Electro-optic time domain reflectometry
원문보기
IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0472640
(2006-06-21)
|
등록번호 |
US-7280190
(2007-10-09)
|
발명자
/ 주소 |
- Wang,Zhiyong
- Dias,Rajendra
- Goyal,Deepak
|
출원인 / 주소 |
|
대리인 / 주소 |
Schwabe, Williamson & Wyatt, P.C.
|
인용정보 |
피인용 횟수 :
1 인용 특허 :
9 |
초록
▼
Apparatuses, methods, and systems associated with and/or having components capable of, isolating defects in microelectronic packages are disclosed herein. In various embodiments, a defect-isolation apparatus may include an optoelectronic module to convert an optical test signal to an electrical test
Apparatuses, methods, and systems associated with and/or having components capable of, isolating defects in microelectronic packages are disclosed herein. In various embodiments, a defect-isolation apparatus may include an optoelectronic module to convert an optical test signal to an electrical test signal and provide the electrical test signal to a device under test; an electro-optic probe including an electro-optic crystal to polarize an optical sampling signal upon application of an electrical test signal reflected from the device under test to the electro-optic crystal; and an output module configured to receive the polarized optical sampling signal, and produce an electrical output signal as a function of time based at least in part on the polarized optical sampling signal, the electrical output signal adapted to facilitate isolation of the location(s) of the defect(s) in the device under test.
대표청구항
▼
What is claimed is: 1. An apparatus for facilitating isolation of defects in a device under test (DUT) comprising: an optoelectronic module configured to convert an optical test signal to an electrical test signal and provide the electrical test signal to the DUT to be reflected by one or more defe
What is claimed is: 1. An apparatus for facilitating isolation of defects in a device under test (DUT) comprising: an optoelectronic module configured to convert an optical test signal to an electrical test signal and provide the electrical test signal to the DUT to be reflected by one or more defects located in the DUT if the one or more defects are present in the DUT; an electro-optic probe including an electro-optic crystal to output a polarized optical sampling signal, the polarization being dependent upon the electrical test signal reflected from the DUT to the electro-optic crystal; and an output module configured to receive the polarized optical sampling signal, and produce an electrical output signal as a function of time based at least in part on the polarized optical sampling signal, the electrical output signal adapted to facilitate isolation of the location(s) of the defect(s) in the DUT. 2. The apparatus of claim 1, wherein the optoelectronic module includes a photoconductive switch to convert the first optical test signal to the electrical test signal. 3. The apparatus of claim 1, further comprising an optical-beam control network coupled to the optoelectronic module and configured to split an optical input signal into an optical test signal and an optical sampling signal. 4. The apparatus of claim 3, wherein the optical-beam control network is coupled to the optoelectronic module by one or more optical fiber couplers. 5. The apparatus of claim 3, wherein the optical-beam control network is configured to split a short-pulse laser beam into an optical test signal and an optical sampling signal. 6. The apparatus of claim 1, wherein the optoelectronic module is configured to convert a short-pulse laser beam to an electrical test signal. 7. The apparatus of claim 1, wherein the output module comprises a photodetector configured to receive a polarized optical signal and produce an electrical output signal therefrom. 8. The apparatus of claim 7, wherein the output module further comprises a lock-in amplifier to output the electrical output signal to a user interface. 9. The apparatus of claim 1, wherein the output module is configured to produce an electrical output signal having a temporal resolution on a scale of about 1 picosecond or less. 10. A method for facilitating isolation of defects in a device under test (DUT) comprising: providing an electrical test signal to a DUT to be reflected by one or more defects in the DUT, if present; allowing the reflected electrical test signal from the DUT to effect an electro-optic crystal to polarize the electro-optic crystal; causing the electro-optic crystal to output a polarized optical sampling signal; comparing the polarized optical sampling signal to a reference signal to isolate a location of a defect in the DUT, if present; producing an electrical output signal as a function of time based at least in part on the polarized optical sampling signal; and outputting the electrical output signal to isolate a location of a defect in the DUT, if present. 11. The method of claim 10, further comprising separating an optical input signal into an optical test signal and an optical sampling signal. 12. The method of claim 11, further comprising converting the optical test signal to an electrical test signal to provide to the DUT. 13. The method of claim 11, further comprising synchronizing the optical sampling signal and the polarized optical sampling signal. 14. The method of claim 10, wherein said providing the optical sampling signal to the electro-optic crystal to output the polarized optical signal comprises providing an optical sampling signal to the electro-optic crystal to output a polarized optical signal having a rise time of about 1 picosecond or less. 15. The method of claim 10, wherein said comparing the polarized optical signal to the reference signal to determine the location of a defect in the DUT comprises: producing an electrical output signal based on the polarized optical signal; and comparing the electrical output signal to a reference signal to determine a location of a defect in the DUT. 16. The method of claim 15, further comprising outputting the electrical output signal to a user interface. 17. A system comprising: a defect-isolation apparatus, including: an optoelectronic module configured to convert an optical test signal to an electrical test signal and provide the electrical test signal to a device under test (DUT) to be reflected by one or more defects located in the DUT if the one or more defects are present in the DUT; an electro-optic probe including an electro-optic crystal to output a polarized optical sampling signal, the polarization being dependent upon the electrical test signal reflected from the DUT to the electro-optic crystal; and an output module configured to receive the polarized optical sampling signal, and produce an electrical output signal as a function of time based at least in part on the polarized optical sampling signal, the electrical output signal adapted to facilitate isolation of the location(s) of the defect(s) in the DUT; and a bus coupled to the apparatus; and a mass storage device coupled to the bus. 18. The system of claim 17, wherein the output module comprises a photodetector and a lock-in amplifier. 19. The system of claim 17, further comprising a user interface coupled to the defect-isolation apparatus to display the electrical output signal.
이 특허에 인용된 특허 (9)
-
Hook William R.,CAX, Apparatus and methods for generating unambiguous large amplitude timing makers in time domain reflectometry systems for measuring propagation velocities of RF pulses to determine material liquid cont.
-
Hook William R.,CAX, Apparatus and methods for time domain reflectometry.
-
Okawauchi, Kouki, Defect inspection apparatus and defect inspection method.
-
Mourou Gerard (Rochester NY) Meyer Kevin E. (Rochester NY), Measurement of electrical signals with subpicosecond resolution.
-
Otsuji, Taiichi; Shimizu, Toshiyuki, Method and apparatus for measuring the length of a transmission line in accordance with a reflected waveform.
-
Hartog, Arthur Harold, Optical time domain reflectometry method and apparatus.
-
Hornsby,Rodney M.; Maxwell, Jr.,John M.; Schwarz,Charles R., System and method for remotely detecting and locating damaged conductors in a power system.
-
Hook William R. (Box 10 Shawnigan Lake ; British Columbia CAX V0R 2W0), Timing markers in time domain reflectometry systems.
-
Hariharan Anand (Ann Armbor MI) Harter Donald J. (Ann Armbor MI), Ultrashort pulsewidth laser ranging system employing a time gate producing an autocorrelation and method therefore.
이 특허를 인용한 특허 (1)
-
Xie, Mayue; Tanukonda Devarajulu, Hemachandar; Goyal, Deepak, Terahertz transmission contactless probing and scanning for signal analysis and fault isolation.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.