IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0140589
(2005-05-26)
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등록번호 |
US-7668362
(2010-04-09)
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발명자
/ 주소 |
- Olson, Allen
- Saligrama, Kiran
- Soenksen, Dirk G.
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출원인 / 주소 |
- Aperio Technologies, Inc.
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대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
36 인용 특허 :
50 |
초록
▼
Systems and methods for assessing virtual microscope slide image quality are provided. In order to determine whether a virtual slide image has any out of focus areas and is therefore a candidate for manual inspection, the various focus points used to scan the virtual slide image are used to calculat
Systems and methods for assessing virtual microscope slide image quality are provided. In order to determine whether a virtual slide image has any out of focus areas and is therefore a candidate for manual inspection, the various focus points used to scan the virtual slide image are used to calculate a best fit surface for the virtual slide image. The distance of each focus point from the best fit surface is then calculated and the largest distance is compared to a predetermined value. If the largest distance from a focus point to the best fit surface is larger than the predetermined value, then the virtual slide image is designated as needing a manual inspection and possible re-scan.
대표청구항
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The invention claimed is: 1. A computer implemented method for assessing the image quality of a virtual microscope slide image, comprising: identifying a plurality of focus points that were used to scan a virtual microscope slide image; calculating a best fit surface from the plurality of focus poi
The invention claimed is: 1. A computer implemented method for assessing the image quality of a virtual microscope slide image, comprising: identifying a plurality of focus points that were used to scan a virtual microscope slide image; calculating a best fit surface from the plurality of focus points; determining the distance of each focus point from the best fit surface; identifying the maximum distance of any focus point from the best fit surface; and comparing the identified maximum distance of any focus point to a predetermined threshold distance to assess the image quality of the virtual microscope slide image, wherein the predetermined threshold distance is about 5 microns. 2. The method of claim 1, further comprising designating the virtual microscope slide image for manual inspection when the identified maximum distance of any focus point is greater than the predetermined threshold distance. 3. The method of claim 2, further comprising providing to an operator a graphical display representing a plurality of virtual slide images that identifies those virtual microscope slide images that are designated for manual inspection. 4. The method of claim 3, further comprising displaying a first virtual slide image in response to a request for manual inspection of the first virtual slide image. 5. The method of claim 4, further comprising initially presenting the portion of the first virtual slide image corresponding to the focus point with the identified maximum distance. 6. The method of claim 1, wherein the predetermined threshold distance is about 10 microns. 7. The method of claim 1, wherein the best fit surface is calculated using a least squares method. 8. The method of claim 1, wherein the best fit surface is calculated using a L1-norm absolute value error method. 9. The method of claim 1, wherein the best fit surface is calculated using a Chebyshev mini-max norm method. 10. The method of claim 1, wherein the best fit surface is substantially planar. 11. The method of claim 1, wherein identifying a plurality of focus points comprises retrieving the focus points from a data storage area. 12. The method of claim 1, wherein identifying a plurality of focus points comprises obtaining the focus points from a memory. 13. The method of claim 1, wherein identifying a plurality of focus points comprises recalculating the focus points. 14. A computer implemented system for assessing the image quality of a virtual microscope slide image, comprising: a microscope slide scanning system configured to scan a specimen on a microscope slide to create a virtual microscope slide image; a memory configured to store the scanned virtual microscope slide image; a focus point identifier module configured to identify a plurality of focus points used by the scanning system in scanning a virtual microscope slide image; a best fit surface module configured to calculate a best fit surface from the plurality of focus points; a distance module configured to identify the maximum distance of any focus point from the best fit surface; a comparison module configured to compare the identified maximum distance of any focus point from the best fit surface to a predetermined threshold distance to assess the image quality of the virtual microscope slide image stored in the memory, wherein the predetermined threshold distance is about 5 microns. 15. The system of claim 14, wherein the comparison module is further configured to designate the virtual microscope slide image for manual inspection when the identified maximum distance of any focus point is greater than the predetermined threshold distance. 16. The system of claim 14, wherein the predetermined threshold distance is about 10 microns. 17. The system of claim 14, wherein the best fit surface module is further configured to calculate the best fit surface using a least squares method. 18. The system of claim 14, wherein the best fit surface module is further configured to calculate a substantially planar best fit surface. 19. A computer implemented method for real time assessment of the image quality of a virtual microscope slide image, comprising: identifying a plurality of focus points on a tissue sample on a microscope slide; calculating a best fit surface from the plurality of focus points; determining the distance of each focus point from the best fit surface; identifying the maximum distance of any focus point from the best fit surface; comparing the identified maximum distance to a predetermined threshold distance to identify one or more outlier focus points, wherein the predetermined threshold distance is about 5 microns; modifying any outlier focus points; creating a focal surface from the plurality of focus points and modified focus points; and scanning the tissue sample on the microscope slide in accordance with the focal surface. 