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[미국특허] Integrated ultrasonic inspection probes, systems, and methods for inspection of composite assemblies 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-029/26
  • G01N-029/28
출원번호 UP-0263537 (2008-11-03)
등록번호 US-7690259 (2010-05-20)
발명자 / 주소
  • Bui, Hien T.
  • Young, Fred D.
  • Lee, Mark A.
  • Krotzer, Richard C.
  • Uyehara, Clyde T.
  • Fetzer, Barry A.
출원인 / 주소
  • The Boeing Company
대리인 / 주소
    Alston & Bird LLP
인용정보 피인용 횟수 : 9  인용 특허 : 88

초록

Apparatus, systems, and methods for inspecting a structure are provided which permit inspection of uniquely shaped structures such as fuselage frames and shear ties. Probes may be constructed from rapid prototyping. Inspection may be performed manually and may use a portable function support system

대표청구항

That which is claimed: 1. A method of non-destructive inspection, comprising: supporting at least a first part of an inspection device and a second part of an inspection device on both a first portion of a structure and a second portion of the structure, wherein the first portion of the structure a

이 특허에 인용된 특허 (88) 인용/피인용 타임라인 분석

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  58. Georgeson, Gary E., System, method and apparatus for the inspection of joints in a composite structure.
  59. Gugel ; Georg, Test system carrier for ultrasonic testing of nozzle seams, pipe connection seams and nozzle corners in pressure vessel.
  60. Weng Lee (Issaquah WA), Three-dimensional scan converter for ultrasound imaging.
  61. Richard Scott Chennell ; Jon Russel Dierdorf, Through-transmission ultrasonic inspection apparatus and method.
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  63. Martens, George D., Transducer array for detection of subsurface flaws.
  64. Jeffras Nathaniel B. (Woodland Hills CA) Modispacher Donald R. (Woodland Hills CA), Ultrasonic control contour follower.
  65. Naruse Akisuke (Hitachi JPX) Hosono Tatsukuma (Hitachi JPX) Takaku Kazuo (Hitachi JPX) Kajiyama Shigeru (Hitachi JPX), Ultrasonic flaw detector.
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  68. Kennedy James C. (Bellevue WA) Lankelis William M. (North Bend WA) Puckett Edward L. (Snoqualmie WA) Young Fred D. (Bellevue WA), Ultrasonic inspection probe for laminated structures.
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  87. Galish, Andrew Joseph; Birdwell, Thomas William; Isaacs, Ralph Gerald; Little, Francis Howard, X-ray inspection apparatus and method.
  88. Georgeson,Gary E.; Safai,Morteza, X-ray laminography inspection system and method.

이 특허를 인용한 특허 (9) 인용/피인용 타임라인 분석

  1. Fetzer, Barry A.; Grewal, Navpreet S.; Hwang, Peter Kuk-kyung; Schell, William R.; Boudreau, Kate Brown, Apparatus and method for inspecting a tube.
  2. Fetzer, Barry A.; Grewal, Navpreet S.; Hwang, Peter Kuk-kyung; Schell, William R.; Boudreau, Kate Brown, Apparatus for inspecting a tube.
  3. Fetzer, Barry A.; Brown, Christopher R.; Sarr, Dennis P.; Duncan, Michael J., Apparatuses, systems, and methods for inspecting a component.
  4. Fetzer, Barry A.; Serrill, Justin D., Automated ultrasonic inspection of elongated composite members using single-pass robotic system.
  5. Fetzer, Barry A.; Anderson, Patrick Lee; Bui, Hien T.; Walton, Steven Ray, Device and method for inspecting a corner radius.
  6. Arnold, Ralph; Eisenbeiss, Fred, Method for producing a component comprising at least one hollow profile.
  7. Clemen, Jr., Mark J., Methods for non-destructive inspection of thick fiber-reinforced composite parts.
  8. Fetzer, Barry A.; Brown, Christopher R.; Bray, Kevin R.; Duncan, Michael J.; Walton, Steven R., Non-destructive ultrasonic inspection apparatus, systems, and methods.
  9. Birtcher, Charles Michael; Steidl, Thomas Andrew, Ultrasonic liquid level sensing systems.

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