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[미국특허] Electronic components with plurality of contoured microelectronic spring contacts 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/26
출원번호 UP-0779183 (2007-07-17)
등록번호 US-7675301 (2010-04-21)
발명자 / 주소
  • Eldridge, Benjamin N.
  • Wenzel, Stuart W.
출원인 / 주소
  • FormFactor, Inc.
대리인 / 주소
    Burraston, N. Kenneth
인용정보 피인용 횟수 : 3  인용 특허 : 56

초록

An electronic component is disclosed, having a plurality of microelectronic spring contacts mounted to a planar face of the component. Each of the microelectronic spring contacts has a contoured beam, which may be formed of an integral layer of resilient material deposited over a contoured sacrifici

대표청구항

What is claimed is: 1. An electronic component, comprising: at least one face; a plurality of microelectronic spring contacts mounted to said at least one face, each of said plurality of microelectronic spring contacts comprising a base mounted to said at least one face, a beam integral with said b

이 특허에 인용된 특허 (56) 인용/피인용 타임라인 분석

  1. Malladi Deviprasad (Campbell CA) Hanson Lee Frederick (Cupertino CA) Kahahane Jean (Redwood City CA), Apparatus for testing flip chip or wire bond integrated circuits.
  2. Grabbe Dimitry G. (Middletown PA), Area array connector.
  3. Mizuta Masaharu,JPX, Cantilever type probe needle for probe card and method of fabrication and control thereof.
  4. Khandros Igor Y. ; Mathieu Gaetan L., Composite interconnection element for microelectronic components, and method of making same.
  5. Grube,Gary W.; Khandros,Igor Y.; Mathieu,Gaetan L., Composite microelectronic spring structure and method for making same.
  6. Matsumoto Kunio (Yokohama JPX) Oshima Muneo (Yokohama JPX) Sakaguchi Suguru (Chigasaki JPX), Connecting structure for electronic part and method of manufacturing the same.
  7. Matsuoka Noriyuki (Yokohama JPX), Contact in electric part socket.
  8. Khoury Theodore A., Contact structure formed by microfabrication process.
  9. Junichi Hagihara JP; Shinji Iino JP, Contactor and production method for contractor.
  10. Dranchak David William ; Kelleher Robert Joseph ; Pagnani David Peter ; Zippetelli Patrick Robert, Dual substrate package assembly coupled to a conducting member.
  11. Seymour Douglas G. (Warren PA), Electrical contact.
  12. Khandros Igor Y. ; Eldridge Benjamin N. ; Mathieu Gaetan L., Fabricating interconnects and tips using sacrificial substrates.
  13. Eldridge, Benjamin N.; Wenzel, Stuart W., Forming tool for forming a contoured microelectronic spring mold.
  14. Beaman Brian Samuel ; Fogel Keith Edward ; Lauro Paul Alfred ; Norcott Maurice Heathcote ; Shih Da-Yuan, High density cantilevered probe for electronic devices.
  15. Grabbe Dimitry G. (Middletown PA), High density electrical connector system.
  16. Babuka, Robert; Piechota, John L.; Poch, Leonard J., High density planar interconnected integrated circuit package.
  17. Jones Mark R. ; Khoury Theodore A., High performance integrated circuit chip package.
  18. Ozawa Kazuhisa (Kawagoe JPX) Harada Hiroaki (Kawagoe JPX), IC socket and its contact pin.
  19. Eldridge, Benjamin N.; Mathieu, Gaetan, Interconnect assemblies and methods.
  20. Mallik Debendra (Chandler AZ) Bhattacharyya Bidyut K. (Chandler AZ), Lead grid array integrated circuit.
  21. Mathieu Gaetan L. ; Eldridge Benjamin N. ; Grube Gary W., Lithographic contact elements.
  22. Eldridge,Benjamin N.; Wenzel,Stuart W., Lithographic type microelectronic spring structures with improved contours.
  23. Eldridge, Benjamin N.; Wenzel, Stuart W., Method for forming microelectronic spring structures on a substrate.
  24. Belmont Andre,FRX ; Reynaud Vincent,FRX ; Daniau William,FRX, Method for making cards with multiple contact tips for testing semiconductor chips.
  25. Yanof Arnold W. (Tempe AZ) Dauksher William (Mesa AZ), Method for manufacturing a probe.
  26. Burrows Paul E. ; Forrest Stephen R. ; Bulovic Vladimir ; Tian Peifang ; Brown Julie, Method for patterning light emitting devices incorporating a movable mask.
  27. Lum Thomas F. (Austin TX) Wenzel James F. (Austin TX), Method for probing a semiconductor wafer.
  28. Eldridge Benjamin N. ; Khandros Igor Y. ; Mathieu Gaetan L. ; Pedersen David V., Method of making microelectronic spring contact elements.
