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Projection exposure apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G02B-017/00
출원번호 US-0657925 (2007-01-25)
등록번호 US-7463422 (2008-12-09)
발명자 / 주소
  • Kamenow,Vladimir
  • Kraehmer,Daniel
  • Totzeck,Michael
  • Gruner,Toralf
  • Dodoc,Aurelian
  • Shafer,David
  • Ulrich,Wilhelm
  • von Buenau,Rudolf
  • Mann,Hans Juergen
  • Epple,Alexander
출원인 / 주소
  • Carl Zeiss SMT AG
대리인 / 주소
    Fish & Richardson P.C.
인용정보 피인용 횟수 : 16  인용 특허 : 104

초록

A method of determining materials of lenses contained in an optical system of a projection exposure apparatus is described. First, for each lens of a plurality of the lenses, a susceptibility factor KLT/LH is determined. This factor is a measure of the susceptibility of the respective lens to deteri

대표청구항

The invention claimed is: 1. An optical system of a projection exposure apparatus, comprising at least one lens that is made of a non-crystalline material and at least one lens that is made of a birefringent crystal, wherein all lenses made of a birefringent crystal have a higher susceptibility fac

이 특허에 인용된 특허 (104)

  1. Shafer, David R., 6-mirror projection objective with few lenses.
  2. Mann,Hans J?rgen; Ulrich,Wilhelm; Seitz,G?nther, 8-mirror microlithography projection objective.
  3. Sweatt William C., Apparatus and method for generating partially coherent illumination for photolithography.
  4. Jewell Tanya E. (Bridgewater NJ) Rodgers J. Michael (Pasadena CA), Apparatus for semiconductor lithography.
  5. Shafer, David R.; Chuang, Yung-Ho, Broad band DUV, VUV long-working distance catadioptric imaging system.
  6. Shafer David R. ; Chuang Yung-Ho ; Tsai Bin-Ming B., Broad spectrum ultraviolet catadioptric imaging system.
  7. Okada Takashi (Osaka JPX), Camera system including catadioptric lens and catadioptric lens system used therein.
  8. Shafer David (Fairfield CT), Catadioptric imaging system.
  9. Yasuhiro Omura JP, Catadioptric imaging system and a projection exposure apparatus provided with said imaging system.
  10. Mercado Romeo I. (San Jose CA), Catadioptric imaging system with dioptric assembly of the petzval type.
  11. Tsunashima Teruyoshi,JPX, Catadioptric lens.
  12. Schuster Karl Heinz,DEX, Catadioptric microlithographic reduction objective.
  13. Hall John M. ; Barr Dallas N. ; Utano Richard, Catadioptric multi-functional optical assembly.
  14. Schuster, Karl Heinz, Catadioptric objective.
  15. Shafer, David R.; Herkommer, Alois; Schuster, Karl-Heinz; Furter, Gerd; von Bunau, Rudolf; Ulrich, Wilhelm, Catadioptric objective comprising two intermediate images.
  16. Williamson David M. (West Malvern GB2), Catadioptric optical reduction system with high numerical aperture.
  17. Takahashi Tomowaki,JPX ; Misawa Junichi,JPX, Catadioptric optical system.
  18. Suenaga,Yutaka; Miyashita,Tomohiro; Yamaguchi,Kotaro, Catadioptric optical system and exposure apparatus equipped with the same.
  19. Sturlesi Doron,ILX ; Peled Shimon,ILX, Catadioptric optics for staring array detector system.
  20. Hudyma,Russell, Catadioptric projection system for 157 nm lithography.
  21. Haseltine Eric C. (Manhattan Beach CA) Jones Helene H. (Culver City CA), Catadioptric projector, catadioptric projection system and process.
  22. Epple,Alexander; Beierl,Helmut, Catadioptric reduction lens.
  23. Ulrich,Wilhelm; Shafer,David R.; Epple,Alexander; Beierl,Helmut; Dodoc,Aurelian, Catadioptric reduction lens.
  24. Takahashi Tomowaki,JPX, Catadioptric reduction projection optical system and exposure apparatus having the same.
