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Eddy current part inspection system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-027/72
  • G01N-027/82
출원번호 US-0161045 (2005-07-20)
등록번호 US-7312607 (2007-12-25)
발명자 / 주소
  • Nygaard,George
출원인 / 주소
  • General Inspection LLC
대리인 / 주소
    Brooks Kushman P.C.
인용정보 피인용 횟수 : 28  인용 특허 : 18

초록

At least one measurement coil of an eddy current part inspection system is oriented relative to a track surface so that the longitudinal axis of the magnetic field generated by the at least one measurement coil is skewed relative to the track surface so as to be substantially aligned with the longit

대표청구항

What is claimed is: 1. A part inspection system, comprising: a. at least one measurement coil adapted to generate a magnetic field responsive to a current in said at least one measurement coil, wherein said at least one measurement coil comprises: i. an opening adapted to receive a part to be inspe

이 특허에 인용된 특허 (18)

  1. Auchterlonie Richard C. (5701 N. Sheridan #29-q Chicago IL 60660), Absolute position sensor having multi-layer windings of different pitches providing respective indications of phase prop.
  2. Wallrafen Werner (Kelkheim DEX), Angle sensor with inductive coil coupling.
  3. Nakaoka Eiichi (Kyoto JPX), Apparatus for electromagnetically detecting flaws in metallic objects.
  4. Clary Derwin R. (Odessa TX), Apparatus for supporting an inspection device for tubular members and accommodating lateral shifting of the tubular memb.
  5. D\Hondt Jean-Pierre (Tournai BEX), Circuit for the fast calculation of the discrete Fourier transform of a signal.
  6. Ciani Lorenzo (Udine ITX), Device to detect disturbances in an electromagnetic field induced by surface faults in a metallic bar or wire rod in mov.
  7. Urata Megumu (Naka JPX) Tsukui Kazushige (Mito JPX), Eddy current flaw detecting apparatus and method thereof.
  8. Mandl Roland,DEX ; Mednikov Felix,RUX ; Netschaewsky Mark,RUX ; Wisspeintner Karl,DEX, Eddy current sensor.
  9. Torre Rocco (Mt. Clemens MI), Eddy current test system including a member of high permeability material effective to concentrate flux in a very small.
  10. deWalle Stewart (Rexdale CAX) deWalle Richard T. (Rexdale CAX), Eddy-current probes especially for the scanning of non-flat profiled surfaces.
  11. Nance Roy A. (McMurray PA) Hartley William H. (Pittsburgh PA) Caffarel Alfred J. (Pittsburgh PA), Improved multi-directional eddy current inspection test apparatus for detecting flaws in metal articles.
  12. Forster Friedrich M. (Pfullingen DEX), Method and apparatus for electro-magnetically testing elongated objects.
  13. Fisher Jay L. ; Pickens Keith S., Method for generating and displaying complex data derived from non-destructive evaluation scanning.
  14. Patzwaldt Wolfgang,DEX, Method for the operation and for the evaluation of signals from an eddy current probe and device for performing the method.
  15. Sellen Martin (Merzig NLX), Method of calibrating a sensor.
  16. Takaishi Kazuhide (Yamaguchi JPX) Saeki Akira (Tokyo JPX) Kadonaga Toshiki (Yamaguchi JPX) Fujii Noritsugu (Yamaguchi JPX), Method of nondestructively inspecting for flaws in metal stocks including selection of detection coil diameter..
  17. Suhr Peter J. (Garden City NY) Spierer Edward D. (Belle Harbor NY), Multi-probe flux leakage testing apparatus using skewed probes.
  18. Garner Henry C. (Mexborough GB2) Broadbent Jack (Rotherham GB2), Surface inspection equipment.

