초록 ▼

The present invention describes use of electron beam evaporation method for fabrication of group III-nitride thin films. The fabricated thin films found to have desirable crystalline and optical properties. These films and their properties could be used for protecting electronic devices under space

The present invention describes use of electron beam evaporation method for fabrication of group III-nitride thin films. The fabricated thin films found to have desirable crystalline and optical properties. These films and their properties could be used for protecting electronic devices under space radiation applications such as solar cell operating in space.

대표청구항 ▼

What is claimed is: 1. A method for fabricating coatings and thin films of group III metal-nitride materials using electron beam evaporation, the method comprising the steps of: positioning at least one source of at least one group III metal in a processing chamber; loading a substrate in said proc

What is claimed is: 1. A method for fabricating coatings and thin films of group III metal-nitride materials using electron beam evaporation, the method comprising the steps of: positioning at least one source of at least one group III metal in a processing chamber; loading a substrate in said processing chamber; elevating a temperature of said substrate to a selected temperature; filling said processing chamber with a nitridizing reaction gas at a selected pressure; directing an electron beam of a predetermined electron beam power level to said at least one source of the at least one group III metal; and controlling the electron beam power to be in the range of 6-10 kW to thereby produce a vapor of said at least one group III metal at a predetermined evaporation rate, said substrate temperature, said nitridizing reaction gas pressure and said deposition rate being selected to react said group III metal vapor with said nitridizing reaction gas during said at least one group III metal transport to said substrate to thereby deposit molecules of at least one group III metal-N on a surface of said substrate at a predetermined deposition rate and to optimize quality of resulting group III metal-N coatings and thin films; wherein said group III metal-N coatings and thin films are selected from a group consisting of GaN, InN, AlGaN, and InGaN. 2. The method as defined in claim 1, wherein said at least one source of the at least one group III metal includes a plurality of said sources, each source containing said at least one group III metal selected form a group consisting of Al, Ga, In, and wherein a compositional group III metal-nitride semiconductor is grown by evaporation of said group III metals from said plurality of said sources. 3. The method as defined in claim 2, wherein the composition of the group III nitride semiconductor is controlled by controlling the evaporation rate of each said group III metal. 4. The method as defined in claim 1, wherein said at least one source of the at least one group III metal includes an alloy of group III metals selected from a group consisting of AlGa, AlIn, GaIn, and combinations thereof, and wherein a compositional group III metal-nitride semiconductor is grown by evaporation of said alloy of group III metals. 5. The method as defined in claim 4, wherein the composition of the group III metal-nitride semiconductor is determined by the composition of the alloy of group III metals in said at least one source. 6. The method as defined in claims 1, 2, 4, 3 or 5, wherein the step of loading a substrate includes loading a substrate includes space-based solar cells to thereby form said coating thereon as a radiation shield therefore. 7. The method as defined in claim 1, wherein the step of elevating a temperature of said substrate includes elevating the substrate temperature to be in the range of 400�� C.-800�� C. the step of filling said processing chamber with a nitridizing reaction gas includes pressurizing said nitridizing reaction gas to a pressure in the range of 10-1 Torr-10-8 Torr; and said predetermined deposition rate is in the range of 3-4 Å/s.