$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Processing system with increased cassette storage capacity 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B65G-049/07
출원번호 UP-0525724 (2006-09-22)
등록번호 US-7740437 (2010-07-12)
발명자 / 주소
  • De Ridder, Christianus Gerardus Maria
  • den Hartog, Edwin
출원인 / 주소
  • ASM International N.V.
대리인 / 주소
    Knobbe, Martens, Olson & Bear LLP
인용정보 피인용 횟수 : 9  인용 특허 : 81

초록

A system for processing semiconductor substrates includes a front-end with at least two vertical levels of input/output ports for transferring substrate cassettes into or out of the housing of the processing system. The front-end also includes at least one level of storage positions, e.g., two level

대표청구항

We claim: 1. A semiconductor substrate processing system, comprising: a housing for separating the system from a surrounding clean room; a reactor within the housing; and a front-end for loading substrate cassettes into the housing, the front-end being disposed adjacent to and in front of the housi

이 특허에 인용된 특허 (81)

  1. Kurata, Shunsuke, Alignment apparatus.
  2. Prentakis Antonios E. (Cambridge MA), Apparatus and method for loading and unloading wafers.
  3. Chao, Albert, Apparatus and method for positioning a cassette pod onto a loadport by an overhead hoist transport system.
  4. Sakaya Kazuhiro (Yokohama JPX) Kodama Shoichi (Tokyo JPX), Apparatus for transferring semiconductor wafers.
  5. Davis,Jeffry A.; Nelson,Gordon Ray; Bexten,Daniel P., Automated processing system.
  6. Muka Richard S., Automated wafer buffer for use with wafer processing equipment.
  7. Yu Allen S. ; Steffan Paul J., Automatic method to eliminate first-wafer effect.
  8. Obata, Masanori; Arima, Jyunichi; Hirata, Yoshihiro, Automatic thin-film measuring apparatus.
  9. Smedt Rodney G, Backside contamination inspection device.
  10. Maney George A. (Palo Alto CA) Faraco W. George (Saratoga CA) Parikh Mihir (San Jose CA), Box door actuated retainer.
  11. Yap Hoon-Yeng, Cart for transferring objects.
  12. Asakawa Teruo,JPX ; Saeki Hiroaki,JPX ; Iizuka Yoji,JPX ; Matsushima Keiichi,JPX, Cassette chamber.
  13. Moore Gary M., Cluster tool layer thickness measurement apparatus.
  14. Bachrach, Robert Z., Compact apparatus and method for storing and loading semiconductor wafer carriers.
  15. Kiriseko Tadashi (Kanagawa JPX) Tani Hiromichi (Kawasaki JPX) Soma Noriko (Yokohama JPX) Shigemi Nobuhisa (Kawasaki JPX) Toyoda Takayuki (Yokkaichi JPX), Continuous semiconductor substrate processing system.
  16. Iwasaki Junji,JPX ; Katsube Junichi,JPX ; Itami Yasushi,JPX, Control method of stocker entry task and stocker exit task in semiconductor wafer cassette transportation apparatus.
  17. Anello Louis G. (Hamburg NY) Gupta Satish K. (Amherst NY) Kirtley Stephen W. (Sunnyvale CA) Wooster George S. (Hamburg NY) DePrenda Ralph L. (Amherst NY), Cyclosilazane polymers as dielectric films in integrated circuit fabrication technology.
  18. Granneman, Ernst Hendrik August; Hasper, Albert; Zinger, Jan, Device for processing semiconductor wafers.
  19. Zinger Yan (Dwingeloo NLX), Device for treating micro-circuit wafers.
  20. Aggarwal, Ravinder K., Docking cart with integrated load port.
  21. Dordi Yezdi ; Malik Muhammad Atif ; Hao Henan ; Franklin Timothy H. ; Stevens Joe ; Olgado Donald, Electro-chemical deposition system.
  22. Uto Sachio (Yokohama JPX) Shiba Masataka (Yokohama JPX) Oshida Yoshitada (Fujisawa JPX), Exposure apparatus with foreign particle detector.
  23. Bachrach Robert Z., Factory automation apparatus and method for handling, moving and storing semiconductor wafer carriers.
  24. Shishido Hiroaki (Yokohama JPX) Matsumoto Shunichi (Yokohama JPX), Foreign particle inspection apparatus and method with front and back illumination.
  25. Ohsawa Tetsu (Sagamihara JPX), Heat treating apparatus.
  26. Hosoi Masato,JPX, Identification structure of a substrate storage container and method of identifying a substrate storage container.
  27. Bonin Michel P. ; Holve Donald J., In situ sensor for near wafer particle monitoring in semiconductor device manufacturing equipment.
  28. Batchelder, William Tom; Chetcuti, Fred Joseph; Gochberg, Lawrence Allen, Inverted hot plate cure module.
  29. Murata Masanao,JPX ; Oyobe Hiroyuki,JPX ; Tanaka Tsuyoshi,JPX ; Nanpei Zenta,JPX ; Takaoka Toshiyuki,JPX ; Saeki Hiroaki,JPX ; Matsushima Keiichi,JPX, Load port.
  30. Patterson Jesse ; Dill Charles Thomas, Low profile automated pod door removal system.
  31. Morioka Hiroshi (Ebina JPX) Noguchi Minori (Yokohama JPX) Ohshima Yoshimasa (Yokohama JPX) Kembo Yukio (Yokohama JPX) Nishiyama Hidetoshi (Fujisawa JPX) Matsuoka Kazuhiko (Gunma JPX) Shigyo Yoshiharu, Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process.
  32. Cheng David, Method and apparatus for loading and unloading wafers from a wafer carrier.
  33. Hiatt William Mark ; Vasquez Barbara,TWX ; Mautz Karl Emerson, Method and apparatus for processing a semiconductor wafer on a robotic track having access to in situ wafer backside pa.
  34. Sun James J., Method and apparatus for surface inspection in a chamber.
  35. Bonora Anthony C. (Menlo Park CA) Guerre Gilles (Les Loges en Josas FRX) Parikh Mihir (San Jose CA) Rosenquist ; Jr. Frederick T. (Redwood City CA) Jain Sudhir (Milpitas CA), Method and apparatus for transferring articles between two controlled environments.
  36. Birkner,Andreas; Bernhardt,Frank; Hiltawski,Knut, Method and arrangement for transporting and inspecting semiconductor substrates.
  37. Wooding Michael J. (Sunnyvale CA) Cardema Rudolfo S. (San Jose CA) Ramiller Charles L. (Santa Clara CA), Method and system for loading wafers.
