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System and method for automatically recovering video tools in a vision system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0978227 (2004-10-29)
등록번호 US-7454053 (2008-11-18)
발명자 / 주소
  • Bryll,Robert K.
  • Ariga,Kozo
출원인 / 주소
  • Mitutoyo Corporation
대리인 / 주소
    Christensen O'Connor Johnson Kindness PLLC
인용정보 피인용 횟수 : 67  인용 특허 : 8

초록

Methods and systems for automatically recovering a failed video inspection tool in a precision machine vision inspection system are described. A set of recovery instructions may be associated or merged with a video tool to allow the tool to automatically recover and proceed to provide an inspection

대표청구항

The embodiments of the invention of which an exclusive property or privilege is claimed are defined as follows: 1. A method for automatically recovering a failed video tool in a precision machine vision inspection system, wherein the video tool fails based on an initial set of feature inspection pa

이 특허에 인용된 특허 (8)

  1. Flickner Myron D. (San Jose CA) Hinkle Eric B. (Atlanta GA) Sanz Jorge L. C. (San Jose CA), Apparatus and method for computing the radon transform of digital images.
  2. Poleschinski Richard (Munich DEX) Gerhard Detlef (Munich DEX), Arrangement for illuminating and detecting parts in an image processing system.
  3. Yoshihara Takafumi (Hachioji JPX) Wada Toshiaki (Tama JPX), Automatic camera.
  4. Daugman, John G., Fast focus assessment system and method for imaging.
  5. Yamasaki Masafumi (Hachioji JPX) Toyofuku Toshiyuki (Hachioji JPX) Itoh Junichi (Hachioji JPX) Kodama Shinichi (Hino JPX), Focus detection apparatus using neural network means.
  6. Wasserman, Richard M., System and methods to determine the settings of multiple light sources in a vision system.
  7. Wasserman, Richard M.; Tessadro, Ana M., Systems and methods for adjusting lighting of a part based on a plurality of selected regions of an image of the part.
  8. Sampath, Meera; Nichols, Stephen J.; Richenderfer, Elizabeth A., Systems and methods for automated image quality based diagnostics and remediation of document processing systems.

이 특허를 인용한 특허 (67)

