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Spectroscopic ellipsometer and polarimeter systems 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-009/02
  • G01J-003/45
  • G01J-004/00
출원번호 UP-0901225 (2007-09-17)
등록번호 US-7633625 (2009-12-24)
발명자 / 주소
  • Woollam, John A.
  • Johs, Blaine D.
  • Herzinger, Craig M.
  • He, Ping
  • Liphardt, Martin M.
  • Pfeiffer, Galen L.
출원인 / 주소
  • J.A. Woollam Co., Inc.
대리인 / 주소
    Welch, James D.
인용정보 피인용 횟수 : 12  인용 특허 : 57

초록

A rotating compensator spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electromagnetic radiation, a polarizer, a stage for supporting a material system, an analyzer, a dispersive optics and a detector system which comprises a multiplicity of detector eleme

대표청구항

I claim: 1. A method comprising the steps of: a) providing a spectroscopic rotating compensator material system investigation system comprising a source of a polychromatic beam of electromagnetic radiation, a polarizer, a stage for supporting a material system, an analyzer, a dispersive optics and

이 특허에 인용된 특허 (57)

  1. Goldstein Dennis H. (2410 Edgewater Dr. Niceville FL 32578), Achromatic infrared retarder.
  2. Buhrer Carl F. (Framingham MA), Achromatic tuner for birefringent optical filter.
  3. Herzinger Craig M. ; Johs Blaine D., Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems.
  4. Bengt Ivarsson SE, Analytical method and apparatus.
  5. Norton Adam E. ; Johnson Kenneth C. ; Carter Joseph R., Apodizing filter system useful for reducing spot size in optical measurements and other applications.
  6. Aspnes David E. ; Opsal Jon, Broadband spectroscopic rotating compensator ellipsometer.
  7. Aspnes David E. ; Opsal Jon, Broadband spectroscopic rotating compensator ellipsometer.
  8. Aspnes David E. ; Opsal Jon, Broadband spectroscopic rotating compensator ellipsometer.
  9. Aspnes David E. ; Opsal Jon, Broadband spectroscopic rotating compensator ellipsometer.
  10. Aspnes, David E.; Opsal, Jon, Broadband spectroscopic rotating compensator ellipsometer.
  11. Aspnes, David E.; Opsal, Jon, Broadband spectroscopic rotating compensator ellipsometer.
  12. David E. Aspnes ; Jon Opsal, Broadband spectroscopic rotating compensator ellipsometer.
  13. Lacey Christopher A. ; Womack Kenneth H. ; Duran Carlos ; Ross Ed ; Nodelman Semyon, Combined interferometer/ellipsometer for measuring small spacings.
  14. Liphardt,Martin M.; Johs,Blaine D.; Hale,Jeffrey S.; Herzinger,Craig M.; Green,Steven E.; He,Ping; Woollam,John A., Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter.
  15. Hartley Richard H. (Seaview Downs AUX), Control of uniformity of growing alloy film.
  16. Azzam Rasheed M. A. (Metairie LA), Diffraction-grating photopolarimeters and spectrophotopolarimeters.
  17. Johs,Blaine D.; Herzinger,Craig M.; Green,Steven E.; Hale,Jeffrey S., Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibration.
  18. Johs Blaine D. ; Herzinger Craig M. ; Green Steven E., Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems.
  19. Johs Blaine D. ; Herzinger Craig M. ; Green Steven E., Dual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimete.
  20. Robert Andre J. (Paris FRX) Filippini Jean C. (Grenoble FRX) Ferre Michel (Palaiseau FRX), Dynamic photoelasticimeter with rotating birefringent element.
  21. Woollam John A. (Lincoln NE) Johs Blaine D. (Lincoln NE) Doerr David W. (Lincoln NE) Christenson Reed A. (Lincoln NE), Ellipsometer.
  22. Aspnes David E. ; Law Joanne Yu Man, Ellipsometer and polarimeter with zero-order plate compensator.
  23. Aspnes David E. (Watchung NJ) Quinn William E. (Middlesex Boro NJ), Ellipsometric control of material growth.
  24. Imai Masayuki,JPX ; Amemiya Masaaki,JPX ; Hasebe Kazuhide,JPX ; Kaneko Norihito,JPX, Film thickness measuring apparatus.
  25. John Lawrence Freeouf, High photon energy range reflected light characterization of solids.
  26. Wilkens Jan Henrik,DEX ; Renschen Claus-Peter,DEX, Imaging spectrometer.
  27. Chipman Russell (Madison AL) Chenault David (Huntsville AL), Infrared achromatic retarder.
  28. Thompson Daniel W. ; Johs Blaine D., Infrared ellipsometer/polarimeter system, method of calibration, and use thereof.
  29. Lessner David L. (Baltimore MD) Macemon James H. (Glen Burnie MD) Rodriguez Rodolfo (Columbia MD) Soodak Charles (Silver Spring MD), Integrally focused low ozone illuminator.
  30. Johnston Roger G. (Los Alamos NM), Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom.
  31. Chen Xing (San Jose CA) Flanner ; III Philip D. (Union City CA) Malwankar Kiron B. (Sunnyvale CA) Chen Jennming (Campbell CA), Method and system for calibrating an ellipsometer.
  32. Johs Blaine D. ; Herzinger Craig M., Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems.
  33. Johs Blaine D. (Lincoln NE) He Ping (Lincoln NE) Green Steven E. (Lincoln NE) Pittal Shakil A. (Lincoln NE) Woollam John A. (Lincoln NE), Multiple order dispersive optics system and method of use.
  34. Johs Blaine D. ; Herzinger Craig M. ; Green Steven E., Multiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systems.
  35. Aspnes,David E., Normal incidence rotating compensator ellipsometer.
  36. Johs Blaine D. ; Herzinger Craig M. ; Green Steven E., Optical elements for use in spectroscopic ellipsometer and polarimeter systems.
  37. Mathyssek, Konrad; Mahlein, Hans, Optical polarizer having a prism.
  38. Stewart William J. (Blakesley GB2), Optical sensor.
  39. Burns Richard (Webster NY) Defendorf James (Rochester NY) King Edward (Fairport NY) McCarthy Cornelius (Pittsford NY), Optical system for a multidetector array spectrograph.
  40. Johs Blaine D. ; Herzinger Craig M. ; Green Steven E., Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems.
  41. Backman, Vadim; Dasari, Ramachandra R.; Gurjar, Rajan; Itzkan, Irving; Perelman, Lev; Feld, Michael S., Polarized light scattering spectroscopy of tissue.
  42. Johs Blaine D. ; Thompson Daniel W., Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector.
  43. Blaine D. Johs ; Craig M. Herzinger, Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system.
  44. Robert Andre J. (Paris FRX) Bourdon Claude G. (Igny FRX) Msika Nessim C. (Sarcelles FRX) Chorlay Etienne G. (Paris FRX) Euzenade Jean-Louis (St. Michel sur Orge FRX), Rotating birefringent ellipsometer and its application to photoelasticimetry.
  45. Dill Frederick H. (South Salem NY) Hauge Peter S. (Yorktown Heights NY), Rotating-compensator ellipsometer.
  46. Rosencwaig Allan (Danville CA) Willenborg David L. (Dublin CA), Sample characteristic analysis utilizing multi wavelength and multi angle polarization and magnitude change detection.
  47. Spanier Richard F. (Chester NJ) Wolf Robert G. (Succasunna NJ) Loiterman Robert M. (Hackettstown NJ) Haller Mitchell E. (Hackettstown NJ), Simultaneous multiple angle/multiple wavelength ellipsometer and method.
  48. Johs Blaine D. ; Herzinger Craig M. ; Green Steven E., Single trianglular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems.
  49. Woollam,John A.; Johs,Blaine D.; Herzinger,Craig M.; He,Ping; Liphardt,Martin M.; Pfeiffer,Galen L., Spectroscopic ellipsometer and polarimeter systems.
  50. Bernoux Franck (Paris FRX) Stehle Jean-Louis (Colombes FRX), Spectroscopic ellipsometry apparatus including an optical fiber.
  51. Redner Salomon (21 Terrace Rd. Norristown PA 19401), Stress and strain measuring apparatus and method.
  52. Green Steven E. (Lincoln NE) Pittal Shakil A. (Lincoln NE) Johs Blaine D. (Lincoln NE) Woollam John A. (Lincoln NE) Doerr David W. (Lincoln NE) Christenson Reed A. (Lincoln NE), System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellips.
  53. Johs Blaine D. (Lincoln NE) Pittal Shakil A. (Lincoln NE) Green Steven E. (Lincoln NE) Woollam John A. (Lincoln NE) Doerr David W. (Lincoln NE) Christenson Reed A. (Lincoln NE), System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellips.
  54. Johs Blaine D., System and method for directing electromagnetic beams.
  55. David E. Aspnes ; Jon Opsal ; Jeffrey T. Fanton, Thin film optical measurement system and method with calibrating ellipsometer.
  56. Tournois Pierre (Le Rouret FRX) Dolfi Daniel (Orsay FRX) Huignard Jean-Pierre (Paris FRX), Transverse electrical filter operating optically.
  57. Ellebracht Stephen R. (Lake Jackson TX) Fairless Charles M. (Midland MI), VUV Plasma atomic emission spectroscopic instrument and method.

