Bonding apparatus and method of bonding for a semiconductor chip
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01L-021/44
H01L-021/02
출원번호
US-0991851
(2004-11-19)
등록번호
US-7432129
(2008-10-07)
우선권정보
JP-2004-195299(2004-07-01)
발명자
/ 주소
Matsumura,Takayoshi
출원인 / 주소
Fujitsu Limited
대리인 / 주소
Staas & Halsey LLP
인용정보
피인용 횟수 :
0인용 특허 :
2
초록▼
A method of bonding and a bonding apparatus for a semiconductor chip that apply ultrasonic vibration to the semiconductor chip to bond the semiconductor chip to a substrate carry out leveling effectively at low cost and in a short time and can improve the bonding between the semiconductor chip and t
A method of bonding and a bonding apparatus for a semiconductor chip that apply ultrasonic vibration to the semiconductor chip to bond the semiconductor chip to a substrate carry out leveling effectively at low cost and in a short time and can improve the bonding between the semiconductor chip and the substrate. In a positioning step, bumps of the semiconductor chip and pads of the substrate are positioned and placed in contact. In a leveling step, ultrasonic vibration of a first predetermined frequency is applied to the semiconductor chip to make the bumps of the semiconductor chip and the pads of a substrate rub against each other to level the bumps. In a bonding step, ultrasonic vibration of a second predetermined frequency that differs to the first predetermined frequency is applied to the semiconductor chip to bond the bumps and pads of the semiconductor chip and the substrate.
대표청구항▼
What is claimed is: 1. A method of bonding a semiconductor chip, comprising: positioning and placing in contact bumps or pads formed on one side of a semiconductor chip and pads or bumps formed on a mounting surface of a substrate, which correspond to the bumps or pads of the semiconductor chip; co
What is claimed is: 1. A method of bonding a semiconductor chip, comprising: positioning and placing in contact bumps or pads formed on one side of a semiconductor chip and pads or bumps formed on a mounting surface of a substrate, which correspond to the bumps or pads of the semiconductor chip; contacting a contact body, which is connected to a first ultrasonic vibrator capable of vibrating at a first predetermined frequency and a second ultrasonic vibrator capable of vibrating at a second predetermined frequency, to the semiconductor chip; applying ultrasonic vibration of a first predetermined frequency, by vibrating the first ultrasonic vibrator, to the semiconductor chip to make the bumps or pads of the semiconductor chip and the pads or bumps of a substrate rub against each other to level the bumps; and applying ultrasonic vibration of a second predetermined frequency, by vibrating the second ultrasonic vibrator, that differs from the first predetermined frequency, to the semiconductor chip, via the contact body, to simultaneously bond the bumps and the pads of the semiconductor chip and the substrate, wherein the ultrasonic vibration, which is applied to the contact body by the first and second ultrasonic vibrators, is in the form of compressional waves, the first ultrasonic vibrator and the second ultrasonic vibrator are connected to the contact body from different directions, such that the ultrasonic vibration of the first predetermined frequency, which is applied by the first ultrasonic vibrator during the leveling, and the ultrasonic vibration of the second predetermined frequency, which is applied by the second ultrasonic vibrator during the bonding, are set to progress in different directions, a length of the contact body in the wave direction of the ultrasonic vibration of the first predetermined frequency applied by the first ultrasonic vibrator is set as a natural number multiple of the wavelength of the ultrasonic vibration of the first predetermined frequency, and a length of the contact body in the wave direction of the ultrasonic vibration of the second predetermined frequency applied by the second ultrasonic vibrator is set as a natural number multiple of the wavelength of the ultrasonic vibration of the second predetermined frequency. 2. A method of bonding a semiconductor chip, comprising: positioning and placing in contact bumps or pads formed on one side of a semiconductor chip and pads or bumps formed on a mounting surface of a substrate, which correspond to the bumps or pads of the semiconductor chip: contacting a contact body, which is connected to a first ultrasonic vibrator capable of vibrating at a first predetermined frequency and a second ultrasonic vibrator capable of vibrating at a second predetermined frequency, to the semiconductor chip; applying ultrasonic vibration of a first predetermined frequency, by vibrating the first ultrasonic vibrator, to the semiconductor chip to make the bumps or pads of the semiconductor chip and the pads or bumps of a substrate rub against each other to level the bumps; and applying ultrasonic vibration of a second predetermined frequency, by vibrating the second ultrasonic vibrator, that differs from the first predetermined frequency, to the semiconductor chip, via the contact body, to simultaneously bond the bumps and the pads of the semiconductor chip and the substrate, wherein in the applying ultrasonic vibration of a first predetermined frequency, ultrasonic vibrations of a plurality of different frequencies are applied to the semiconductor chip as the ultrasonic vibration of the first predetermined frequency, a plurality of first ultrasonic vibrators, whose vibration frequencies are each different, are connected to the contact body, the ultrasonic vibrations that are applied to the contact body by the first ultrasonic vibrators are compressional waves, the first ultrasonic vibrators are connected to the contact body from different direction, such that the ultrasonic vibrations by the first ultrasonic vibrators are applied in different directions during the leveling, and lengths of the contact body in the wave directions of the ultrasonic vibrations applied by the first ultrasonic vibrators are set as natural number multiples of the wavelengths of the ultrasonic vibrations. 3. A method of bonding a semiconductor chip, comprising: positioning and placing in contact bumps or pads formed on one side of a semiconductor chip and pads or bumps formed on a mounting surface of a substrate, which correspond to the bumps or pads of the semiconductor chip; contacting a contact body, which is connected to a first ultrasonic vibrator capable of vibrating at a first predetermined frequency and a second ultrasonic vibrator capable of vibrating at a second predetermined frequency, to the semiconductor chip; applying ultrasonic vibration of a first predetermined frequency, by vibrating the first ultrasonic vibrator, to the semiconductor chip to make the bumps or pads of the semiconductor chip and the pads or bumps of a substrate rub against each other to level the bumps; and applying ultrasonic vibration of a second predetermined frequency, by vibrating the second ultrasonic vibrator, that differs from the first predetermined frequency, to the semiconductor chip, via the contact body, to simultaneously bond the bumps and the pads of the semiconductor chip and the substrate, wherein in the applying ultrasonic vibration of a second predetermined frequency, ultrasonic vibrations of a plurality of different frequencies are applied to the semiconductor chip as the ultrasonic vibration of the second predetermined frequency, a plurality of second ultrasonic vibrators, whose vibration frequencies are each different, are connected to the contact body, the ultrasonic vibrations that are applied to the contact body by the second ultrasonic vibrators are compressional waves, the second ultrasonic vibrators are connected to the contact body from different direction, such that the ultrasonic vibrations by the second ultrasonic vibrators are applied in different directions during the bonding, and lengths of the contact body in the wave directions of the ultrasonic vibrations applied by the second ultrasonic vibrators are set as natural number multiples of the wavelengths of the ultrasonic vibrations.
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이 특허에 인용된 특허 (2)
Sakaguchi, Koichi; Domi, Shinjiro; Nakagaki, Shigeki; Suganuma, Katsuaki, Method of manufacturing glass panel and glasspanel manufactured by the method.
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