[특허]Protection of an integrated circuit and method thereof

Freescale Semiconductor, Inc.

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특허 상세정보

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내보내기 페이스북 공유 트위터 공유 카카오톡 공유

Protection of an integrated circuit and method thereof

특허상세정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01K-013/00 G05D-023/00 G06F-019/00
미국특허분류(USC)	702/132; 374/141; 374/152; 700/299; 702/127; 702/130; 702/187; 702/189; 713/300
출원번호	UP-0911324 (2005-04-13)
등록번호	US-7680622 (2010-04-21)
국제출원번호	PCT/EP2005/005208 (2005-04-13)
§371/§102 date	20071011 (20071011)
국제공개번호	WO06/108444 (2006-10-19)
발명자 / 주소	Dupuy, Philippe Guillot, Laurent Moreau, Eric Turpin, Pierre
출원인 / 주소	Freescale Semiconductor, Inc.
인용정보	피인용 횟수 : 4 인용 특허 : 11

초록

An integrated circuit comprises a power device located on a die. The power device is operably coupled to a processing function, wherein the signal processing function is operably coupled to two or more temperature sensors. A first temperature sensor is operably coupled to the power device to measure a temperature of the power device and the second temperature sensor is located, such that it measures a substantially ambient temperature related to the die. The signal processing function determines the temperature gradient therebetween.

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The invention claimed is: 1. An integrated circuit comprising: a power device located on a die; a processing function operably coupled to the power device, wherein the processing function is operably coupled to two or more temperature sensors wherein a first temperature sensor is operably coupled to the power device to measure a temperature of the power device and the second temperature sensor is located such that it measures a substantially ambient temperature related to the die and the processing function determines the temperature gradient therebetween; and a counter, operably coupled to the processing function and arranged to count a number of times that the determined temperature gradient exceeds a threshold value. 2. An integrated circuit according to claim 1, wherein the second temperature sensor is operably coupled to a non-high power device or die. 3. An integrated circuit according to claim 1, wherein the power device is a silicon switch. 4. An integrated circuit according to claim 1 wherein the processing function is a digital circuit and in response to the digital circuit determining the temperature gradient between the power device and an ambient temperature, the digital circuit implements a protection process to protect the power device. 5. An integrated circuit according to claim 4 wherein the processing function is operably coupled to a logic gate driver and the protection process comprises switching off the power device by the logic gate driver or reducing the power applied thereto. 6. An integrated circuit according to claim 5, wherein the second temperature sensor is operably coupled to a non-high power device or die. 7. An integrated circuit comprising: a power device located on a die; a processing function operably coupled to the power device, wherein the processing function is operably coupled to two or more temperature sensors wherein a first temperature sensor is operably coupled to the power device to measure a temperature of the power device and the second temperature sensor is operably coupled to a non-high power device or die and is located such that it measures a substantially ambient temperature related to the die and the processing function determines the temperature gradient therebetween, wherein the non-high power device or die is a control die. 8. An integrated circuit according to claim 7, further comprising a counter, operably coupled to the processing function and arranged to count a number of times that the calculated temperature gradient exceeds a threshold value. 9. The integrated circuit according to claim 7 wherein the die and the control die are in a dual die arrangement. 10. An integrated circuit according to claim 7, wherein the power device is a silicon switch. 11. An integrated circuit according to claim 10, further comprising a counter, operably coupled to the processing function and arranged to count a number of times that the calculated temperature gradient exceeds a threshold value. 12. An integrated circuit according to claim 7 wherein the processing function is a digital circuit and in response to the digital circuit determining the temperature gradient between the power device and an ambient temperature, the digital circuit implements a protection process to protect the power device. 13. An integrated circuit according to claim 12 wherein the processing function is operably coupled to a logic gate driver and the protection process comprises switching off the power device by the logic gate driver or reducing the power applied thereto. 14. An integrated circuit according to claim 13, further comprising a counter, operably coupled to the processing function and arranged to count a number of times that the calculated temperature gradient exceeds a threshold value. 15. A method of improving a reliability of an integrated circuit comprising a power device, the method comprising the steps of: measuring a first temperature of the power device; measuring a second ambient temperature associated with the power device, wherein the step of a measuring a second ambient temperature associated with the power device comprises measuring an ambient temperature of an associated non-high power die, calculating a temperature gradient between the power device and the non-high power die in response to the steps of measuring; determining whether the calculated temperature gradient has exceeded a threshold; and implementing a power reduction process applied to the power device if the temperature gradient exceeds a threshold. 16. A method according to claim 15, further comprising: incrementing a counter if the determined temperature gradient exceeds a threshold; determining whether the Counter has exceeded a threshold; implementing a power reduction process applied to the power device if the Counter exceeded a threshold. 17. The method of claim 15 wherein the non-high power die is an associated control die. 18. A method of improving a reliability of an integrated circuit comprising a power device, the method comprising the steps of: measuring a first temperature of the power device; measuring a second ambient temperature associated with the power device; calculating a temperature gradient across a portion of the power device in response to the steps of measuring; determining whether the calculated temperature gradient has exceeded a threshold; implementing a power reduction process applied to the power device if the temperature gradient exceeds a threshold, incrementing a counter if the determined temperature gradient exceeds a threshold; determining whether the Counter has exceeded a threshold; and implementing a power reduction process applied to the power device if the Counter exceeded threshold. 19. An integrated circuit comprising: a power device located on a die; and a processing function operably coupled to the power device, wherein the processing function is operably coupled to two or more temperature sensors wherein a first temperature sensor is operably coupled to the power device to measure a temperature of the power device and the second temperature sensor is located such that it measures a substantially ambient temperature related to the die and the processing function determines the temperature gradient therebetween; wherein the processing function is a digital circuit and in response to the digital circuit determining the temperature gradient between the power device and an ambient temperature, the digital circuit implements a protection process to protect the power device; wherein the second temperature sensor is operably coupled to a non-high power device or die. 20. An integrated circuit according to claim 19 wherein the processing function is operably coupled to a logic gate driver and the protection process comprises switching off the power device by the logic gate driver or reducing the power applied thereto. 21. An integrated circuit according to claim 19 further comprising a counter, operably coupled to the processing function and arranged to count a number of times that the calculated temperature gradient exceeds a threshold value.

이 특허에 인용된 특허 (11)

이 특허를 인용한 특허 피인용횟수: 4

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특허 상세정보

Protection of an integrated circuit and method thereof

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특허 상세정보

Protection of an integrated circuit and method thereof

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이 특허에 인용된 특허 (11)

이 특허를 인용한 특허 피인용횟수: 4

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