IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0269140
(2005-11-08)
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등록번호 |
US-7517712
(2009-07-01)
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발명자
/ 주소 |
|
출원인 / 주소 |
- Electronics Packaging Solutions, Inc.
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
19 인용 특허 :
139 |
초록
▼
A method for manufacturing a hermetically sealed micro-device package encapsulating a micro-device. The package includes a transparent window allowing light to pass into and out of a cavity containing the micro-device. A first frame-attachment area is prepared on semiconductor substrate having a mic
A method for manufacturing a hermetically sealed micro-device package encapsulating a micro-device. The package includes a transparent window allowing light to pass into and out of a cavity containing the micro-device. A first frame-attachment area is prepared on semiconductor substrate having a micro-device operably disposed thereupon, the first frame-attachment area having a plan that circumscribes the micro-device. A second frame-attachment area is prepared on a sheet of transparent material, the second frame-attachment area having a plan that circumscribes a window aperture portion of the sheet. A frame/spacer is positioned between the semiconductor substrate and the sheet, the frame/spacer including a continuous sidewall having a plan on one side substantially corresponding to, and substantially in register with, the plan of the first frame-attachment area, having a plan on the opposite side substantially corresponding to, and substantially in register with, the plan of the second frame-attachment area, and having a height that exceeds the height of the micro-device. Next the substrate, frame/spacer and window are bonded together to form a hermetically sealed package encapsulating the micro-device in a cavity below the window aperture portion of the transparent sheet.
대표청구항
▼
What is claimed is: 1. A method for manufacturing a hermetically sealed micro-device package encapsulating a micro-device and including a transparent portion, the method comprising the following steps: preparing, on a semiconductor substrate having a micro-device operably disposed thereupon, a firs
What is claimed is: 1. A method for manufacturing a hermetically sealed micro-device package encapsulating a micro-device and including a transparent portion, the method comprising the following steps: preparing, on a semiconductor substrate having a micro-device operably disposed thereupon, a first frame-attachment area; preparing, on a sheet of transparent material, a second frame-attachment area; positioning, between the semiconductor substrate and the transparent sheet, a separate frame/spacer that is formed independently from both the semiconductor substrate and the sheet of transparent material, the frame/spacer including a sidewall having one side substantially in register with the first frame-attachment area and having the opposite side substantially in register with the second frame-attachment area; and bonding the substrate, frame/spacer and transparent sheet together to form a hermetically sealed package encapsulating the micro-device in a cavity below the sheet. 2. A method in accordance with claim 1, wherein the semiconductor substrate is substantially formed of a material selected from one of silicon (Si) and gallium arsenide (GaAs). 3. A method in accordance with claim 1, wherein the step of preparing the first frame-attachment area comprises depositing metallic layers onto the semiconductor substrate. 4. A method in accordance with claim 1, wherein during the step of bonding, the temperature of the window aperture portion of the sheet remains below the glass transition temperature (TG) of the transparent material. 5. A method in accordance with claim 1, wherein the step of preparing the second frame-attachment area comprises depositing metallic layers onto the transparent sheet. 6. A method in accordance with claim 1, wherein the step of bonding further comprises: forming a bond between the frame/spacer and the semiconductor substrate; forming another bond between the frame/spacer and the transparent sheet; and wherein at least one of the bonds is formed by soldering. 7. A method in accordance with claim 6, wherein the step of soldering is performed using a solder formed of a material selected from one of a metal alloy and a solder glass. 8. A method in accordance with claim 1, wherein the step of bonding further comprises: forming a bond between the frame/spacer and the semiconductor substrate; forming another bond between the frame/spacer and the transparent sheet; and wherein at least one of the bonds is formed by diffusion bonding. 9. A method for manufacturing a hermetically sealed micro-device package encapsulating a micro-device and including a transparent portion, the method comprising the following steps: preparing on a semiconductor substrate having a micro-device operably disposed thereupon, a first frame-attachment area; preparing on a sheet of transparent material, a second frame-attachment area; positioning, between the semiconductor substrate and the transparent sheet, a frame/spacer including a sidewall having one side substantially in register with the first frame-attachment area and having the opposite side substantially in register with the second frame-attachment area; and bonding the substrate, frame/spacer and transparent sheet together to form a hermetically sealed package encapsulating the micro-device in a cavity below the sheet; wherein the step of bonding further comprises pressing the substrate and the sheet against the frame/spacer with sufficient force to produce a first predetermined contact pressure along a first junction region between the frame/spacer and the first frame-attachment area of the substrate and a second predetermined contact pressure along a second junction region between the frame/spacer and the second frame-attachment area of the sheet; heating the first junction region to produce a first predetermined temperature along the first junction region; heating the second junction region to produce a second predetermined temperature along the second junction region; maintaining the first predetermined contact pressure and the first predetermined temperature until a diffusion bond is formed between the frame/spacer and the substrate along the first junction region; and maintaining the second predetermined contact pressure and the second predetermined temperature until a diffusion bond is formed between the frame/spacer and sheet along the second junction region. 