이 특허에 인용된 특허 (51) 인용/피인용 타임라인 분석

1. Trpkovski Paul, Apparatus and method for filling insulated glass units with insulating gas.

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2. Yamaguchi Wataru,JPX ; Ota Mitsunobu,JPX, Apparatus and method for measuring color of a measurement object.

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3. Imura Kenji,JPX, Apparatus and method for measuring spectral characteristics of fluorescent sample.

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4. Welch Jeanne A. (Laurel MD), Apparatus and method for monitoring pressure leaks from a sealed system.

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5. Lisec Peter (Behnhofstrasse 34 Amstetten-Hausmening (Niederosterreich) ATX), Apparatus for producing insulating glass filled with a gas other than air.

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6. Vianello Fortunato,ITX, Automatic method and device for filling insulating glazing units.

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7. Imura, Kenji, Color measuring apparatus.

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8. Arima Jiro (Osaka JPX) Takata Naoyo (Osaka JPX), Color measuring apparatus with flash lamp color temperature measurement.

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9. Ota Mitsunobu (Shinshiro JPX) Yamaguchi Wataru (Toyokawa JPX) Nakajima Isamu (Toyokawa JPX), Color measuring apparatus with position adjustment.

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10. Yuasa Yoshio (Kawachinagano JPX), Colorimeter.

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11. Kawagoe Nobukazu (Osaka JPX) Sugiyama Masami (Osaka JPX) Inaba Masahito (Osaka JPX), Compact diffusion light mixing box and colorimeter.

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12. Rufer, Alfred-Christophe; Zimmermann, Claudio; Muller, Frederic; Bulliard, Albert, Electrical power supply suitable in particular for DC plasma processing.

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13. Onoda Atsuo,JPX ; Isozaki Shin,JPX ; Ohke Tadanobu,JPX, Formatting apparatus and a flexible disk.

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14. Oogoshi, Yasuo; Takahashi, Youji; Kanekiyo, Tadamitsu; Umemoto, Tsuyoshi, High-frequency power supply apparatus for plasma generation apparatus.

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15. Narayan Nilabh (Minneapolis MN) Larsen James E. (Andover MN), Insulating glass unit with insulative spacer.

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16. Koichi Terauchi JP; Eiji Kitagawa JP, Light measuring apparatus and colorimeter.

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17. Inaba Masahito (Ikeda JPX) Sugiyama Masami (Toyonaka JPX), Light sensor with an adjustable spectral characteristic.

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18. Mark Gunter (Ottersweier DEX), Low frequency, pulsed, bipolar power supply for a plasma chamber.

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19. Lee Timothy C. P. (Kenilworth GB2) Lowe George B. (Anstey GB2), Manufacture of insulated glass units.

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20. Batchelor Robert L. (Orange TX) Feldman Charles F. (Fresno CA), Manufactured glass laminates.

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21. Weckstrom Kurt (Espoo FIX), Measuring sensor and measuring arrangement for use in the analysis of gas mixtures.

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22. Räsänen, Markku; Khriachtchev, Leonid; Petterson, Mika, Method and apparatus for analysis of gas compositions.

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23. McGlinchy, Timothy Bryan, Method and apparatus for processing sealant of an insulating glass unit.

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24. Eisemann Hans,DEX ; Twesten Karen,DEX, Method and device for determining the purity and/or pressure of gases for electric lamps.

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25. Trpkovski Paul, Method for filling insulated glass units with insulating gas.

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26. Rueckheim Eric W. (Muscoda WI) O\Shaughnessy Roger (Chaska MN), Method for producing gas-containing insulating glass assemblies.

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27. McHugh Michael P., Method of manufacturing insulating glass units.

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28. Trpkovski Paul, Method of reliably detecting seal failures.

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29. Ishikawa, Norio; Hosoi, Norihisa; Shirai, Susumu; Nishio, Michio; Tsuji, Ryuji; Kimata, Tomoya, Multi-point light measuring system.

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30. Nishino Hiroshi (Osaka JPX) Ogino Fumiichi (Kawanishi JPX) Masuko Tetsuo (Shibata JPX) Goto Kunio (Nakajo JPX) Takahashi Masao (Shiunjimachi JPX), Multilayer glass structure.

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31. Franz Helmut (Pittsburgh PA), Multiple glazed windows including selective reflecting metal/metal oxide coatings.

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32. Larsen James E. (Andover MN), Multiple pane insulating glass unit with insulating spacer.

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33. Larsen James E., Multiple pane insulating glass unit with insulative spacer.

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34. Larsen James E., Multiple pane insulating glass unit with insulative spacer.

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35. Larsen James E. (Andover MN), Multiple pane insulating glass unit with insulative spacer.

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36. Latta Bryan M. (P.O. Box 328 Wolfville ; Nova Scotia CAX B0P 1X0), Non-intrusive gas-level measurement apparatus.

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37. Welch Jeanne A. (Laurel MD), Non-invasive pressure measuring device and method.

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38. Imura Kenji,JPX, Optical characteristic measuring apparatus.

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39. Terauchi Koichi,JPX, Optical characteristic measuring apparatus with correction for distance variation.

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40. Naruse Kazuhiko (Sakai JPX) Yuasa Yoshio (Kawachi-Nagano JPX) Ishikawa Norio (Osaka JPX), Photographic light measuring device.

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41. Ishikawa Norio,JPX, Photometric device and a light receiving section for use in a photometric device.

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42. Ogawa, Unryu; Sato, Takayuki, Plasma processing apparatus.

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43. Nakano, Akira; Ohmi, Tadahiro, Plasma processing apparatus capable of performing uniform plasma treatment by preventing drift in plasma discharge current.

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44. Nakano, Akira; Ohmi, Tadahiro, Plasma processing apparatus suitable for power supply of higher frequency.

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45. Steenhoek Larry E. (Wilmington DE), Portable colorimeter and method for characterization of a colored surface.

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46. Lenhardt Karl,DEX ; Bogner Uwe,DEX, Process and apparatus for assembling insulating glass panes which are filled with a gas other than air.

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47. Lisec Peter (Bahnhofstrasse 34 A-3363 Amstetten-Hausmening ATX), Process and apparatus for filling an insulating glass unit with filler gas.

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48. Stimson Bradley O. ; Rummel Paul W., RF plasma power supply combining technique for increased stability.

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49. Terauchi Koichi (Toyohashi JPX) Ono Tomomi (Akashi JPX), Sample optical properties measuring device with predictive estimation of measurement range by using preliminary and main.

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50. Sugiyama Masami (Toyonaka JPX) Sakai Takao (Habikino JPX), Two-dimensional colorimeter.

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51. Marshall John M. (202 S. Michigan St. South Bend IN 46601), Window gas monitor.

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이 특허를 인용한 특허 (4) 인용/피인용 타임라인 분석

1. Abbott,Mark Matthew; Wornson,Douglas Phillip; Hegstrom,Eric Loren, Apparatus and methods for real-time adaptive inspection for glass production.

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2. Donohue, Morgan, Apparatus for edge sealing and simultaneous gas filling of insulated glass units.

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3. McHugh, Michael Patrick, Continuous gas filling process and apparatus for fabrication of insulating glass units.

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4. Coignet, Philippe A.; Tromeur, Pascal J.; Wang, Justin J., Method and system for optimized filling of an enclosure.

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