the two ends of the spring. 22. The integrated circuit probe card according to claim 9, wherein the elastic connector comprises: an elastic plate; and a plurality of conductive wires positioned in the elastic plate in an inclined manner for electrical connecting the signal contacts of the primary circuit board and the probes of the probe assembly. 23. The integrated circuit probe card according to claim 22, wherein the elastic plates is made of silicon rubber. 24. An integrated circuit probe card, comprising: a primary circuit board with a plurality of signal contacts: a probe assembly, comprising: a plurality of probes for acquiring electrical properties of an integrated circuit device under test; and an elastic connector electrically connected to the signal contacts and the probes; and an adjusting assembly for adjusting the coplanarity between the probe assembly and the integrated circuit device under test, the adjusting assembly comprising: a groove plate with a plurality of grooves; a wedge positioned in the groove; and at least one adjusting pin with two ends connecting the wedge and the probe assembly.