  25. Takahashi,Tomowaki, Catadioptric system and exposure device having this system.
  26. Iizuka Yutaka (Fujisawa JPX), Catadioptric telephoto lens.
  27. Yamada ; Yu, Catadioptric wide-angle lens system for reproduction.
  28. Takahashi Tomowaki,JPX ; Suenaga Yutaka,JPX, Catoptric reduction projection optical system and exposure apparatus and method using same.
  29. Takahashi Tomowaki,JPX, Catoptric reduction projection optical system and projection exposure apparatus and method using same.
  30. Mitchell,Thomas A., Compact fast catadioptric imager.
  31. Russell M. Hudyma, Compact multi-bounce projection system for extreme ultraviolet projection lithography.
  32. Sweatt William C. ; Kubiak Glenn D., Condenser for extreme-UV lithography with discharge source.
  33. Hoffman, Jeffrey M.; McGuire, James P., Correction of birefringence in cubic crystalline optical systems.
  34. Elliott David J. (Wayland MA) Shafer David (Fairfield CT), Deep ultraviolet microlithography system.
  35. Shima, Shinichi, Exposure apparatus, method of manufacturing semiconductor devices, semiconductor manufacturing plant, method of maintaining exposure apparatus, and position detector.
  36. Suzuki Kazuaki,JPX, Exposure method and apparatus.
  37. Tomimatsu Kei,JPX, Fluid immersion microscope objective lens.
  38. Williamson David M.,GBX, Four mirror EUV projection optics.
  39. Williamson David M.,GBX, High numerical aperture ring field optical reduction system.
  40. Hudyma Russell, High numerical aperture ring field projection system for extreme ultraviolet lithography.
  41. Hudyma Russell ; Shafer David R., High numerical aperture ring field projection system for extreme ultraviolet lithography.
  42. Canzek Ludvik (Unterentfelden CHX), High speed catadioptric objective lens system.
  43. Canzek Ludvik (Quellmattstrasse 3 5035 Unterentfelden CHX), High speed catadioptric system.
  44. Phillips ; Jr. Anthony R. (Fairport NY) Michaloski Paul F. (Rochester NY), Imaging system for deep ultraviolet lithography.
  45. Sigler Robert D. (Cupertino CA), Infrared catadioptric zoom relay telescope.
  46. Beach Allan David,NZX, Lens system.
  47. Bruning John H. (Pittsford NY) Phillips ; Jr. Anthony R. (Fairport NY) Shafer David R. (Fairfield CT) White Alan D. (Berkeley Heights NJ), Lens system for X-ray projection lithography camera.
  48. Gronau,Ralph; Scheller,Tobias; Reviol,Ralf; Neu,Andreas, Method for regulating a predetermined modifiable brake pressure.
  49. Shafer, David R., Microlithographic reduction projection catadioptric objective.
  50. Shafer, David R.; Hudyma, Russell; Ulrich, Wilhelm, Microlithographic reduction projection catadioptric objective.
  51. Shafer,David R.; Hudyma,Russell; Ulrich,Wilhelm, Microlithographic reduction projection catadioptric objective.
  52. Udo Dinger DE, Microlithography reduction objective and projection exposure apparatus.
  53. Friest, Christoph; Eichhorn, Georg; Seifert, Meinolf; Dopheide, Ralf, Multilayer molded element.
  54. Foo Leslie D. (San Jose CA), Multiple mirror catadioptric optical system.
  55. Kr?hmer,Daniel; Gruner,Toralf; Ulrich,Wilhelm; Enkisch,Birgit; Gerhard,Michael; Brunotte,Martin; Wagner,Christian; Kaiser,Winfried; Maul,Manfred; Zaczek,Christof, Objective with fluoride crystal lenses.
  56. Gerhard, Michael; Krahmer, Daniel, Objective with lenses made of a crystalline material.
  57. Takahashi Tomowaki (Yokohama JPX), Optical apparatus.
  58. Unno,Yasuyuki; Takeuchi,Seiji, Optical element and manufacturing method thereof.
