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Certain exemplary embodiments comprise a system that comprises an application specific integrated circuit configured to provide an output signal. The output signal can be configured to trip a device in an electrical circuit responsive to a detected fault. The application specific integrated circuit

Certain exemplary embodiments comprise a system that comprises an application specific integrated circuit configured to provide an output signal. The output signal can be configured to trip a device in an electrical circuit responsive to a detected fault. The application specific integrated circuit can comprise a temperature sensor. The application specific integrated circuit can be configured to correct at least one measured electrical value responsive to a temperature measured by the temperature sensor.

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What is claimed is: 1. A system comprising: an application specific integrated circuit configured to provide an output signal, said output signal configured to trip a device in an electrical circuit responsive to a detected fault, said application specific integrated circuit comprising: an on-chip

What is claimed is: 1. A system comprising: an application specific integrated circuit configured to provide an output signal, said output signal configured to trip a device in an electrical circuit responsive to a detected fault, said application specific integrated circuit comprising: an on-chip linear temperature sensor, said application specific integrated circuit configured to correct at least one measured electrical value responsive to a temperature measured by said on-chip linear temperature sensor; and a level and timing control circuit configured to avoid nuisance trips caused by noise in a received signal from said electrical circuit, said level and timing control circuit configured to compare an amplitude of said received signal to a first predetermined threshold, said level and timing control circuit configured to compare a duration of said received signal to a second predetermined threshold. 2. The system of claim 1, said application specific integrated circuit further comprising: a power up reset circuit configured to avoid nuisance trips during a system power up. 3. The system of claim 1, said application specific integrated circuit further comprising: a simulation circuit configured to simulate a signal indicative of an arc fault to an input of said application specific integrated circuit, said input generated responsive to an action of a user. 4. The system of claim 1, said application specific integrated circuit further comprising: an oscillator circuit configured to control a simulated waveform frequency of a simulation circuit. 5. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to receive an input for a ground fault. 6. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to control a gain of a circuit configured to receive a ground fault input signal. 7. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to control a time delay associated with a ground fault input signal. 8. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to control a status of a silicon-controlled rectifier. 9. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to control an arc fault integration. 10. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to phase-shift an arc fault signal. 11. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to control a gain of a circuit configured to receive an input for an arc fault. 12. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to control an arc fault signal amplitude. 13. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to receive an input from a neutral line current sensor. 14. The system of claim 1, said application specific integrated circuit further comprising: a circuit configured to receive an arc fault input signal. 15. The system of claim 1, said application specific integrated circuit further comprising: a control circuit configured to react rapidly to a strong arc fault. 16. The system of claim 1, said application specific integrated circuit further comprising: a control circuit configured to react rapidly to a ground fault. 17. The system of claim 1, said application specific integrated circuit further comprising: a voltage regulator configured to provide a voltage output from said application specific integrated circuit. 18. The system of claim 1, further comprising: a power supply. 19. The system of claim 1, further comprising: a mechanism configured to trip said device in said electrical circuit. 20. The system of claim 1, further comprising: a sensor configured to measure a neutral current in said electrical circuit. 21. The system of claim 1, further comprising: a sensor configured to measure a differential current in said electrical circuit. 22. A method comprising: producing an application specific integrated circuit configured to provide an output signal, said output signal configured to trip a device in an electrical circuit responsive to a detected fault, said application specific integrated circuit comprising: an on-chip linear temperature sensor, said application specific integrated circuit configured to correct at least one measured electrical value responsive to a temperature measured by said on-chip linear temperature sensor; and a level and timing control circuit configured to avoid nuisance trips due to noise in a received signal from said electrical circuit, said level and timing control circuit configured to compare an amplitude of said received signal to a first predetermined threshold, said level and timing control circuit configured to compare a duration of said received signal to a second predetermined threshold. 23. An application specific integrated circuit comprising: an output circuit configured to provide an output signal, said output signal configured to trip a device in an electrical circuit responsive to a detected fault; an on-chip linear temperature sensor, said application specific integrated circuit configured to correct at least one measured electrical value responsive to a temperature measured by said on-chip linear temperature sensor; and a level and timing control circuit configured to avoid nuisance trips caused by noise in a received signal from said electrical circuit, said level and timing control circuit configured to compare an amplitude of said received signal to a first predetermined threshold, said level and timing control circuit configured to compare a duration of said received signal to a second predetermined threshold.