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Single wafer dryer and drying methods 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F26B-003/00
  • B08B-003/00
출원번호 UP-0054336 (2005-02-09)
등록번호 US-7513062 (2009-07-01)
발명자 / 주소
  • Achkire, Younes
  • Lerner, Alexander N
  • Govzman, Boris
  • Fishkin, Boris
  • Sugarman, Michael N
  • Mavliev, Rashid A
  • Fang, Haoquan
  • Li, Shijian
  • Shirazi, Guy E
  • Tang, Jianshe
출원인 / 주소
  • Applied Materials, Inc.
대리인 / 주소
    Dugan & Dugan
인용정보 피인용 횟수 : 10  인용 특허 : 91

초록

In a first aspect, a first method of drying a substrate is provided. The first method includes the steps of (1) lifting a substrate through an air/fluid interface at a first rate; (2) directing a drying vapor at the air/fluid interface during lifting of the substrate; and (3) while a portion of the

대표청구항

The invention claimed is: 1. A method of drying a substrate comprising: lifting a substrate through an air/fluid interface at a first rate; directing a drying vapor at the air/fluid interface during lifting of the substrate; and while a portion of the substrate remains in the air/fluid interface, r

이 특허에 인용된 특허 (91)

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이 특허를 인용한 특허 (10)

  1. Fishkin, Boris; Sherrard, Michael, Apparatus for cleaning and drying substrates.
  2. Zhang, John H., Drying apparatus with exhaust control cap for semiconductor wafers and associated methods.
  3. Hamamoto, Nobuo, Method for drying applied film and drying apparatus.
  4. Velazquez, Edwin; D'Ambra, Allen L.; Atkinson, Jim K., Methods and apparatus for marangoni substrate drying using a vapor knife manifold.
  5. Keigler, Arthur; Goodman, Daniel L.; Guarnaccia, David G., Parallel single substrate marangoni module.
  6. Keigler, Arthur; Fisher, Freeman; Goodman, Daniel L.; Haynes, Jonathan, Parallel single substrate processing system.
  7. Keigler, Arthur, Parallel single substrate processing system with alignment features on a process section frame.
  8. Stein, Nathan D.; Achkire, Younes; Franklin, Timothy J.; Svirchevski, Julia; Marohl, Dan A., Single wafer apparatus for drying semiconductor substrates using an inert gas air-knife.
  9. Achkire, Younes; Lerner, Alexander; Govzman, Boris T.; Fishkin, Boris; Sugarman, Michael; Mavleiv, Rashid; Fang, Haoquan; Li, Shijian; Shirazi, Guy; Tang, Jianshe, Single wafer dryer and drying methods.
  10. Tanaka, Hiroshi; Nakao, Hidetoshi; Shindo, Naoki; Yamashita, Atushi; Hirayama, Tsukasa; Tsurusaki, Kotaro, Substrate drying processing apparatus, method, and program recording medium.
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