20. The method of claim 19, wherein the modifying step comprises eliminating all outlier focus points. 21. The method of claim 19, wherein the modifying step comprises identifying a new focus point in proximity to an outlier focus point and eliminating said outlier focus point. 22. The method of claim 19, further comprising comparing the distance from the best fit surface of each of the remaining plurality of focus points to the predetermined threshold distance to identify one or more outlier focus points. 23. The method of claim 19, wherein the predetermined threshold distance is about 10 microns. 24. The method of claim 23, wherein the modifying step comprises eliminating all outlier focus points. 25. The method of claim 23, wherein the modifying step comprises identifying a new focus point in proximity to an outlier focus point and eliminating said outlier focus point. 26. The method of claim 23, further comprising comparing the distance from the best fit surface of each of the remaining plurality of focus points to the predetermined threshold distance to identify one or more outlier focus points. 27. A computer implemented system for assessing the image quality of a virtual microscope slide image, comprising: a focus point identifier module configured to identify a plurality of focus points on a tissue sample on a microscope slide; a best fit surface module configured to calculate a best fit surface from the plurality of focus points; a distance module configured to determine the maximum distance of any focus point from the best fit surface; a comparison module configured to compare said maximum distance to a predetermined threshold distance to identify one or more outlier focus points, wherein the predetermined threshold distance is about 5 microns; wherein the focus point identifier module is further configured to modify outlier focus points and the best fit surface module is further configured to create a focal surface from the plurality of focus points and modified focus points; a microscope slide scanning system configured to scan an image of the tissue sample on a microscope slide in accordance with the focal surface; and a memory configured to store the scanned image. 28. The system of claim 27, wherein the comparison module is further configured to designate the scanned image for manual inspection when the distance from the best fit surface of any focus point used to create the focal surface is greater than the predetermined threshold distance. 29. The system of claim 27, wherein the best fit surface module is further configured to calculate the best fit surface using a least squares method. 30. The system of claim 27, wherein the best fit surface module is further configured to calculate a substantially planar best fit surface. 31. The system of claim 27, wherein the comparison module is further configured to compare the distance from the best fit surface of each of the remaining plurality of focus points to the predetermined threshold distance to identify one or more outlier focus points. 32. The system of claim 27, wherein the predetermined threshold distance is about 10 microns. 33. The system of claim 32, wherein the comparison module is further configured to designate the scanned image for manual inspection when the distance from the best fit surface of any focus point used to create the focal surface is greater than the predetermined threshold distance. 34. The system of claim 32, wherein the best fit surface module is further configured to calculate the best fit surface using a least squares method. 35. The system of claim 32, wherein the best fit surface module is further configured to calculate a substantially planar best fit surface. 36. The system of claim 32, wherein the comparison module is further configured to compare the distance from the best fit surface of each of the remaining plurality of focus points to the predetermined threshold distance to identify one or more outlier focus points. 37. A computer readable storage medium having stored thereon one or more sequences of instructions for causing one or more processors to perform the steps for real time assessment of the image quality of a virtual microscope slide image, the steps comprising: identifying a plurality of focus points on a tissue sample on a microscope slide; calculating a best fit surface from the plurality of focus points; determining the distance of each focus point from the best fit surface; identifying the maximum distance of any focus point from the best fit surface; comparing the identified maximum distance to a predetermined threshold distance to identify one or more outlier focus points, wherein the predetermined threshold distance is about 5 microns; modifying any outlier focus points; creating a focal surface from the plurality of focus points and modified focus points; and scanning the tissue sample on the microscope slide in accordance with the focal surface. 38. The computer readable storage medium of claim 37, wherein the modifying step comprises eliminating all outlier focus points. 39. The computer readable storage medium of claim 37, wherein the modifying step comprises identifying a new focus point in proximity to an outlier focus point and eliminating said outlier focus point. 40. The computer readable storage medium of claim 37, further comprising comparing the distance from the best fit surface of each of the remaining plurality of focus points to the predetermined threshold distance to identify one or more outlier focus points. 41. The computer readable storage medium of claim 37, wherein the predetermined threshold distance is about 10 microns. 42. The computer readable storage medium of claim 41, wherein the modifying step comprises eliminating all outlier focus points. 43. The computer readable storage medium of claim 41, wherein the modifying step comprises identifying a new focus point in proximity to an outlier focus point and eliminating said outlier focus point. 44. The computer readable storage medium of claim 41, further comprising comparing the distance from the best fit surface of each of the remaining plurality of focus points to the predetermined threshold distance to identify one or more outlier focus points.
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