이 특허를 인용한 특허 (28)

  1. Kujacznski, Nathan Andrew-Paul; St. Onge, James W.; Nygaard, Michael G., High speed method and system for inspecting a stream of parts.
  2. Kujacznski, Nathan Andrew-Paul; St. Onge, James W.; Nygaard, Michael G., High speed method and system for inspecting a stream of parts at a pair of inspection stations.
  3. Fleming, Christopher C.; Nygaard, Michael G., High-resolution imaging and processing method and system for determining a geometric dimension of a part.
  4. Fleming, Christopher C.; Nygaard, Michael G., High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined.
  5. Kujacznski, Nathan Andrew-Paul; Nygaard, Michael G., High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
  6. Nygaard, Michael G., High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
  7. Nygaard, Michael G.; St. Onge, James W.; Kujacznski, Nathan Andrew-Paul; Poletti, Laura L., Method and system for inspecting a manufactured part at an inspection station.
  8. Nygaard, Michael G.; Poletti, Laura L., Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis.
  9. Offenborn, Robert Joseph; Alexander, Christopher Michael; Nygaard, Gregory Martin; Nygaard, Michael George, Method and system for optically inspecting headed manufactured parts.
  10. Offenborn, Robert Joseph; Alexander, Christopher Michael; Nygaard, Gregory Martin; Nygaard, Michael George, Method and system for optically inspecting headed manufactured parts.
  11. Nygaard, Michael G., Method and system for optically inspecting manufactured rounds of ammunition or cylindrical components of the rounds to obtain rounds which exhibit superior accuracy when fired.
  12. Nygaard, Michael G., Method and system for optically inspecting outer peripheral surfaces of parts.
  13. Nygaard, Michael G., Method and system for optically inspecting parts.
  14. Nygaard, Michael G., Method and system for optically inspecting parts.
  15. Nygaard, Michael G.; Kujacznski, Nathan Andrew-Paul, Method and system for optically inspecting parts.
  16. Walstra, Eric M., Method and system for optically inspecting parts.
  17. Nygaard, Michael G., Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis.
  18. Nygaard, Michael G.; Kujacznski, Nathan Andrew-Paul, Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis.
  19. Cooper, Jared Klineman; Kumar, Ajith Kuttannair; Noffsinger, Joseph Forrest, Route examining system and method.
  20. Kumar, Ajith Kuttannair; Fries, Jeffrey Michael; Noffsinger, Joseph Forrest; Mitchell, Michael Scott; Ehret, Steven Joseph, Route examining system and method.
  21. Noffsinger, Joseph Forrest; Kumar, Ajith Kuttannair; Plotnikov, Yuri Alexeyevich; Fries, Jeffrey Michael; Boyanapally, Srilatha; Ehret, Steven Joseph, Route examining system and method.
  22. Kumar, Ajith Kuttannair; Noffsinger, Joseph Forrest; Nieters, Edward James, System and method for acoustically identifying damaged sections of a route.
  23. Kumar, Ajith Kuttannair; Eldredge, David; Ballesty, Daniel; Cooper, Jared Klineman; Roney, Christopher; Houpt, Paul; Mathe, Stephen; Julich, Paul; Kisak, Jeffrey; Shaffer, Glenn; Nelson, Scott; Daum, Wolfgang, System and method for vehicle control.
  24. Otsubo, Tom; Daum, Wolfgang; Stull, Craig Alan; Hann, Gregory; Danner, Phillip, System, method and computer software code for determining a mission plan for a powered system using signal aspect information.
  25. Kumar, Ajith Kuttannair; Shaffer, Glenn Robert; Houpt, Paul Kenneth; Movsichoff, Bernardo Adrian; Chan, David So Keung; Eker, Sukru Alper, Trip optimization system and method for a train.
  26. Kopychev, Andrey; Hecht, Gideon; Wellings, Peter J., User interface powered via an inductive coupling.
  27. Kopychev, Andrey; Hecht, Gideon; Wellings, Peter J., User interface powered via an inductive coupling.
  28. Cooper, Jared Klineman; Kumar, Ajith Kuttannair; Smith, Eugene; Nagrodsky, Nick David; Schoonmaker, William Cherrick; Goodermuth, Todd William, Vehicle consist configuration control.
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