  29. Eldridge Benjamin N. ; Grube Gary W. ; Khandros Igor Y. ; Mathieu Gaetan L., Method of mounting resilient contact structures to semiconductor devices.
  30. Quate Calvin F. (Stanford CA) Minne Stephen Charles (Danville IL), Method of performing lithography using cantilever array.
  31. Eldridge Benjamin N. ; Grube Gary W. ; Khandros Igor Y. ; Mathieu Gaetan L., Method of planarizing tips of probe elements of a probe card assembly.
  32. Watanabe Takashi,JPX ; Yoshida Minako,JPX, Micro contact pin structure with a piezoelectric element and probe card using the same.
  33. Palagonia Anthony Michael ; Pikna Paul Joseph ; Maddix John Thomas, Micro probe assembly and method of fabrication.
  34. Maddix John Thomas ; Palagonia Anthony Michael ; Pikna Paul Joseph ; Vallett David Paul, Micro probe ring assembly and method of fabrication.
  35. Rothenberger Richard E. (5 State Dr. Harrisburg PA 17112), Micro-power connector.
  36. Fjelstad Joseph (Sunnyvale CA) Smith John W. (Palo Alto CA) Distefano Thomas H. (Monte Sereno CA) Zaccardi James (Sunnyvale CA) Walton A. Christian (Belmont CA), Microelectronic contacts with asperities and methods of making same.
  37. Benjamin N. Eldridge ; Gary W. Grube ; Igor Y. Khandros ; Gaetan L. Mathieu, Microelectronic spring contact element and electronic component having a plurality of spring contact elements.
  38. Jones Mark R. ; Khoury Theodore A., Packaging and interconnection of contact structure.
  39. Smith Donald L. (Palo Alto CA) Alimonda Andrew S. (Los Altos CA), Photolithographically patterned spring contact.
  40. Smith Donald L. ; Thornton Robert L. ; Chua Christopher L. ; Fork David K., Photolithographically patterned spring contact and apparatus and methods for electrically contacting devices.
  41. Soejima Koji,JPX ; Senba Naoji,JPX, Probe card and method of forming a probe card.
  42. Theodore A. Khoury ; Mark R. Jones ; R. Keith Lee, Probe contactor and production method thereof.
  43. Fujita Kazuhide (Osaka JPX), Probe structure for measuring electric characteristics of a semiconductor element.
  44. Itoyama Taketoshi (Tokorozawa JPX), Prober apparatus.
  45. Nakano Shoukichi (Kawasaki JPX), Prober for semiconductor integrated circuit element wafer.
  46. Kiyoshi Takekoshi JP, Probing card.
  47. Faraci Anthony B. ; Zaccardi James B. ; DiStefano Thomas H. ; Smith John W., Socket for engaging bump leads on a microelectronic device and methods therefor.
  48. Dozier ; II Thomas H. ; Eldridge Benjamin N. ; Grube Gary W. ; Khandros Igor Y. ; Mathieu Gaetan L., Sockets for electronic components and methods of connecting to electronic components.
  49. White William J. (Chelmsford MA) Ortolf James M. (Acton MA), Spring finger interconnect for IC chip carrier.
  50. Grabbe Dimitry G. (Middletown PA) Korsunsky Iosif (Harrisburg PA) Ringler Daniel R. (Elizabethville PA), Surface mount electrical connector.
  51. Lee James C. K. (Los Altos Hills CA) Amdahl Gene M. (Atherton CA) Beck Richard (Cupertino CA) Lee Chune (San Francisco CA) Hu Edward (Sunnyvale CA), System for detachably mounting semiconductors on conductor substrate.
  52. Eldridge, Benjamin N.; Wenzel, Stuart W., Test head assembly for electronic components with plurality of contoured microelectronic spring contacts.
  53. Eldridge,Benjamin N.; Wenzel,Stuart W., Test head assembly having paired contact structures.
  54. Beaman Brian Samuel ; Fogel Keith Edward ; Lauro Paul Alfred ; Norcott Maurice Heathcote ; Shih Da-Yuan ; Walker George Frederick, Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof.
  55. Marcus Robert B. ; Kadija Igor V. ; Aharonov Robert Reuven, Ultra-miniature electrical contacts and method of manufacture.
  56. Khandros Igor Y. ; Pedersen David V., Wafer-level burn-in and test.

이 특허를 인용한 특허 (3) 인용/피인용 타임라인 분석

  1. Yonezawa, Toshihiro, Cantilevered probe having a bending contact.
  2. Jeon, Myoungsoo; Taylor, Attalee Snarr; Hornung, Craig Warren, Electrical component having an array of electrical contacts.
  3. Arvin, Charles L.; Erwin, Brian Michael; Maier, Gary W., Method of forming a temporary test structure for device fabrication.

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