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A blade probe card includes a plurality of blades that each includes a first end connected to a printed circuit board and a second end. A probe member is attached to the second end of each blade and extends outward to make contact with a device under test. A ground member is attached to the second e

A blade probe card includes a plurality of blades that each includes a first end connected to a printed circuit board and a second end. A probe member is attached to the second end of each blade and extends outward to make contact with a device under test. A ground member is attached to the second end of each blade. The blade probe card also includes a common ground member that is separate from the printed circuit board and coupled to the ground member of each blade. Each blade may also include a first conductive signal trace and two or more conductive ground traces formed on a surface of each blade. The first conductive signal trace electrically connects the probe member to a contact on the printed circuit board. The two or more conductive ground traces are adjacent to the conductive signal trace and reduce crosstalk between the blades.

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What is claimed is: 1. A blade probe card comprising: a plurality of blades, wherein each blade from the plurality of blades includes: a first end connected to a printed circuit board, a second end, a probe member attached to the second end and extending therefrom, wherein the probe member is confi

What is claimed is: 1. A blade probe card comprising: a plurality of blades, wherein each blade from the plurality of blades includes: a first end connected to a printed circuit board, a second end, a probe member attached to the second end and extending therefrom, wherein the probe member is configured to make contact with a device under test, and a ground member attached to the second end and extending therefrom; and a common ground member that is separate from the printed circuit board and coupled to the ground member of each blade from the plurality of blades. 2. The blade probe card as recited in claim 1, wherein for each blade from the plurality of blades, the probe member and the ground member are substantially parallel to each other. 3. The blade probe card as recited in claim 1, wherein for each blade from the plurality of blades includes a top edge and a bottom edge and the probe member and the ground member are mounted to the top edge and the bottom edge. 4. The blade probe card as recited in claim 3, wherein for each blade from the plurality of blades, the probe member and the ground member are substantially parallel to each other. 5. The blade probe card as recited in claim 3, wherein for each blade from the plurality of blades, the probe member and the ground member are in substantial vertical alignment to each other. 6. The blade probe card as recited in claim 1, wherein for each blade from the plurality of blades, the probe member and the ground member are mounted on opposite sides of the blade. 7. The blade probe card as recited in claim 6, wherein for each blade from the plurality of blades, the probe member and the ground member are mounted on opposite sides of the blade at different angles to allow the probe member to contact the device under test and to allow the ground member to contact the common ground member. 8. The blade probe card as recited in claim 1, wherein the common ground member is a ground ring. 9. The blade probe card as recited in claim 1, wherein the common ground member is a ground plane. 10. The blade probe card as recited in claim 1, wherein for each blade from the plurality of blades, the blade includes a top edge and a bottom edge, the ground member includes a u-shaped edge for mounting to the top edge and the probe member is mounted to the bottom edge. 11. The blade probe card as recited in claim 1, wherein for each blade from the plurality of blades, the probe member is attached to the second end of the blade at an angle to allow the probe member to contact the common ground member. 12. The blade probe card as recited in claim 1, wherein each blade from the plurality of blades has a surface that includes: a first conductive signal trace formed on the surface and that electrically connects the probe member to a contact on the printed circuit board, and two or more conductive ground traces formed on the surface and that are adjacent to and substantially surround the first conductive signal trace to reduce crosstalk between the plurality of blades. 13. The blade probe card as recited in claim 1, wherein the two or more conductive ground traces are substantially parallel to the first conductive signal trace. 14. The blade probe card as recited in claim 1, wherein: the plurality of blades is a plurality of ceramic blades, and the first conductive signal trace is a metallic signal trace and the two or more conductive ground traces are two or more metallic ground traces. 15. A blade probe card comprising: a plurality of blades, wherein each blade from the plurality of blades has a surface that includes: a first conductive signal trace formed on the surface and that electrically connects the probe member to a contact on the printed circuit board, and two or more conductive ground traces formed on the surface and that are adjacent to and substantially surround the first conductive signal trace to reduce crosstalk between the plurality of blades. 16. The blade probe card as recited in claim 15, wherein: each blade from the plurality of blades further includes: a first end connected to a printed circuit board, a second end, a probe member attached to the second end and extending therefrom, wherein the probe member is configured to make contact with a device under test, and a ground member attached to the second end and extending therefrom; and the blade probe card further includes a common ground member that is separate from the printed circuit board and coupled to the ground member of each blade from the plurality of blades. 17. The blade probe card as recited in claim 15, wherein: the plurality of blades is a plurality of ceramic blades, and the first conductive signal trace is a metallic signal trace and the two or more conductive ground traces are two or more metallic ground traces.