IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0491870
(2006-07-24)
|
등록번호 |
US-7427759
(2008-09-23)
|
우선권정보 |
FR-05 07847(2005-07-22) |
발명자
/ 주소 |
- Pruvot,Henri
- Ruocco Angari,Bernard
|
출원인 / 주소 |
- Sagem Defense Securite Le Ponant de Paris
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
3 인용 특허 :
1 |
초록
▼
Method of identifying an infrared matrix sensor, characterized in that, for at least some of the pixels of the sensor matrix, information concerning the position of the pixel in the matrix is recorded and information concerning at least one characteristic of each of the pixels is determined, and in
Method of identifying an infrared matrix sensor, characterized in that, for at least some of the pixels of the sensor matrix, information concerning the position of the pixel in the matrix is recorded and information concerning at least one characteristic of each of the pixels is determined, and in that all of these pairs of information associated with the respective pixels (or mapping) are kept in memory as sensor identifier information.
대표청구항
▼
What is claimed is: 1. A method of identifying an infrared matrix sensor, wherein first information relating to at least one characteristic of at least some of the pixels of the sensor matrix is recorded, wherein second information relating to the position of each of said at least some of the pixel
What is claimed is: 1. A method of identifying an infrared matrix sensor, wherein first information relating to at least one characteristic of at least some of the pixels of the sensor matrix is recorded, wherein second information relating to the position of each of said at least some of the pixels in the sensor matrix is recorded, wherein said first information and second information associated with said respective pixels are paired, wherein said paired information is memorized (mapping) as an identifier means for identifying said infrared matrix sensor, wherein pixels are disconnected in at least one predetermined area of the sensor matrix according to a previously established pattern, and wherein the resulting mapping is memorized as a signature of a supplier of the infrared matrix sensor and/or an individual signature of the infrared matrix sensor itself. 2. The method according to claim 1, wherein said characteristic is a gain of the pixel. 3. The method according to claim 1, wherein said characteristic is an offset value of the pixel. 4. The method according to claim 1, wherein said characteristic is a noise level of the pixel. 5. A method of identifying an infrared matrix sensor, wherein first information relating to at least one characteristic of at least some of the pixels of the sensor matrix is recorded, wherein second information relating to the position of each of said at least some of the pixels in the sensor matrix is recorded, wherein said first information and second information associated with said respective pixels are paired, wherein said paired information is memorized (mapping) as an identifier means for identifying said infrared matrix sensor, wherein an initial mapping of said characteristic of said pixels placed in a given condition is recorded, wherein then said condition is modified, wherein then a final mapping of said characteristic of said pixels placed in said modified condition is recorded, wherein said initial and final mappings are compared, and wherein a result mapping resulting from said comparison is memorized as a signature of the supplier of the infrared matrix sensor and/or an individual signature of the infrared matrix sensor itself. 6. A method of identifying an infrared matrix sensor, wherein at least some pixels are disconnected in at least one predetermined area in the sensor matrix according to a previously established pattern, wherein information relating to the position of said disconnected pixels in the matrix is recorded (mapping), and wherein said mapping is memorized as a signature of the supplier of the infrared matrix sensor and/or an individual signature of the infrared matrix sensor itself. 7. The method according to claim 6, wherein said mapping is encoded. 8. The method according to claim 6, wherein said mapping relates to all the pixels of said at least one predetermined area of the matrix. 9. The method according to claim 6, wherein sad mapping relates only to some of the pixels of said at least one predetermined area of the matrix. 10. A method of identifying an infrared matrix sensor, wherein first information relating to at least one characteristic of at least some of the pixels of the sensor matrix which are placed in a given condition is recorded, wherein second information relating to the position of each of said at least some of the pixels of the sensor matrix which are placed in said given condition is recorded, wherein said first information and second information associated with said respective pixels placed in said given condition are respectively paired (initial mapping) and are recorded, wherein then said condition of said pixels is modified, wherein then a further mapping (final mapping) of this characteristic of said pixels is recorded, wherein said initial and final mappings are compared and wherein a result mapping resulting from said comparison is memorized as a signature of a supplier of said infrared matrix sensor and/or an individual signature of said infrared matrix sensor itself. 11. The method according to claim 10, wherein said mapping is encoded. 12. The method according to claim 10, wherein said characteristic is a defective state of the pixel. 13. The method according to claim 10, wherein said characteristic is a gain of the pixel. 14. The method according to claim 10, wherein said characteristic is an offset value of the pixel. 15. The method according to claim 10, wherein said characteristic is a noise level of the pixel.
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