  59. Sakuma Shigeru,JPX ; Takano Shuuichi,JPX, Optical element made from fluoride single crystal, method for manufacturing optical element, method for calculating birefringence of optical element and method for determining direction of minimum bi.
  60. Kreuzer,Justin L., Optical reduction method with elimination of reticle diffraction induced bias.
  61. Kreuzer, Justin L., Optical reduction system with elimination of reticle diffraction induced bias.
  62. Kreuzer, Justin L., Optical reduction system with elimination of reticle diffraction induced bias.
  63. Hendriks,Bernardus Hendrikus Wilhelmus; Schleipen,Johannes Joseph Hubertina Barbara, Optical scanning device.
  64. Shiraishi, Naomasa, Optical system and exposure apparatus having the optical system.
  65. Owa, Soichi; Shiraishi, Naomasa; Tanaka, Issey; Omura, Yasuhiro, Optical system and exposure apparatus provided with the optical system.
  66. Kraehmer,Daniel; Ulrich,Wilhelm, Optical system and method for the production of micro-structured components by microlithography.
  67. Epple,Alexander; Gruner,Toralf; Singer,Wolfgang, Optical system for ultraviolet light.
  68. Freeman Michael Harold (Denbigh GB7), Optical systems, telescopes and binoculars.
  69. Omura, Yasuhiro, PROJECTION OPTICAL SYSTEM, PROJECTION EXPOSURE APPARATUS HAVING THE PROJECTION OPTICAL SYSTEM, PROJECTION METHOD THEREOF, EXPOSURE METHOD THEREOF AND FABRICATING METHOD FOR FABRICATING A DEVICE USING.
  70. Tabarelli Werner (Schlossstr. 5 Vaduz LIX FL-9490) Lbach Ernst W. (Tonagass 374 Eschen LIX FL-9492), Photolithographic method for the manufacture of integrated circuits.
  71. Nishi Kenji (Kawasaki JPX), Projection exposure apparatus.
  72. Omura Yasuhiro,JPX ; Takahashi Tetsuo,JPX ; Ikeda Masatoshi,JPX ; Li Shiwen,JPX ; Ichihara Yutaka,JPX, Projection exposure apparatus and method.
  73. Schuster, Karl-Heinz; Ulrich, Wilhelm; Gruner, Toralf; Kraehmer, Daniel; Singer, Wolfgang; Epple, Alexander; Beierl, Helmut; Garreis, Reiner, Projection exposure system.
  74. Shafer David Ross (56 Drake La. Fairfield CT 06438), Projection lithography system and method using all-reflective optical elements.
  75. Mann,Hans Juergen; Hudyma,Russell; Epple,Alexander, Projection objectives including a plurality of mirrors with lenses ahead of mirror M3.
  76. Mann,Hans Jurgen; Hudyma,Russell; Epple,Alexander, Projection objectives including a plurality of mirrors with lenses ahead of mirror M3.
  77. Sato Takeo (Kawasaki JPX) Araki Nobuhiro (Yokohama JPX) Kawata Koichi (Tokyo JPX) Nomura Noboru (Kyoto JPX) Ueno Atsushi (Osaka JPX) Yoshida Shotaro (Sendai JPX), Projection optical system.
  78. Omura, Yasuhiro; Shiraishi, Naomasa; Tanaka, Issey; Owa, Soichi; Ozawa, Toshihiko; Niisaka, Shunsuke, Projection optical system and an exposure apparatus with the projection optical system.
  79. Kato, Takashi; Terasawa, Chiaki; Ishii, Hiroyuki, Projection optical system and projection exposure apparatus.
  80. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  81. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  82. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  83. Terasawa,Chiaki; Ishii,Hiroyuki; Kato,Takashi, Projection optical system and projection exposure apparatus.
  84. Sato Takeo (Sagamihara JPX) Araki Nobuhiro (Yokohama JPX) Kawata Koichi (Tama JPX) Nomura Noboru (Kyoto JPX) Ueno Atushi (Hirakata JPX) Yoshida Shotaro (Sendai JPX), Projection optical system for use in precise copy.
  85. Omura, Yasuhiro, Projection optical system, exposure apparatus and exposure method.
  86. Omura,Yasuhiro, Projection optical system, exposure apparatus, and exposure method.
