이 특허에 인용된 특허 (50) 인용/피인용 타임라인 분석

1. Lee Nathan J. ; Pitt William G., Accelerated impact testing apparatus.

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2. Fedor Gregory R. (Bay Village OH) Grossman Douglas M. (Fairview Park OH), Accelerated weathering apparatus.

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3. Hobbs Gregg K. (Westminister CO), Apparatus and method for thermal and vibrational stress screening.

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4. Han Seong Chan,KRX ; Lee Dong Chun,KRX ; Yu Kwang Su,KRX ; Kwon O Kyung,KRX, Apparatus for carrying plural printed circuit boards for semiconductor module.

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5. Smith Nathan R. (Stillwater MN) Schmitt Steven E. (Stillwater MN), Apparatus for handling devices under varying temperatures.

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6. Wu Wen-Shien,TWX, Apparatus for thermally testing an electronic device.

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7. Goff Gerald L. (Austin TX) Smith Michael D. (Austin TX) Conboy Michael R. (Buda TX), Boat test apparatus.

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8. Fuoco Francis J. (Commack NY) Linardos Anthony (Copaigue NY), Burn-in testing equipment having an instrumentation control module.

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9. Jones Elmer R. (North Reading MA), Burn-in tower.

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10. Murray Richard A. ; Murray Victor E., Communications cable interconnection apparatus and associated method for an open office architecture.

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11. Hugh Mark A. ; Lohr David V. ; Borton Peter J., Controlled atmosphere incubator.

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12. Borcuch John P. (Williamsville NY) DeMarco Francis W. (Niagara Falls NY) White Norman H. (East Amherst NY), Cryogenic pump system.

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13. Rieser Hansjorg (Elgg CHX) Schmoker Peter (Hallau CHX) Staubli Herbert (Kunten CHX), Device for testing electrical modules.

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14. Kadakia Virendra Kirtanlal (Huntington Beach CA) Holt ; Jr. Charles Philip (Rancho Palos Verdes CA) Moore ; Jr. Ralph Crittenden (Cypress CA), Digital circuit module test system.

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15. Shofner Frederick M. (Knoxville TN) Townes Mark G. (Knoxville TN), Direct control of fiber testing performance parameters by application of controlled conditioned gas flows.

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16. Kneifel Jerome J. (Columbus NE), Electrical resistor testing fixture.

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17. Genco Robert M. (Atlanta GA), Environmental control system.

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18. Keel Jerry L. (Harvest AL) Hines Thomas M. (Harvest AL) Davis Glen (Madison AL) Parks William E. (Madison AL), Environmental stress screening apparatus.

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19. Duesler ; Jr. Ira D. (14 Walnut St. Mohawk NY 13407) Harney ; Jr. Thomas P. (62 John St. Ilion NY 13357), Environmental stress screening device transfer apparatus.

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20. Botruff Dwayne D. ; Langfeldt Gregory J., Environmental test chamber.

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21. Wanek, Donald J.; Swanson, Loren L.; Sands, Richard L.; Troutman, Mark E.; Melville, James A., Environmental test chamber.

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22. Wanek, Donald L.; Swanson, Loren L.; Sands, Richard L.; Troutman, Mark; Melville, James A., Environmental test chamber and a carrier for use therein.

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23. Lee Je-Ryong,KRX, Fabrication process acceptance tester and fabrication process using a maintenance region of a disk.

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24. Chalmers Richard H. (San Diego CA), Fixtureless environmental stress screening apparatus.

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25. Becker William M. ; Kim Sung H., Gear-driven docking apparatus for removable mass-storage drives.

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26. Wanek, Donald J.; Sands, Richard L., Hard drive test fixture.

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27. Tikhtman Jacob (Northbrook IL) Patel Bhakti S. (Bensenville IL), High accuracy weathering test machine.

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28. Koopman Peter J. (Richmond IN), Humidity generating system.

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29. Albrow Robert ; Klugkist Bert, Integrated circuit test head.

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30. Graham Joseph (St. Paul MN) Gennrich Timothy J. (St. Paul MN) Laird James A. (St. Paul MN), Intumescent silicates having improved stability.

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31. Shea Lawrence E. (165 Lake Dr. San Bruno CA 94066), Method for making a double wall fire proof duct.

