초록 ▼

We have developed a method of registration of a particle beam to internal alignment targets present within photoresist areas which are to be imaged. The method does not affect the photoresist, so the quality of pattern produced in the resist after imaging is not affected. The method used for regist

We have developed a method of registration of a particle beam to internal alignment targets present within photoresist areas which are to be imaged. The method does not affect the photoresist, so the quality of pattern produced in the resist after imaging is not affected. The method used for registration of the particle beam to internal alignment targets also can be used to align a pattern in real time, while the pattern is being created, with the internal alignment targets. The real time alignment during creation of a pattern image in the photoresist can be used to correct for drift, or thermal expansion, or gravitational sag, by way of example.

대표청구항 ▼

We claim: 1. A method of improving registration of a particle-beam relative to a non-exposed, photoresist-coated substrate, wherein at least a portion of the registration targets are present within an area of the non-exposed photoresist which is to be imaged during patterning, said method comprisin

We claim: 1. A method of improving registration of a particle-beam relative to a non-exposed, photoresist-coated substrate, wherein at least a portion of the registration targets are present within an area of the non-exposed photoresist which is to be imaged during patterning, said method comprising: a) providing a primary beam optical axis in the form of a particle beam axis, wherein said particle beam is used to generate a pattern; b) providing a secondary optical axis in the form of an optical reader axis; c) providing a position fiducial at a fixed location relative to the substrate; d) providing a controller adapted to control the operation of the particle beam axis and the optical microscope axis, wherein the controller is also adapted to calculate a plurality of vectors from the position fiducial to a plurality of pattern alignment targets present on the substrate; e) using the secondary optical axis to determine a feature location of the position fiducial, and calculating coordinates x0 y0 of the feature location; f) moving the substrate under the secondary optical axis such that an alignment target is within a field of view of the secondary optical axis, and calculating coordinates x1 y1 of the alignment target location; g) calculating an alignment vector for the alignment target, which vector is l1=(x1-x0)x+(y1-y0)y; h) calculating at least 2 additional alignment vectors for at least 2 additional alignment target locations using steps f) and g); i) moving the position fiducial under the primary beam optical axis, and scanning a feature of said position fiducial using the primary beam optical axis in a manner to determine the location of the position fiducial; j) calculating coordinates (x'0, y'0) of the position fiducial for the primary beam optical axis; and k) calculating a location for previously-determined alignment target locations on the substrate with respect to the primary beam optical axis, by applying corresponding location vectors ln, where n is an integer of at least three, to the coordinates (x'0, y'0) which represent a starting location of the primary optical axis, whereby the primary optical axis is registered to the pattern alignment targets on the non-imaged photoresist coated substrate. 2. A method in accordance with claim 1, wherein said particle beam is selected from the group consisting of an electron beam, an ion beam, a laser beam, a proton beam, a neutron beam, or an X-ray. 3. A method in accordance with claim 1 or claim 2, wherein said registration of said particle beam relative to a non-imaged, photoresist-coated substrate is carried out using a number of pattern alignment targets ranging from about 3 targets to about 16 targets. 4. A method in accordance with claim 3, wherein said registration of said particle beam is carried out over a time period ranging between about 10 seconds and about 60 seconds. 5. A method in accordance with claim 1, wherein a controller/computer is used to calculate at least three alignment vectors corresponding to the relationship between the position fiducial coordinates and pattern alignment targets measured using the secondary optical axis, and to relate the particle beam to the pattern alignment targets using a combination of the data related to said coordinates of the position fiduciary for said primary beam optical axis in combination with the at least three alignment vectors. 6. A method of aligning a planned particle-beam-generated pattern to pattern alignment targets, wherein at least a portion of said alignment targets are present within an area of said substrate which includes non-exposed photoresist, during writing of said planned pattern by said particle beam, comprising: a) providing a primary beam optical axis in the form of a particle beam axis; b) providing a secondary optical axis in the form of an optical reader axis; c) providing a position fiducial at a fixed location relative to said substrate; d) providing a controller adapted to control the operation of said particle beam axis and said optical microscope axis, wherein the controller is also adapted to calculate a plurality of vectors from said position fiducial to at least three pattern alignment targets present on said substrate; e) using said secondary optical axis to determine a feature location of said position fiducial, and calculating coordinates x0 y0 of said feature location; f) moving the substrate under the secondary optical axis such that an alignment target is within a field of view of said secondary optical axis, and calculating coordinates x1 y1 of said alignment target location; g) calculating an alignment vector for said alignment target, which vector is l1=(x1-x0)x+(y1-y0)y; h) calculating at least 2 additional alignment vectors for at least 2 additional alignment target locations using steps f) and g); i) moving said position fiducial under the primary beam optical axis, and scanning a particle beam from said primary beam optical axis in a manner to determine a feature location of said position fiducial; j) calculating coordinates (x'0, y'0) of said position fiducial for said primary beam optical axis; k) calculating a location for alignment target locations on said substrate which locations were previously determined using said secondary optical axis by applying corresponding location vectors ln, where n is an integer ranging from 3 to about 16, to the coordinates (x'0, y'0) which represent a starting location of said primary optical axis; and l) using a plurality of alignment target locations relative to a location of said primary beam optical axis to conform said primary beam optical axis to an alignment with respect to said alignment target locations during writing of a particle-beam-generated pattern on said substrate. 7. A method in accordance with claim 6, wherein said particle beam is selected from the group consisting of an electron beam, an ion beam, a laser beam, a proton beam, a neutron beam, or an X-ray. 8. A method in accordance with claim 7, wherein said particle beam is an electron beam, and wherein a coordinate transform is applied to known coordinates in a coordinate space of said primary beam optical axis, with respect to alignment target locations on said substrate, to correct for scale, orthogonality, or other errors which become apparent during writing of an electron-beam-generated pattern on said substrate. 9. An apparatus which used to align a substrate having a non-imaged photoresist on its surface to a particle beam axis used to generate a pattern image in the photoresist comprising: a primary beam optical axis in the form of a particle beam axis, which particle beam is used to generate a pattern; a secondary optical axis in the form of an optical reader such as an optical microscope; a position fiducial, which is located at a stationary position relative to said substrate; and a controller/computer adapted to control the operation of said particle beam and said optical microscope axis, where said controller/computer is also adapted to calculate at least three vectors from said position fiducial to at least three alignment target locations on a substrate using data input from said secondary optical axis, and wherein the controller coordinates the at least three vectors with a location of said position fiducial measured by the primary optical axis to conform said primary beam optical axis to an alignment with respect to said alignment target locations on said substrate. 10. An apparatus in accordance with claim 9, wherein said particle beam is selected from the group consisting of an electron beam, an ion beam, a laser beam, a proton beam, a neutron beam, or an X-ray. 11. An apparatus in accordance with claim 9, wherein said position fiducial is present on a stage on which said substrate is mounted. 12. An apparatus in accordance with claim 9, wherein said position fiducial is present in a form of a grid.