IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0791618
(2005-11-24)
|
등록번호 |
US-7672048
(2010-04-21)
|
우선권정보 |
JP-2004-374829(2004-11-27) |
국제출원번호 |
PCT/JP2005/021582
(2005-11-24)
|
§371/§102 date |
20070710
(20070710)
|
국제공개번호 |
WO06/057300
(2006-06-01)
|
발명자
/ 주소 |
- Tomitori, Masahiko
- Arai, Toyoko
- Nakae, Yutaka
|
출원인 / 주소 |
- Japan Advanced Instituter of Science and Technology
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
3 |
초록
▼
A positioning mechanism capable of decreasing width and size and a microscope using the positioning mechanism are provided. The positioning mechanism is provided with a supporting shaft possessing a spherical surface part at a prescribed position and guides disposed substantially parallel to the sup
A positioning mechanism capable of decreasing width and size and a microscope using the positioning mechanism are provided. The positioning mechanism is provided with a supporting shaft possessing a spherical surface part at a prescribed position and guides disposed substantially parallel to the supporting shaft and is characterized, on the assumption that of the three-dimensional directions, the axial direction of the supporting shaft constitutes the z direction, by the fact that the supporting shaft is nipped by the guides at the position of the spherical surface part and enabled to oscillate on the spherical surface part as a fulcrum in the xy directions and as well slide in the z direction.
대표청구항
▼
The invention claimed is: 1. A positioning mechanism for positioning a specimen, comprising: a supporting shaft including a spherical surface part and a tip portion to attach the specimen; a guide disposed substantially parallel to said supporting shaft; and impact force application means provided
The invention claimed is: 1. A positioning mechanism for positioning a specimen, comprising: a supporting shaft including a spherical surface part and a tip portion to attach the specimen; a guide disposed substantially parallel to said supporting shaft; and impact force application means provided in the supporting shaft for exerting impact force in said supporting shaft so as to move and slide the supporting shaft, thereby positioning the specimen, wherein in case an axial direction of said supporting shaft constitutes a Z direction, and X, Y directions are perpendicular to the Z direction, said supporting shaft is supported by said guide at the spherical surface part so as to move by using the spherical surface part as a fulcrum in the X and Y directions and slide in the Z direction, said guide comprises at least three rail shape guides for nipping the spherical surface part of said supporting shaft, or one tubular member for nipping the spherical surface part of said supporting shaft by an inner periphery of the one tubular member, and said supporting shaft maintains its balance with the spherical surface part as the fulcrum. 2. A positioning mechanism according to claim 1, wherein said impact force application means is disposed on a side opposite to the specimen relative to said spherical surface part. 3. A positioning mechanism according to claim 1, further comprising deforming means for deforming at least part of said supporting shaft to move the specimen, said deforming means being disposed on a side same as the specimen relative to said spherical surface part. 4. A positioning mechanism according to claim 3, wherein both of said impact force application means and said deforming means are formed of piezoelectric elements or magnetostrictors. 5. A positioning mechanism according to claim 3, wherein the impact force application means is positioned at a side opposite to the deforming means relative to the spherical surface part for positioning the specimen by the impact force application means and the deforming means. 6. A positioning mechanism according to claim 5, wherein each of the impact force application means and the deforming means is formed of cylindrical piezoelectric elements, and is integrally formed with the supporting shaft. 7. A positioning mechanism according to claim 1, wherein said supporting shaft and the rail shape guides are housed in a holder having slits, each of the rail shape guides being fixed by being embedded in each of the slits, and the holder has a leaf spring property due to said slits. 8. A positioning mechanism according to claim 1, wherein said tubular member comprises slits so as to have a leaf spring property. 9. A microscope comprising the positioning mechanism according to claim 1. 10. A positioning mechanism according to claim 1, wherein the impact force application means is a cylindrical piezoelectric element integrally formed with the shaft, which comprises a flexible tube body, four rectangular electrodes disposed equally spaced in a circumferential direction of an outer surface of the tube body, a band-shaped electrode disposed along a circumference of the tube body, and an inner surface electrode disposed along an inner surface of the tube. 11. A positioning mechanism for positioning a specimen, comprising: a supporting shaft including a spherical surface part and a leading end portion for attaching the specimen; a plumbing part connected to a rear end portion of the supporting shaft; a guide disposed substantially parallel to said supporting shaft; impact force application means provided in the supporting shaft for exerting impact force in said supporting shaft so as to move and slide the supporting shaft, thereby positioning the specimen, wherein in case an axial direction of said supporting shaft constitutes a Z direction, and X, Y directions are perpendicular to the Z direction, said supporting shaft is supported by said guide at the spherical surface part so as to move by using the spherical surface part as a fulcrum in the X and Y directions and slide in the Z direction, said guide comprises at least three rail shape guides for nipping the spherical surface part of said supporting shaft, or one tubular member for nipping the spherical surface part of said supporting shaft by an inner periphery of the tubular member, and said supporting shaft maintains its balance on the spherical surface part as the fulcrum due to the weight of said plumbing part. 12. A positioning mechanism according to claim 11 wherein said impact force application means is disposed on a side opposite to the specimen relative to said spherical surface part. 13. A positioning mechanism according to claim 11, further comprising deforming means for deforming at least part of said supporting shaft to move the specimen, said deforming means being disposed on a side same as the specimen relative to said spherical surface part. 14. A positioning mechanism according to claim 13, wherein both of said impact force application means and said deforming means are formed of piezoelectric elements or magnetostrictors. 15. A positioning mechanism according to claim 11, wherein said supporting shaft and the rail shape guides are housed in a holder having slits, each of the rail shape guides being fixed by being embedded in each of the slits, and the holder has a leaf spring property due to said slits. 16. A positioning mechanism according to claim 11, wherein said tubular member comprises slits so as to have a leaf spring property. 17. A microscope comprising the positioning mechanism according to claim 11. 18. A positioning mechanism according to claim 11, wherein the impact force application means is a cylindrical piezoelectric element integrally formed with the shaft, which comprises a flexible tube body, four rectangular electrodes disposed equally spaced in a circumferential direction of an outer surface of the tube body; a band-shaped electrode disposed along a circumference of the tube body, and an inner surface electrode disposed along an inner surface of the tube.
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