Organic thin film transistor with polymeric interface
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IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01L-029/94
H01L-029/66
출원번호
US-0227547
(2005-09-15)
등록번호
US-7352038
(2008-04-01)
발명자
/ 주소
Kelley,Tommie W.
Boardman,Larry D.
Dunbar,Timothy D.
Jones,Todd D.
Muyres,Dawn V.
Pellerite,Mark J.
Smith,Terrance P.
출원인 / 주소
3M Innovative Properties Company
대리인 / 주소
Kokko,Kent S.
인용정보
피인용 횟수 :
6인용 특허 :
29
초록▼
Provided is an organic thin film transistor comprising a polymeric layer interposed between a gate dielectric and an organic semiconductor layer. Various homopolymers, copolymers, and functional copolymers are taught for use in the polymeric layer. An integrated circuit comprising a multiplicity of
Provided is an organic thin film transistor comprising a polymeric layer interposed between a gate dielectric and an organic semiconductor layer. Various homopolymers, copolymers, and functional copolymers are taught for use in the polymeric layer. An integrated circuit comprising a multiplicity of thin film transistors and methods of making a thin film transistor are also provided. The organic thin film transistors of the invention typically exhibit improvement in one or more transistor properties.
대표청구항▼
We claim: 1. An organic thin film transistor (OTFT) comprising a substantially nonfluorinated polymeric layer having a thickness less than about 400 Å interposed between a gate dielectric and an organic semiconductor layer, wherein said polymeric layer comprises polyarylene derived from monom
We claim: 1. An organic thin film transistor (OTFT) comprising a substantially nonfluorinated polymeric layer having a thickness less than about 400 Å interposed between a gate dielectric and an organic semiconductor layer, wherein said polymeric layer comprises polyarylene derived from monomeric precursors, monomers, and oligomers comprising an aromatic-functional segment. 2. The transistor of claim 1 wherein the polymeric layer has a thickness less than about 200 Å. 3. The transistor of claim 1 wherein the polymeric layer has a thickness from about 5 Å to about 200 Å. 4. The transistor of claim 1 wherein said monomers are selected from divinyl benzene, straight-chain or branched C1-C18 aliphatic or arylalkyl cinnamates, and benzocyclobutene. 5. The transistor of claim 1 wherein said polyarylene comprises polyfluorene. 6. The transistor of claim 1 wherein said polyarylene is a parylene polymer. 7. The transistor of claim 1 wherein said polymeric layer comprises a substantially non-polar polymer having a Tg above about 25�� C. 8. The transistor of claim 1 wherein said polymeric layer comprises a polyarylene derived from heating a composition comprised of cyclopentadienone and acetylene-substituted materials. 9. The organic thin film transistor of claim 1 having at least one property selected from: a) a threshold voltage between about-25 and 25 volts; b) a subthreshold slope below about 10 volts per decade (absolute value); c) an on/off ratio of at least about 104; d) a charge-carrier mobility at least about 10-2 cm2/Vs when the semiconductor layer comprises a p-type semiconductor; e) a charge-carrier mobility at least about 10-4 cm2/Vs when the semiconductor layer comprises an n-type semiconductor; f) a charge-carrier mobility at least about 50% greater than a comparison OTFT that lacks the polymeric layer; g) a charge-carrier mobility at least about 0.02 cm2/Vs greater than a comparison OTFT that lacks the polymeric layer; h) a charge-carrier mobility at least about 0.10 cm2/Vs greater than a comparison OTFT that lacks the polymeric layer; and i) a charge-carrier mobility at least about 1.0 cm2/Vs greater than a comparison OTFT that lacks the polymeric layer. 10. The transistor of claim 9 wherein the semiconductor layer comprises pentacene or a substituted pentacene and wherein the transistor has a charge-carrier mobility at least about 10-1 cm2/Vs. 11. The transistor of claim 1 comprising a gate dielectric that comprises an organic electrically insulating material, optionally capped with an inorganic electrically insulating material. 12. The transistor of claim 1 comprising a gate dielectric that comprises an inorganic electrically insulating material selected from strontiates, tantalates, titanates, zirconates, aluminum oxides, silicon oxides, tantalum oxides, titanium oxides, silicon nitrides, barium titanate, barium strontium titanate, barium zirconate titanate, zinc selenide, zinc sulfide, and alloys, and combinations, and multilayers thereof. 13. The transistor of claim 1 further comprising a non-participating substrate. 14. The transistor of claim 13 wherein the non-participating substrate is selected from inorganic glasses, ceramic foils, polymeric materials, filled polymeric materials, coated metallic foils, acrylics, epoxies, polyamides, polycarbonates, polyimides, polyketones, poly(ether ether ketone), polynorbornenes, polyphenyleneoxides, poly(ethylene naphthalenedicarboxylate), poly(ethylene terephthalate), poly(phenylene sulfide), and fiber-reinforced plastics. 15. The transistor of claim 13 wherein the non-participating substrate is flexible. 16. The transistor of claim 1 wherein the organic semiconductor layer comprises a material selected from acenes, perylenes, fullerenes, phthalocyanines, and oligothiophenes. 17. The transistor of claim 1 wherein the organic semiconductor layer comprises a vapor-deposited organic semiconductor.
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