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[미국특허] Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-016/00
  • H01L-021/306
  • H01L-021/02
  • C23F-001/00
출원번호 US-0646607 (2003-08-21)
발명자 / 주소
  • Zheng,Lingyi A.
  • Doan,Trung T.
  • Breiner,Lyle D.
  • Ping,Er Xuan
  • Weimer,Ronald A.
  • Kubista,David J.
  • Beaman,Kevin L.
  • Basceri,Cem
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Perkins Coie LLP
인용정보 피인용 횟수 : 6  인용 특허 : 216

초록

초록이 없습니다.

대표청구항

대표청구항이 없습니다.

이 특허에 인용된 특허 (216) 인용/피인용 타임라인 분석

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  4. Asai, Masayuki; Honda, Koichi; Umemoto, Mamoru; Okuda, Kazuyuki, Substrate processing apparatus and semiconductor device manufacturing method.
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  6. Asai, Masayuki; Honda, Koichi; Umemoto, Mamoru; Okuda, Kazuyuki, Substrate processing apparatus and semiconductor device manufacturing method.

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