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Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | UP-0456568 (2006-07-11) |
등록번호 | US-7601039 (2009-10-28) |
발명자 / 주소 |
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 | 피인용 횟수 : 33 인용 특허 : 642 |
An electronic interconnection apparatus can include a sacrificial substrate, which can include first trenches and second trenches formed in the sacrificial substrate. The first trenches can be disposed below a surface of the sacrificial substrate, and the second trenches can be disposed below the fi
An electronic interconnection apparatus can include a sacrificial substrate, which can include first trenches and second trenches formed in the sacrificial substrate. The first trenches can be disposed below a surface of the sacrificial substrate, and the second trenches can be disposed below the first trenches. First sidewalls can connect the surface and the first trenches, and the first sidewalls can be angled with respect to the surface and the first trenches. Second sidewalls can connect the first trenches and the second trenches, and the second sidewalls can be angled with respect to the first trenches and the second trenches. Spring contact elements can reside upon the sacrificial substrate. Each of the spring contact elements can have a first portion disposed on the surface, a second portion disposed on one of the first trenches, and a third portion disposed on one of the second trenches.
What is claimed is: 1. Electronic interconnection apparatus, comprising: a sacrificial substrate comprising: a surface, a plurality of first trenches formed in the sacrificial substrate and disposed below the surface, a plurality of first sidewalls each connecting the surface and one of the first t
What is claimed is: 1. Electronic interconnection apparatus, comprising: a sacrificial substrate comprising: a surface, a plurality of first trenches formed in the sacrificial substrate and disposed below the surface, a plurality of first sidewalls each connecting the surface and one of the first trenches, wherein each of the first sidewalls is angled with respect to the surface and the one of the first trenches, a plurality of second trenches formed in the sacrificial substrate and disposed below the first trenches, a plurality of second sidewalls each connecting one of the first trenches and one of the second trenches, wherein each of the second sidewalls is angled with respect to the one of the first trenches and the one of the second trenches; and a plurality of spring contact elements residing upon the sacrificial substrate, wherein each of the spring contact elements comprises a first portion disposed on the surface, a second portion disposed on one of the first trenches, and a third portion disposed on one of the second trenches. 2. Electronic interconnection apparatus, according to claim 1, wherein: the sacrificial substrate has a coefficient of thermal expansion that substantially equals a coefficient of thermal expansion of silicon. 3. Electronic interconnection apparatus, according to claim 1, wherein: the sacrificial substrate comprises a material selected from the group consisting of silicon, aluminum, copper, ceramic, copper-invar-copper and aluminum-alumina-aluminum. 4. Electronic interconnection apparatus, according to claim 1, wherein the sacrificial substrate further comprises a plurality of features each of which extends into one of the second trenches. 5. Electronic interconnection apparatus, according to claim 4, wherein each of the spring contact elements further comprises a topological feature on the third portion, the topological feature disposed in one of the features. 6. Electronic interconnection apparatus, according to claim 5, wherein, for each of the spring contact elements, the first portion comprises a first end portion, the third portion comprises a second end portion, and the second portion comprises a central portion between the first end portion and the second end portion. 7. Electronic interconnection apparatus, according to claim 1, wherein, for each of the spring contact elements, the first portion comprises a first end portion, the third portion comprises a second end portion, and the second portion comprises a central portion between the first end portion and the second end portion. 8. Electronic interconnection apparatus, according to claim 1, wherein the sacrificial substrate comprises a layer of material disposed between the spring contact elements and the surface, the first trenches, and the second trenches. 9. Electronic interconnection apparatus, according to claim 8, wherein removal of the layer of material releases the spring contact elements from the sacrificial substrate. 10. Electronic interconnection apparatus, according to claim 1, wherein the first trenches and the second trenches are substantially parallel to the surface of the sacrificial substrate. 11. Electronic interconnection apparatus, according to claim 10, wherein, for each of the spring contact elements, the first portion and the third portion are substantially parallel to the second portion. 12. Electronic interconnection apparatus, according to claim 1, wherein each of the first sidewalls is angled with respect to the surface and the one of the first trenches such that the first sidewall is neither parallel nor perpendicular to the surface or the one of the first trenches. 13. Electronic interconnection apparatus, according to claim 12, wherein each of the second sidewalls is angled with respect to the one of the first trenches and the one of the second trenches such that the first sidewall is neither parallel nor perpendicular to the one of the first trenches or the one of the second trenches. 14. Electronic interconnection apparatus, according to claim 1, wherein: the sacrificial substrate comprises a crystalline structure, and each of the first sidewalls is angled with respect to the surface and the one of the first trenches at an angle that corresponds to the crystalline structure of the sacrificial substrate. 15. Electronic interconnection apparatus, according to claim 14, wherein the sacrificial substrate comprises silicon, and the crystalline structure is of silicon. 16. Electronic interconnection apparatus, according to claim 14, wherein each of the second sidewalls is angled with respect to the one of the first trenches and the one of the second trenches at an angle that corresponds to the crystalline structure of the sacrificial substrate. 17. Electronic interconnection apparatus, according to claim 16, wherein the sacrificial substrate comprises silicon, and the crystalline structure is of silicon. 18. Electronic interconnection apparatus, according to claim 1, wherein, in use, the spring contact elements can be mounted, en masse, to terminals of an electronic component. 19. Electronic interconnection apparatus, according to claim 18, further comprising: a release mechanism incorporated into the sacrificial substrate which, in use, permits the sacrificial substrate to be removed after the spring contact elements are mounted to the terminals of the electronic component.
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IPC | Description |
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A | 생활필수품 |
A62 | 인명구조; 소방(사다리 E06C) |
A62B | 인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00) |
A62B-1/08 | .. 윈치 또는 풀리에 제동기구가 있는 것 |
내보내기 구분 |
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구성항목 |
관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents |
저장형식 |
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메일정보 |
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안내 |
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