  38. Ahne Hellmut (Rttenbach DEX) Kleeberg Wolfgang (Erlangen DEX) Rubner Roland (Rttenbach DEX) Krger Hans (Munich DEX), Method for the preparation of thin polyimide film.
  39. Matsumoto Shunichi,JPX ; Shishido Hiroaki,JPX, Method of and apparatus for inspecting reticle for defects.
  40. Dietze Gerald R. ; Kononchuk Oleg V., Method of determining the thickness of a layer on a silicon substrate.
  41. Tate, Naoto; Aga, Hiroji, Method of manufacturing a bonded wafers using a Bernoulli chuck.
  42. Goldberg Martin J. ; Rava Richard P., Method of manufacturing biological chips.
  43. Hasper, Albert, Method of processing substrates with integrated weighing steps.
  44. Huang Kuo-Ching,TWX ; Ying Tse-Liang,TWX ; Chiang Wen-Chuan,TWX ; Lee Yu-Hua,TWX, Method to evaluate hemisperical grain (HSG) polysilicon surface.
  45. Larsen, Grant Kenji, Methods and apparatus for high speed object handling.
  46. Dishon Giora,ILX ; Finarov Moshe,ILX ; Cohen Yoel,ILX ; Nirel Zvi,ILX, Monitoring apparatus and method particularly useful in photolithographically processing substrates.
  47. Asakawa Teruo,JPX ; Saeki Hiroaki,JPX, Multi-chamber treatment system.
  48. Aggarwal Ravinder ; Stevens Ronald R., Multi-stage single-drive FOUP door system.
  49. Kinney Patrick D. ; Rao Nagaraja P., Optical inspection module and method for detecting particles and defects on substrates in integrated process tools.
  50. Suzuki Akiyoshi (Tokyo JPX) Kohno Michio (Tokyo JPX), Optical scanning apparatus, surface-state inspection apparatus and exposure apparatus.
  51. Noriaki Yoshikawa JP; Tadashi Yotsumoto JP; Terumi Muguruma JP; Yoshitaka Hasegawa JP; Yuichi Kuroda JP, Pod and method of cleaning it.
  52. Paul Bacchi ; Paul S. Filipski, Pod load interface equipment adapted for implementation in a fims system.
  53. Fosnight William J. ; Shenk Joshua W., Pod to port door retention and evacuation system.
  54. Godschalx James P. ; Romer Duane R. ; So Ying Hung ; Lysenko Zenon ; Mills Michael E. ; Buske Gary R. ; Townsend ; III Paul H. ; Smith ; Jr. Dennis W. ; Martin Steven J. ; DeVries Robert A., Polyphenylene oligomers and polymers.
  55. Poris Jaime (Los Gatos CA), Precision weighing to monitor the thickness and uniformity of deposited or etched thin film.
  56. Kops Friedrich (Rondorf DT), Process and apparatus for testing the tightness of seam joints of synthetic resin sheets by means of vacuum.
  57. Davis Cecil J. (Greenville TX) Abernathy Joseph V. (Wylie TX) Matthews Robert T. (Plano TX) Hildenbrand Randall C. (Richardson TX) Simpson Bruce (Dallas TX) Bohlman James G. (Forney TX) Loewenstein L, Processing apparatus.
  58. Larson, Robert E.; Simondet, Sean D.; Zimmerman, David C.; Maciej, Todd K.; Matthys, Quirin W., Reduced footprint tool for automated processing of microelectronic substrates.
  59. Campbell, Philip L.; Pinckney, David J.; Sherwood, Edward; Ziemins, Uldis A., Reticle storage pod (RSP) transport system utilizing FOUP adapter plate.
  60. Nasr, Amro; Kabbani, Samer, Robotic storage buffer system for substrate carrier pods.
  61. Bonora Anthony C. (Menlo Park CA) Fosnight William J. (Newark CA) Martin Raymond S. (San Jose CA) Rhine Bruce C. (Fremont CA), SMIF port interface adaptor.
  62. Bonora Anthony C. (Menlo Park CA) Rosenquist Frederick T. (Redwood City CA), Sealable transportable container having improved latch mechanism.
  63. Bonora Anthony C. ; Rosenquist Frederick T. ; Jain Sudhir ; Davis Mark R., Sealable, transportable container having a breather assembly.
  64. Yen Daniel L. (Chu-Tung TWX), Semiconductor planarization process for submicron devices.
  65. Jeffry A. Davis ; Kert L. Dolechek ; Gary L. Curtis, Semiconductor wafer processing apparatus having improved wafer input/output handling system.
  66. McKenna Douglas B. (Wilmington DE), Semiconductor wafer transport container.
  67. Hayashi, Akinari, Substrate processing apparatus and substrate processing method.
  68. Sato Yuusuke,JPX ; Ohmine Toshimitsu,JPX ; Honda Takaaki,JPX, Substrate processing apparatus and substrate processing method.
  69. Yoshio Kimura JP; Issei Ueda JP; Mitiaki Matsushita JP; Kazuhiko Ito JP, Substrate processing apparatus and substrate processing method.
  70. Murakami Eiichi (Yokohama JPX) Kohno Michio (Tokyo JPX) Suzuki Akiyoshi (Tokyo JPX), Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces.
  71. Kononchuk Oleg V. ; Martin Stephen L., System and method for wafer thickness sorting.
  72. Sluijk, Boudewijn Gijsbert; De Ridder, Christianus Gerardus Maria, System for the treatment of wafers.
  73. Heerens, Gert-Jan; Van De Ven, Bastiaan Lambertus Wilhelmus Marinus; Lansbergen, Robert Gabriel Maria; Ham, Erik Leonardus, Transfer method for a mask or substrate, storage box, apparatus adapted for use in such method, and device manufacturing method including such a transfer method.
  74. Grohrock Peter (Hoehenkirchen DEX), Transport container with an interchangeable inside container.
  75. Maydan Dan ; Somekh Sasson ; Sinha Ashok ; Fairbairn Kevin ; Lane Christopher ; Colborne Kelly ; Ponnekanti Hari K. ; Taylor W. N.(Nick), Ultra high throughput wafer vacuum processing system.
  76. Kato, Shigekazu; Nishihata, Kouji; Tsubone, Tsunehiko; Itou, Atsushi, Vacuum processing apparatus.
  77. Nishi Hironobu (Sagamihara JPX), Vertical heat-treating apparatus.
  78. Zinger, Jan; De Ridder, Christianus G. M., Wafer handling system.
  79. Zinger,Jan; De Ridder,Christianus G. M., Wafer handling system.
  80. Toshima Masato, Wafer transfer system and method of using the same.
  81. Toshima Masato, Wafer transfer system and method of using the same.

