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Process of forming socket contacts 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H05K-003/02
  • H05K-003/10
출원번호 US-0652585 (2000-08-31)
발명자 / 주소
  • Akram,Salman
  • Farnworth,Warren M.
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    TraskBritt
인용정보 피인용 횟수 : 0  인용 특허 : 38

초록

A socket contact formation process comprises forming a contact head from a conductive material, forming a contact body from a semiconductive material configured to be electrically conductive; and joining the contact head and the contact body.

대표청구항

What is claimed is: 1. A socket contact formation process for forming a plurality of socket contacts in a substrate, the plurality of socket contacts having a spacing therebetween for mating with contacts of an IC chip for use in the testing thereof, comprising: forming a contact head from a conduc

이 특허에 인용된 특허 (38)

  1. Larry D. Kinsman, Back-to-back semiconductor device module, assemblies including the same and methods.
  2. Grabbe Dimitry (2160 Rosedale Ave. Middletown PA 17057), Ball grid array socket.
  3. Seidler Jack (Flushing NY), Compliant connector.
  4. Chang Pierce,TWX, Connector with high-densely arranged terminals for connecting to working element and printed circuit board through LGA type connection.
  5. Masami Fukunaga (Kawaguchi JPX), Contact pin device for IC sockets.
  6. David R. Hembree, Electrical connector.
  7. Jiang, Tongbi, Electrical interconnections, methods of conducting electricity, and methods of reducing horizontal conductivity within an anisotropic conductive adhesive.
  8. Honn ; James J. ; Stuby ; Kenneth P., Electrical package for LSI devices and assembly process therefor.
  9. Foley William F. (New Cumberland PA) Griffith Gregory G. (Carlisle PA) Gutter David H. (Elizabethtown PA) McClusky William E. (Harrisburg PA) Robbins Steve (Greensburg PA) Shoemaker Bruce W. (Dillsbu, Electrical terminal with compliant pin section.
  10. Distefano Thomas H. ; Fjelstad Joseph, Flexible contact post and post socket and associated methods therefor.
  11. Wang Wen-chou Vincent ; Takahashi Yasuhito ; Chou William T. ; Peters Michael G. ; Lee Michael G. ; Beilin Solomon, High density signal interposer with power and ground wrap.
  12. Sato Kazumasa (Yokohama JPX) Kokubu Akihiko (Yokohama JPX), IC socket.
  13. Farnworth Warren M. ; Gochnour Derek ; Akram Salman, Interconnect having recessed contact members with penetrating blades for testing semiconductor dice and packages with co.
  14. Werther William E. (Glen Cove NY), Interconnection package suitable for electronic devices and methods for producing same.
  15. Fredrickson Toby Alan, Interface structure for an integrated circuit device tester.
  16. Johnson Timothy L. ; Knapp James H. ; Laninga Albert J., Material transfer apparatus and method of using the same.
  17. Durand David (Providence RI) Wong Chon M. (Lincoln RI) Iannetta ; Jr. Roger A. (Warwick RI), Method for connecting a die to electrically conductive traces on a flexible lead-frame.
  18. Akram Salman ; Farnworth Warren M. ; Wood Alan G., Method for fabricating a semiconductor interconnect with laser machined electrical paths through substrate.
  19. Frank Steven N. ; Belcher James F. ; Stanford Charles E. ; Owen Robert A. ; Kyle Robert J. S., Method for forming electrical contact to the optical coating of an infrared detector.
  20. Tseng Horng-Huei,TWX, Method for making planar metal interconnections and metal plugs on semiconductor substrates.
  21. Cheng Hing-Liang (Taipei TWX), Method for manufacturing a circuit board with a plurality of conductive terminal pins.
  22. Atkins Glen G. ; Cohen Michael S. ; Mauritz Karl H. ; Shaffer James M., Method of forming electrically conductive pillars.
  23. Guran Orest D. ; Wood Donald E. ; Middlehurst Richard J., Method of manufacturing an array of surface mount contacts.
  24. Roberts Joseph A., Method of manufacturing printed circuits.
  25. Otto James C. (Indian Harbour Beach FL) Jones Herman A. (Melbourne FL), Multilayer circuit prototyping board.
  26. Brown Candice H. (San Jose CA), Process of making a semiconductor device having parallel leads directly connected perpendicular to integrated circuit la.
  27. Butler Douglas (Colorado Springs CO), Sealed self aligned contacts using two nitrides process.
  28. McKenzie ; Jr. Joseph A. (6330 Laura La. Pleasanton CA 94566), Self-masking socket pin carrier for printed circuit boards.
  29. Matsuda Tatsuharu,JPX ; Mizukoshi Masataka,JPX ; Minamizawa Masaharu,JPX ; Motooka Toshiyuki,JPX, Semiconductor device with reliable electrodes of projecting shape and method of forming same.
  30. Hirano Hirokazu (Oomiya JPX) Yamaki Bunshiro (Fujisawa JPX), Semiconductor sensor including an aperture having a funnel shaped section intersecting a second section.
  31. Noble Wendell P., Silicon-on-insulator islands.
  32. Mosquera Rene A. (Laguna Niquel CA), Socket contact for mounting in a hole of a device.
  33. Suzuki Kenzo,JPX ; Hiroike Toshimasa,JPX ; Nagano Hiroshi,JPX ; Izawa Hisataka,JPX ; Maru Yasuo,JPX ; Ikeda Shigeo,JPX, Socket for IC and method for manufacturing IC.
  34. Matsumura Shigeru,JPX, Socket for measuring a ball grid array semiconductor.
  35. Jones Robert E. (Saint Peters MO), Surface mounted component adaptor for interconnecting of surface mounted circuit components.
  36. Martucci Roberto (Montegrotto T. Padova ITX) Zuin Gianni (Mestrino-Padova ITX), Terminal socket assembly.
  37. Swart Mark A. ; Johnston Charles J. ; Vinther Gordon A. ; Sargeant Steve B., Test socket.
  38. Sinclair William Y., Universal production ball grid array socket.
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