10. A method for simultaneously manufacturing multiple sealed micro-device packages, each package encapsulating at least one micro-device and including a transparent portion, the method comprising the following steps: preparing, on a semiconductor substrate having a plurality of micro-devices disposed thereupon, a first frame-attachment area that circumscribes a number of the micro-devices; preparing, on a sheet of transparent material, a second frame-attachment area; positioning, between the semiconductor substrate and the transparent sheet, a separate frame/spacer that is formed independently from both the semiconductor substrate and the sheet of transparent material, the frame/spacer including a plurality of sidewalls, the sidewalls collectively having one side substantially in register with the first frame-attachment area and an opposite side substantially in register with the second frame-attachment area; bonding the semiconductor substrate, frame/spacer and transparent sheet together to form a multi-package assembly having a plurality of sealed cavities separated from one another by the frame/spacer sidewalls, each of the cavities containing at least one of the micro-devices positioned below the sheet; and dividing the multi-package assembly into individual packages by parting completely through the substrate, frame/spacer sidewall and transparent sheet at locations between adjacent cavities; whereby each individual package will encapsulate at least one of the micro-devices in a sealed cavity. 11. A method in accordance with claim 10, wherein the semiconductor substrate is substantially formed of a material selected from one of silicon (Si) and gallium arsenide (GaAs). 12. A method in accordance with claim 10, wherein during the step of bonding, the temperature of the window aperture portions of the transparent sheet remains below the glass transition temperature (TG) of the transparent material. 13. A method in accordance with claim 10, wherein the step of preparing the first frame-attachment area comprises depositing metallic layers onto the semiconductor substrate. 14. A method in accordance with claim 10, wherein the step of preparing the second frame-attachment area comprises depositing metallic layers onto the transparent sheet. 15. A method in accordance with claim 10, wherein the step of bonding further comprises: forming a bond between the frame/spacer and the semiconductor substrate; forming another bond between the frame/spacer and the transparent sheet; and wherein at least one of the bonds is formed by soldering. 16. A method in accordance with claim 15, wherein the step of soldering is performed using a solder formed of a material selected from one of a metal alloy and a solder glass. 17. A method in accordance with claim 10, wherein the step of bonding further comprises: forming a bond between the frame/spacer and the semiconductor substrate; forming another bond between the frame/spacer and the transparent sheet; and wherein at least one of the bonds is formed by diffusion bonding. 18. A method for simultaneously manufacturing multiple sealed micro-device packages, each package encapsulating at least one micro-device and including a transparent portion, the method comprising the following steps: preparing, on a semiconductor substrate having a plurality of micro-devices disposed thereupon, a first frame-attachment area that circumscribes a number of the micro-devices; preparing, on a sheet of transparent material, a second frame-attachment area; positioning, between the semiconductor substrate and the transparent sheet, a frame/spacer including a plurality of sidewalls the sidewalls, collectively having one side substantially in register with the first frame-attachment area and an opposite side substantially in register with the second frame-attachment area; bonding the semiconductor substrate, frame/spacer and transparent sheet together to form a multi-package assembly having a plurality of sealed cavities separated from one another by the frame/spacer sidewalls, each of the cavities containing at least one of the micro-devices positioned below the sheet; and dividing the multi-package assembly into individual packages by parting completely through the substrate, frame/spacer sidewall and transparent sheet at locations between adjacent cavities; whereby each individual package will encapsulate at least one of the micro-devices in a sealed cavity wherein the step of bonding further comprises pressing the substrate and the sheet against the frame/spacer with sufficient force to produce a first predetermined contact pressure along a first junction region between the frame/spacer and the first frame-attachment area of the substrate and a second predetermined contact pressure along a second junction region between the frame/spacer and the second frame-attachment area of the sheet; heating the first junction region to produce a first predetermined temperature along the first junction region; heating the second junction region to produce a second predetermined temperature along the second junction region; maintaining the first predetermined contact pressure and the first predetermined temperature until a diffusion bond is formed between the frame/spacer and the substrate along the first junction region; and maintaining the second predetermined contact pressure and the second predetermined temperature until a diffusion bond is formed between the frame/spacer and sheet along the second junction region. 19. A method for simultaneously manufacturing multiple sealed micro-device packages directly on an undiced semiconductor production wafer, each package encapsulating at least one micro-device and including a transparent window, the method comprising the following steps: preparing, on an undiced semiconductor production wafer having a plurality of micro-devices disposed thereupon, a first frame-attachment area that circumscribes a number of the micro-devices; preparing, on a sheet of transparent material, a second frame-attachment area; positioning, between the wafer and the transparent sheet, a separate frame/spacer that is formed independently from both the semiconductor substrate and the sheet of transparent material, the frame/spacer including a plurality of sidewalls, the sidewalls collectively having one side substantially in register with the first frame-attachment area and an opposite side substantially in register with the second frame-attachment area; bonding the wafer, frame/spacer and transparent sheet together to form a multi-package assembly having a plurality of sealed cavities separated from one another by the frame/spacer sidewalls, each of the cavities containing at least one of the micro-devices positioned below the sheet; and dividing the multi-package assembly into individual packages by parting completely through the wafer, frame/spacer sidewall and transparent sheet at locations between adjacent cavities; whereby each individual package will encapsulate at least one of the micro-devices in a sealed cavity. 20. A method in accordance with claim 19, wherein the wafer is substantially formed of a material selected from one of silicon (Si) and gallium arsenide (GaAs).
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