이 특허를 인용한 특허 (9)

  1. Bonora, Anthony C.; Gould, Richard H.; Krolak, Michael, Integrated systems for interfacing with substrate container storage systems.
  2. Trussell, David; Daugherty, John; Kellogg, Michael; Pena, Christopher; Gould, Richard; Kunkel, Klay, Service tunnel for use on capital equipment in semiconductor manufacturing and research fabs.
  3. Trussell, David; Daugherty, John; Kellogg, Michael; Pena, Christopher; Gould, Richard; Kunkel, Klay, Service tunnel for use on capital equipment in semiconductor manufacturing and research fabs.
  4. Bonora, Anthony C.; Gould, Richard H.; Krolak, Michael, Substrate container storage system.
  5. Kamikawa, Yuji; Tsuchiya, Takafumi; Egashira, Koji, Substrate processing apparatus.
  6. Kamikawa, Yuji; Tsuchiya, Takafumi; Egashira, Koji, Substrate processing apparatus.
  7. Park, Sun Yong; Kim, Choon Sik; Bae, Jeong Yong, Substrate processing apparatus and method for transferring substrate for the apparatus.
  8. Ueda, Issei; Hayashida, Yasushi; Miyata, Akira; Yamamoto, Kensei; Yamamoto, Yuichi; Matsushita, Michiaki, Substrate processing system.
  9. Haraki, Kenjiro; Yamamoto, Hiroyuki; Uemura, Satoshi; Tsunoda, Yuji; Takeuchi, Yasushi; Kaneko, Hirofumi, Vertical heat treatment apparatus and method for operating the same.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로