  1. Gladnick, Paul Gerard, Adaptable operating frequency of a variable focal length lens in an adjustable magnification optical system.
  2. Bryll, Robert Kamil; Delaney, Mark Lawrence, Autofocus system for a high speed periodically modulated variable focal length lens.
  3. Campbell, Shannon R., Autofocus video tool and method for precise dimensional inspection.
  4. Melikian, Simon; Falcone, Maximiliano A.; Cyrek, Joseph, Automated guidance and recognition system and method of the same.
  5. Bryll, Robert Kamil; Delaney, Mark Lawrence, Chromatic aberration correction in imaging system including variable focal length lens.
  6. Patzwald, Andrew Michael; Sesko, David William, Chromatic range sensor including dynamic intensity compensation function.
  7. Patzwald, Andrew Michael, Chromatic range sensor including high sensitivity measurement mode.
  8. Bryll, Robert K., Edge detection using structured illumination.
  9. Campbell, Shannon Roy; Delaney, Mark Lawrence, Edge location measurement correction for coaxial light images.
  10. Ding, Yuhua; Bryll, Robert Kamil; Delaney, Mark Lawrence; Nahum, Michael, Edge measurement video tool and interface including automatic parameter set alternatives.
  11. Ding, Yuhua; Delaney, Mark Lawrence; Nahum, Michael, Edge measurement video tool parameter-setting user interface.
  12. Bryll, Robert Kamil, Edge measurement video tool with robust edge discrimination margin.
  13. Bryll, Robert Kamil, Enhanced edge detection tool for edges of irregular surfaces.
  14. Blanford, Charles; Yu, Dahai; Saylor, Barry E., Enhanced video metrology tool.
  15. Gladnick, Paul Gerard, Extending a focus search range in an imaging system including a high speed variable focal length lens.
  16. Delaney, Mark Lawrence, Focus height repeatability improvement in a machine vision inspection system.
  17. Tseo, Eric Yeh-Wei; Yu, Dahai; Northrup, Ryan, GUI for programming step and repeat operations in a machine vision inspection system.
  18. Omi, Yasuo; Takagi, Ryo; Miyazaki, Osamu; Sugaya, Yoshiaki, Image analyzing system and method.
  19. Kurihara, Masaki, Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded.
  20. Compton, John T.; Hamilton, Jr., John F., Image sensor with improved light sensitivity.
  21. Compton, John T.; Hamilton, Jr., John F., Image sensor with improved light sensitivity.
  22. Compton, John T.; Hamilton, Jr., John F.; DeWeese, Thomas E., Image sensor with improved light sensitivity.
  23. Delaney, Mark Lawrence, Inspecting potentially interfering features in a machine vision system.
  24. Bryll, Robert Kamil, Machine vision inspection system and method for obtaining an image with an extended depth of field.
  25. Emtman, Casey Edward; Bryll, Robert Kamil, Machine vision inspection system and method for obtaining an image with an extended depth of field.
  26. Gladnick, Paul Gerard, Machine vision inspection system and method for performing high-speed focus height measurement operations.
  27. Delaney, Mark Lawrence, Machine vision inspection system comprising two cameras having a rotational offset.
  28. Delaney, Mark; Saylor, Barry, Machine vision system editing environment for a part program in which a continuous stream of image acquisition operations are performed during a run mode.
  29. Delaney, Mark; Saylor, Barry E., Machine vision system editing environment for a part program in which a continuous stream of image acquisition operations are performed during a run mode.
  30. Northrup, Ryan; Ye, Andy; Haryadi, Iman, Machine vision system program editing environment including operating context aware copy and paste feature.
  31. Saylor, Barry; Yu, Dahai; Northrup, Ryan; Cho, Gyokubu; Takada, Akira, Machine vision system program editing environment including real time context generation features.
  32. Saylor, Barry; Northrup, Ryan; Takada, Akira; Ariga, Kozo, Machine vision system program editing environment including synchronized user interface features.
  33. Marks, Tim K.; Veeraraghavan, Ashok; Taguchi, Yuichi, Method and system for segmenting moving objects from images using foreground extraction.
  34. Bryll, Robert Kamil; Ding, Yuhua, Method for improving repeatability in edge location results of a machine vision inspection system.
  35. Emtman, Casey Edward; Xie, Yong, Method for operating a dual beam chromatic point sensor system for simultaneously measuring two surface regions.
  36. Bryll, Robert Kamil, Method for programming a three-dimensional workpiece scan path for a metrology system.
  37. Nahum, Michael; Delaney, Mark Lawrence, Method utilizing image correlation to determine position measurements in a machine vision system.
  38. Segall, Christopher A., Methods and systems for estimation of compression noise.
  39. Segall, Christopher A., Methods and systems for estimation of compression noise.
  40. Segall, Christopher A., Methods and systems for image enhancement and estimation of compression noise.
  41. Segall, Christopher A., Methods and systems for noise reduction and image enhancement.
  42. Segall, Christopher A., Methods and systems for noise reduction and image enhancement involving selection of noise-control parameter.
  43. Bryll, Robert Kamil, Multi-level image focus using a tunable lens in a machine vision inspection system.
  44. Emtman, Casey Edward; Xie, Yong, Multiple measuring point configuration for a chromatic point sensor.
  45. Bryll, Robert K.; Delaney, Mark L., Optical aberration correction for machine vision inspection systems.
  46. Bryll, Robert K.; Delaney, Mark L., Optical aberration correction for machine vision inspection systems.
  47. Bryll, Robert Kamil, Optical aberration correction for machine vision inspection systems.
  48. Bryll, Robert Kamil, Phase difference calibration in a variable focal length lens system.
  49. Bryll, Robert Kamil; Campbell, Shannon Roy, Points from focus operations using multiple light settings in a machine vision system.
  50. Delaney, Mark Lawrence, Precision solder resist registration inspection method.
  51. Hamilton, Jr., John F.; Compton, John T., Processing color and panchromatic pixels.
  52. Hamilton, Jr., John F.; Compton, John T., Processing color and panchromatic pixels.
  53. Pillman, Bruce H.; O'Brien, Michele; Hamilton, Jr., John F.; Enge, Amy D.; DeWeese, Thomas E., Producing low resolution images.
  54. Enge, Amy D.; Compton, John T.; Pillman, Bruce H., Providing multiple video signals from single sensor.
  55. Atherton, Kim, Remote accessory for generating customized and synchronized reference notes for a programmable metrology system.
  56. Freerksen, Isaiah; Gladnick, Paul Gerard, Stabilizing operation of a high speed variable focal length tunable acoustic gradient lens in an imaging system.
  57. De Nooij, Frans; Gladnick, Paul Gerard, Structured illumination microscopy optical arrangement including projection artifact supression element.
  58. Northrup, Ryan; Yu, Dahai; Sonobe, Hirato, System and method for controlling a tracking autofocus (TAF) sensor in a machine vision inspection system.
  59. Bryll, Robert K.; Nahum, Michael, System and method for fast approximate focus.
  60. Gladnick, Paul Gerard, System and method for obtaining images with offset utilized for enhanced edge resolution.
  61. Northrup, Ryan; Yu, Dahai, System and method utilizing an editing initialization block in a part program editing environment in a machine vision system.
  62. Northrup, Ryan; Saylor, Barry, System, GUI and method for editing step and repeat operation instructions in a machine vision inspection system.
  63. Gladnick, Paul Gerard; Bryll, Robert Kamil, Variable focal length imaging system.
  64. Nahum, Michael; Bryll, Robert Kamil; Gladnick, Paul Gerard, Variable focal length lens system including a focus state reference subsystem.
  65. Gladnick, Paul Gerard; Atherton, Kim, Variable focal length lens system with focus monitoring and control.
  66. Bryll, Robert Kamil; Nagahama, Tatsuya, Variable focal length lens system with multi-level extended depth of field image processing.
  67. Campbell, Shannon R., Weighting surface fit points based on focus peak uncertainty.
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