  87. Takahashi, Tetsuo; Nishikawa, Jin; Omura, Yasuhiro, Projection optical system, manufacturing method thereof, and projection exposure apparatus.
  88. Itoh Takayuki (Saitama JPX), Reflecting telephoto zoom lens system.
  89. Hirose Ryusho (Kawasaki JPX), Reflection and refraction optical system.
  90. Matsumoto Kohichi (Kita JPX), Reflection type reduction projection optical system.
  91. Viswanathan Vriddhachalam K. (Los Alamos NM) Newnam Brian E. (Los Alamos NM), Reflective optical imaging system for extreme ultraviolet wavelengths.
  92. Shafer David R. (Fairfield CT), Reflective projection system comprising four spherical mirrors.
  93. Mashima Kiyohito,JPX, Reflective reduction imaging optical system for X-ray lithography.
  94. Rostalski,Hans Juergen; Dodoc,Aurelian; Epple,Alexander; Beierl,Helmut, Refractive projection objective for immersion lithography.
  95. Offner Abe (Darien CT), Restricted off-axis field optical system.
  96. Shafer David R. (Fairfield CT), Restrictive off-axis field optical system.
  97. Shafer David R. (Fairfield CT), Ring field projection system.
  98. Sweatt William C., Ringfield lithographic camera.
  99. Jewell Tanya E. (Bridgewater NJ) Thompson Kevin (La Canada CA), Ringfield lithography.
  100. Friedman Irwin (Weston CT), Single mirror projection optical system.
  101. Markle David A. (Norwalk CT) Offner Abe (Darien CT), System for illuminating an annular field.
  102. Shafer David Ross ; Chuang Yung-Ho ; Tsai Bin-Ming Benjamin, Ultra-broadband UV microscope imaging system with wide range zoom capability.
  103. Bruning John H. (Pittsford NY) Phillips ; Jr. Anthony R. (Fairport NY) Shafer David R. (Fairfield CT) White Alan D. (Berkeley Heights NJ), X-ray projection lithography camera.
  104. Suzuki Masayuki (Atsugi JPX) Mochizuki Noritaka (Yokohama JPX) Minami Setsuo (Kawasaki JPX) Ogura Shigetaro (Tama JPX) Fukuda Yasuaki (Machida JPX) Watanabe Yutaka (Atsugi JPX) Kawai Yasuo (Shizuoka , X-ray reduction projection exposure system of reflection type.

이 특허를 인용한 특허 (16)

  1. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Buenau, Rudolf Von; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  2. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Buenau, Rudolf Von; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  3. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Buenau, Rudolf Von; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  4. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  5. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  6. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  7. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  8. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective.
  9. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  10. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  11. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  12. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  13. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  14. Epple, Alexander; Ulrich, Wilhelm; Dodoc, Aurelian; Mann, Hans-Juergen; Shafer, David, Catadioptric projection objective with mirror group.
  15. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; von Buenau, Rudolf Murai; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective with parallel, offset optical axes.
  16. Shafer, David R.; Ulrich, Wilhelm; Dodoc, Aurelian; von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Immersion catadioptric projection objective having two intermediate images.
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