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Methods and systems for planarizing workpieces, e.g., microelectronic workpieces 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B24B-049/00
출원번호 UP-0835929 (2007-08-08)
등록번호 US-7604527 (2009-11-10)
발명자 / 주소
  • Elledge, Jason B.
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Perkins Coie LLP
인용정보 피인용 횟수 : 3  인용 특허 : 290

초록

Planarizing workpieces, e.g., microelectronic workpieces, can employ a process indicator which is adapted to change an optical property in response to a planarizing condition. This process indicator may, for example, change color in response to reaching a particular temperature or in response to a p

대표청구항

I claim: 1. A CMP planarizing pad adapted to planarize a microelectronic workpiece, comprising: a matrix adapted to support an abrasive, the matrix having a planar planarizing surface; a thermally responsive fluid in the matrix, the thermally responsive fluid being adapted to change color in respon

이 특허에 인용된 특허 (290)

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  1. Rossignol, Lionel; Oliver, Christophe C., Automated detection of characteristics of abrasive products during use.
  2. Kobayashi, Yoichi, Polishing monitoring method, polishing method, and polishing monitoring apparatus.
  3. Kobayashi, Yoichi, Polishing monitoring method, polishing method, and polishing monitoring apparatus.
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