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  1. Kopelman, Avi; Sambu, Shiva; Sterental, Rene M.; Kuo, Eric; de Alencar Casa, Mauricio, Arch expanding appliance.
  2. Liphardt, Martin M.; Hale, Jeffrey S.; He, Ping; Pfeiffer, Galen L., Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area.
  3. Liphardt, Martin M.; Hale, Jeffrey S.; He, Ping; Pfeiffer, Galen L, Beam focusing and reflective optics.
  4. Herzinger, Craig M.; He, Ping; Hale, Jeffrey S., Deviation angle self-compensating substantially achromatic retarder.
  5. He, Ping; Pribil, Gregory K.; Liphardt, Martin M., Elliposometer system with polarization state generator and polarization state analyzer in environmental chamber.
  6. Liphardt, Martin M.; He, Ping, Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams.
  7. Elbaz, Gilad; Lampert, Erez; Atiya, Yossef; Kopelman, Avi; Saphier, Ofer; Moshe, Maayan; Ayal, Shai, Intraoral scanner with dental diagnostics capabilities.
  8. Borovinskih, Artem; Derakhshan, Mitra; Koppers, Carina; Meyer, Eric; Tolstaya, Ekaterina; Brailov, Yury, Photograph-based assessment of dental treatments and procedures.
  9. Atiya, Yossef; Verker, Tal, Probe head and apparatus for intraoral confocal imaging using polarization-retarding coatings.
  10. Atiya, Yossef; Verker, Tal, Probe head and apparatus for intraoral confocal imaging using polarization-retarding coatings using a second sidewall.
  11. Krishnan, Shankar; Wang, Haiming, Reconfigurable spectroscopic ellipsometer.
  12. Liphardt, Martin M.; Hale, Jeffrey S.; He, Ping; Pfeiffer, Galen L., Reflective focusing optics.
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