초록 ▼

A system for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation so

A system for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.

대표청구항 ▼

What is claimed is: 1. A coating thickness monitor for measuring the thickness of at least a portion of a coated-anodized coating on at least a portion of a substrate, said coating thickness monitor including: (a) at least one radiation source directed at at least a portion of the anodized substrat

What is claimed is: 1. A coating thickness monitor for measuring the thickness of at least a portion of a coated-anodized coating on at least a portion of a substrate, said coating thickness monitor including: (a) at least one radiation source directed at at least a portion of the anodized substrate; (b) at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed at the anodized substrate from said radiation source; (c) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate; and (d) a guide system capable of transmitting the captured radiation from said at least one probe to said at least one detector. 2. The coating thickness monitor according to claim 1 wherein said guide system is an optical guide. 3. The coating thickness monitor according to claim 2 wherein said optical guide is an optical fiber. 4. The coating thickness monitor according to claim 1 wherein said processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate by said coating thickness monitor includes at least one of using a color, using an interference pattern, using an amount of absorbed radiation, using an intensities ratio of a minimum reflected radiation wavelength and a maximum reflected radiation wavelength, and using a Fast Fourier Transformation (FFT) of the captured radiation. 5. The coating thickness monitor according to claim 1 wherein said processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate by said coating thickness monitor includes using a Fast Fourier Transformation (FFT) of the captured radiation. 6. The coating thickness monitor according to claim 1 wherein said at least one radiation source comprises polychromatic radiation. 7. The coating thickness monitor according to claim 6 wherein said polychromatic radiation is one or more of ultraviolet, visible, or infrared radiation. 8. The coating thickness monitor according to claim 1 wherein said at least one detector comprises one or more of an interferometer, photoelectric receiver array, CCD element, or an optoelectric transducer. 9. The coating thickness monitor according to claim 1 wherein the guide system is coupled with the radiation source to direct radiation to the surface of the substrate. 10. The coating thickness monitor according to claim 1, further comprising a computer. 11. The coating thickness monitor according to claim 1, further comprising an additional source of radiation. 12. A method for measuring coating thickness of at least a portion of a coated-anodized coating on at least a portion of a substrate wherein said coated-anodized coating comprises a barrier coating, said method including: (a) providing a coating thickness monitor; (b) directing at least one radiation source at at least a portion of the coated-anodized substrate; (c) capturing, using at least one probe, at least a portion of the radiation reflected and refracted by the coated-anodized coating on the substrate, the captured radiation being at least a portion of the radiation directed the coated-anodized substrate from said radiation source; (d) transmitting the captured radiation using a guide system from said at least one probe to at least one detector; and (e) processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate. 13. The method according to claim 12 for measuring coating thickness of at least a portion of a coated-anodized coating wherein said barrier coating comprises an organic coating. 14. The method according to claim 13 for measuring coating thickness of at least a portion of a coated-anodized coating wherein said organic coating comprises at least one of an epoxy and a polyurethane. 15. The method according to claim 14 for measuring coating thickness of at least a portion of a coated-anodized coating wherein said epoxy coating comprises at least one of an epoxy polyamine and a epoxy polyamide primer. 16. The method according to claim 13 for measuring coating thickness of at least a portion of a coated-anodized coating wherein said organic coating comprises a resin. 17. The method according to claim 13 for measuring coating thickness of at least a portion of a coated-anodized coating wherein said organic coating comprises a composite coating. 18. The method according to claim 13 for measuring coating thickness of at least a portion of a coated-anodized coating wherein said organic coating comprises a top coat. 19. The method of claim 12, further comprising displaying the determination of at least the thickness of the anodized coating on the substrate on a computer monitor.