초록 ▼

A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acqu

A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.

대표청구항 ▼

What is claimed is: 1. A three-dimensional image grabber comprising: a pattern projecting assembly for simultaneously projecting at least two phase-shifted patterns onto an object; each of said projected patterns being characterized by a predetermined bandwidth; said pattern projection assembly inc

What is claimed is: 1. A three-dimensional image grabber comprising: a pattern projecting assembly for simultaneously projecting at least two phase-shifted patterns onto an object; each of said projected patterns being characterized by a predetermined bandwidth; said pattern projection assembly including a semi-transparent plate including a pattern to be illuminated by an illuminating assembly, a spectral splitter to be positioned between said plate and said illuminating assembly and a projector for projecting said illuminated plate onto said object; said illuminating assembly including a source of white light so positioned as to be projected through said plate; and an image acquisition apparatus sensitive to said predetermined bandwidths for simultaneously taking an image of each of said projected patterns on the object. 2. A three-dimensional image grabber as recited in claim 1, wherein at least one of said predetermined bandwidth includes a single wavelength. 3. A three-dimensional image grabber as recited in claim 1, wherein said illuminating assembly further includes an optical fiber and a condenser for bringing light from said white source to said plate. 4. A three-dimensional image grabber as recited in claim 1, wherein said semi-transparent plate is a grid. 5. A three-dimensional image grabber as recited in claim 1, wherein said pattern projection assembly includes at least two pattern projecting apparatuses and a reflecting arrangement; each of said pattern projecting apparatus being configured to project a light having a predetermined bandwidth through a pattern; said reflecting arrangement being so configured as to direct said projected patterns along a common direction of incidence. 6. A three-dimensional image grabber as recited in claim 5, wherein at least one of said pattern projecting apparatuses includes a semi-transparent plate including a pattern to be illuminated by an illuminating assembly and a projected for projecting said illuminated plate onto said reflecting arrangement; said illuminating assembly including a source of light having a predetermined bandwidth and being so positioned as to be projected through said plate. 7. A three-dimensional image grabber as recited in claim 5, wherein said projecting arrangement includes at least one of said a mirror and a semi-transparent mirror. 8. A three-dimensional image grabber as recited in claim 5, wherein said plate is a grid. 9. A three-dimensional image grabber as recited in claim 5, wherein said pattern projecting apparatuses are so positioned relative to each other as to each provide the same distance from said respective plate to the object. 10. A three-dimensional image grabber as recited in claim 1, wherein said image acquisition apparatus includes at least one camera sensitive to said predetermined bandwidth. 11. A three-dimensional image grabber as recited in claim 10, wherein said image acquisition apparatus includes a telecentric lens. 12. A three-dimensional image grabber as recited in claim 1, wherein said image acquisition apparatus includes at least two cameras, each sensitive to one of said predetermined bandwidth. 13. A three-dimensional image grabber as recited in claim 10, wherein said camera is selected from the group consisting of a Charge Coupled Device (CCD) camera and a Complementary Metal-Oxide-Silicon (CMOS) device. 14. A system for measuring the relief of an object, said system comprising: a pattern projecting assembly for simultaneously projecting at least three phase-shifted patterns onto the object; each of said projected patterns being characterized by a predetermined bandwidth; an image acquisition apparatus sensitive to said predetermined bandwidths for taking an image of each of said at least three phase-shifted projected patterns on the object; each of said images including a plurality of pixels having intensity values; and a controller configured for: a) receiving from the image acquisition apparatus said at least three images of the projected patterns onto the object; b) computing the object phase for each pixel using the at least three object intensity values for the corresponding pixel; and c) computing the relief of the object at each pixel position using said object phase at the corresponding pixel position. 15. A system as recited in claim 14, wherein said image acquisition apparatus includes at least one camera sensitive to said predetermined bandwidths. 16. A system as recited in claim 14, wherein said computer includes memory means for storing said images during their process. 17. A system as recited in claim 14, wherein said computer includes at least one of a storing device, an input device and an output device. 18. The use of the system of claim 14, for lead-coplanarity inspection.