초록 ▼

It is an object of the present invention to realize sure electrical connection between a contactor and an object to be inspected without influenced by heat, a reduction in the pre-heating time, and an enhanced throughput. A probe card of the present invention includes a contactor, a printed wiring b

It is an object of the present invention to realize sure electrical connection between a contactor and an object to be inspected without influenced by heat, a reduction in the pre-heating time, and an enhanced throughput. A probe card of the present invention includes a contactor, a printed wiring board, an interposer provided between the contactor and the printed wiring board to have the both in elastic and electrical contact with each other, a coupling member integrating these, and a reinforcing member reinforcing the printed wiring board integrated via the coupling member.

대표청구항 ▼

What is claimed is: 1. A probe card that inspects an electrical characteristic of an object to be inspected, comprising: a contactor, a circuit board; an intermediate member provided between said contactor and said circuit board to have said contactor and said circuit board in elastic and electrica

What is claimed is: 1. A probe card that inspects an electrical characteristic of an object to be inspected, comprising: a contactor, a circuit board; an intermediate member provided between said contactor and said circuit board to have said contactor and said circuit board in elastic and electrical contact with each other; a coupling member integrating said contactor, said circuit board, and said intermediate member; and a reinforcing member reinforcing said circuit board integrated via said coupling member, wherein elastic members are interposed between said contactor and said circuit board and between said circuit board and said reinforcing member respectively. 2. The probe card according to claim 1, wherein said intermediate member is an interposer having a substrate and a plurality of elastically deformable contacts provided at least on said circuit board side of the substrate. 3. The probe card according to claim 1, wherein a plurality of elastically deformable contacts are provided as said intermediate member on said contactor. 4. The probe card according to claim 1, wherein said intermediate member is made of conductive rubber. 5. The probe card according to claim 1, wherein said contactor has a ceramic substrate and a plurality of probes provided on a surface of the ceramic substrate on a side to be in contact with the object to be inspected. 6. The probe card according to claim 1, wherein said reinforcing member has a flat plate shape and is disposed opposite said intermediate member across said circuit board; wherein said reinforcing member and said contactor are fixed to each other via said coupling member; and wherein said circuit board is movably attached to said coupling member. 7. The probe card according to claim 6, wherein said reinforcing member has a pressing member pressing said circuit board toward said contactor side. 8. The probe card according to claim 7, wherein said reinforcing member has a plurality of the pressing members.