Diagnostic methods and apparatus for directed energy applications
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01J-001/00
G01J-003/28
G01J-003/45
G01N-021/00
G01B-009/02
출원번호
UP-0498397
(2006-08-02)
등록번호
US-7538872
(2009-07-01)
발명자
/ 주소
Butler, Eugene W.
Otten, III, L. John
Erry, Gavin R. G.
인용정보
피인용 횟수 :
1인용 특허 :
19
초록▼
Determining relationships between one laser beam and an object onto which such beam is directed including: directing such beam onto the object; collecting radiation from the beam that is reflected back; spectrally discriminating the collected, reflected radiation from other collected radiation; gene
Determining relationships between one laser beam and an object onto which such beam is directed including: directing such beam onto the object; collecting radiation from the beam that is reflected back; spectrally discriminating the collected, reflected radiation from other collected radiation; generating an image of the collected beam radiation; and analyzing this image to determine the value of at least one parameter selected from: the diameter of the beam on the object; the position of the beam on the object; and beam quality on the object. The determined value(s) may be used to adjust parameter(s) of the beam. Additional steps include directing a second beam onto the object and collecting, spectrally discriminating, generating an image and analyzing it to determine the value of at least one parameter related to the second beam. The forgoing may also include utilizing the determined second value to adjust parameter(s) of the second beam.
대표청구항▼
We claim: 1. A method for determining one or more relationships between one or more laser beams and an object onto which such beam(s) is (are) directed, the method including the steps of: (a) directing a first laser beam having a first spectral signature onto the object; (b) collecting at least a p
We claim: 1. A method for determining one or more relationships between one or more laser beams and an object onto which such beam(s) is (are) directed, the method including the steps of: (a) directing a first laser beam having a first spectral signature onto the object; (b) collecting at least a portion of the radiation from the first laser beam that is reflected back by the object; (c) spectrally discriminating the radiation collected from the first laser beam from other collected radiation; (d) generating a spectral image of the discriminated radiation collected from the first laser beam; and (e) analyzing the spectral image of the radiation collected from the first laser beam to determine the value of at least one parameter selected from the group including the diameter of the first laser beam on the object, the position of the first laser beam on the object, and beam quality on the object. 2. The method of claim 1, further including the step of utilizing the at least one determined value to adjust one or more parameters of the first laser beam selected from the group including beam size, beam position on the object, beam energy, and beam quality on the object. 3. The method of claim 1, further including the steps of: (a) directing a second laser beam having a second spectral signature onto the object; (b) collecting at least a portion of the radiation from the second laser beam that is reflected back from the object; (c) processing the radiation collected from the second laser beam, the processing selected from the group including, (i) spectrally discriminating the radiation collected from the second laser beam from the radiation collected from the first laser beam, (ii) spacially discriminating the radiation collected from the second laser beam from radiation collected from the first laser beam, and (iii) both spectrally and spacially discriminating the radiation collected from the second laser beam from the radiation collected from the first laser beam; (d) generating a spectral image of the discriminated radiation collected from the second laser beam; and (e) analyzing the spectral image of the radiation collected from the second laser beam to determine the value of at least one parameter selected from the group including the diameter of the second laser beam on the object, the position of the second laser beam on the object, the position of the second laser beam relative to the first laser beam, and the quality of the second laser beam on the object. 4. The method of claim 3, wherein the processing of the collected radiation is limited to spectrally discriminating when the first and second spectral signatures are different and the first and second laser beams totally overlap on the object. 5. The method of claim 3, wherein the processing of the collected radiation is limited to spacially discriminating when the first and second spectral signatures are the same and the first and second laser beams are at least partially separated on the object. 6. The method of claim 3, wherein the processing of the collected radiation is both spectrally and spacially discriminating when the first and second spectral signatures are different and the first and second laser beams are at least partially separated on the object. 7. The method of claim 3, further including the step of utilizing the determined second value to adjust one or more parameters of the second laser beam selected from the group including the size of the second laser beam on the object, the position of the second laser beam on the object, the position of the second laser beam relative to the first laser beam, the energy of the second laser beam, and the quality of the second laser beam on the object. 8. The method of claim 3, wherein the power of the second laser beam is set at a level whereby the second laser beam can interact with the object. 9. The method of claim 8, further including the step of maintaining the second laser beam on the object for a period of time sufficient to cause an interaction with the object which interaction emits radiation from the object. 10. The method of claim 9, further including the steps of: (a) collecting a portion of the emitted radiation; (b) discriminating the collected emitted radiation from: (i) the radiation collected from the first laser beam, (ii) the radiation collected from the second laser beam, and (iii) all other collected radiation; (c) generating a spectral image of the discriminated collected emitted radiation; and (d) analyzing the image of the collected emitted radiation to determine at least some of its spectral characteristics. 11. The method as set forth in claim 10, further including the step of comparing the spectral characteristics of the collected emitted radiation to one or more stored, predetermined spectral signatures to determine if a particular event has occurred on or in relation to the object. 12. The method of claim 11, further including the step of adjusting one or more parameters of the second laser beam selected from the group including the size of the second laser beam on the object, the position of the second laser beam on the object, the position of the second laser beam relative to the first laser beam, the energy of the second laser beam, and the quality of the second laser beam on the object. 13. The method of claim 1, wherein the object emits radiation and further including the steps of: (a) collecting a portion of the emitted radiation; (b) discriminating the collected emitted radiation from: (i) the radiation collected from the first laser beam; and ii) all other collected radiation; (c) generating a spectral image of the discriminated collected emitted radiation; and (d) analyzing the image of the collected emitted radiation to determine at least some of its spectral characteristics.
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