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32. Hurite John M. (West Bloomfield MI) Kralik Thomas J. (Warren MI) Watanabe Makoto (Farmington Hills MI), Multi-axis seat durability test machine.

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33. Hunt Bill (Snohomish WA) Parshotam Mahesh (Edmonds WA), Multi-axis universal circuit board test fixture.

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34. Kim Jin-euk,KRX ; Yoo Dae-geun,KRX ; Seong Young-bog,KRX, Oven for testing peripheral storage devices.

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35. Heyns Garrett J. (Boulder CO) McClure Terry R. (Kersey CO) Nicholl Hugh (Berthoud CO) Read Peter H. (Morrisville PA) Schulte Steven M. (Westminster CO) Tabrizi Mohammad F. (Westminster CO), Probemat cleaning system using CO₂ pellets.

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36. Liken Peter A. (West Olive MI) Hartwig Kevin L. (Holland MI) Martin Peter A. (Holland MI), Product carrier with extended port interface.

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37. Elwell Brian E. (Brentwood CA), Range test chamber.

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38. Hildebrandt Marc J. ; Trombley Joseph S. ; Cotter James R. ; Selby Theodore W., Rapidly cyclable foam testing oven.

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39. Krajec Russell Steven ; Oreskey Michael John, Removable fixture adapter with RF connections.

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40. Bushard Bradley B. (Chaska MN) Dion Philip G. (Columbia Heights MN) Heinz Joseph V. (Eden Prairie MN), Run-in test system for PC circuit board.

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41. Paek Woon-Juk,KRX ; Kang Jeong-Min,KRX ; Ryoo Dae-Geun,KRX ; Sung Young-Bok,KRX ; Nam Chang-Woo,KRX, System for testing hard disk drives.

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42. Hartley Jeffrey W. (Lancaster OH) Zelner Burch E. (Pataskala OH), Temperature cycling test chambers.

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43. Cassidy Michael P. (Chandler AZ), Test fixture with permanent circuit board extractor thereon.

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44. Wolff Ernest G. (Rolling Hills Estates CA) Eselun Steven A. (Long Beach CA), Test sample support assembly.

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45. O\Connor R. Bruce (San Diego CA) Toth Thomas E. (El Cajon CA) Ross James A. (Poway CA), Test station.

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46. Kim Jin-euk,KRX ; Yoo Dae-geun,KRX ; Nam Chang-woo,KRX, Tester for peripheral storage device.

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47. Lesley Arthur M. (Woodland Hills CA) Jaron William (Camarillo CA), Thermal stress screening system.

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48. Liken Peter A. (West Olive MI) Ensing Steven B. (Wyoming MI), Through-port load carrier and related test apparatus.

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49. Seelig Matthew E. ; Marchese-Ragona Silvio P., Wafer holding and orienting fixture for optical profilometry.

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50. Breunsbach Rex L. ; Austen Paul M., Wave solder analyzer.

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이 특허를 인용한 특허 (33) 인용/피인용 타임라인 분석

1. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.

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2. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.

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3. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.

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4. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.

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5. Martino, Peter, Damping vibrations within storage device testing systems.

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6. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.

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7. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.

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8. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.

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9. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.

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10. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.

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11. Merrow, Brian S., Enclosed operating area for disk drive testing systems.

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12. Merrow, Brian S., Enclosed operating area for storage device testing systems.

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13. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.

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14. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.

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15. Nishiuchi, Shigeto; Takahashi, Satoshi; Tsuyama, Masashi; Nakagawa, Takahiro, Multi drive test system for data storage device.

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16. Stehle, Vladimir; Siemer, Konrad; Riha, Volker; Kuznetsov, Dmitry; Altunina, Liubov; Kuvshinov, Vladimir A., Process for the production of mineral oil.

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17. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.

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18. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.

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19. Merrow, Brian S., Storage device testing system cooling.

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20. Merrow, Brian S., Storage device testing system cooling.

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21. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.

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22. Merrow, Brian S., Temperature control within disk drive testing systems.

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23. Merrow, Brian S., Temperature control within disk drive testing systems.

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24. Merrow, Brian S., Temperature control within storage device testing systems.

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25. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.

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26. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.

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27. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.

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28. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.

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29. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.

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30. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.

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31. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.

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32. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.

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33. Merrow, Brian S., Vibration isolation within disk drive testing systems.

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