초록 ▼

A tool and method for disuniting two wafers, wherein at least one of the wafers is used in fabricating substrates for microelectronics, optoelectronics, or optics. The method includes the steps of temporarily affixing two gripper members to respective opposite faces of the wafers; and sufficiently d

A tool and method for disuniting two wafers, wherein at least one of the wafers is used in fabricating substrates for microelectronics, optoelectronics, or optics. The method includes the steps of temporarily affixing two gripper members to respective opposite faces of the wafers; and sufficiently displacing one of the gripper members relative to the other for inducing controlled flexing in at least one of the members and for exerting a force close to one edge of the wafers to assist in disuniting the wafers. If desired, the bonding energy between two wafers can be determined by measuring the force exerted during the displacement step or measuring the separation of the wafers while performing the disuniting operation.

대표청구항 ▼

What is claimed is: 1. A method of disuniting two wafers, with at least one of the wafers being used in fabricating substrates for microelectronics, optoelectronics, or optics, the method comprising the following steps: temporarily affixing two gripper members to respective opposite faces of the wa

What is claimed is: 1. A method of disuniting two wafers, with at least one of the wafers being used in fabricating substrates for microelectronics, optoelectronics, or optics, the method comprising the following steps: temporarily affixing two gripper members to respective opposite faces of the wafers; and sufficiently displacing one of the gripper members relative to the other for inducing controlled flexing in at least one of the gripper members and for responsively exerting a force close to one edge of the wafers to assist in disuniting the wafers, wherein one or each gripper member comprises a body generally in the form of a plate having different degrees of elastic deformability in at least two locations. 2. The method of claim 1 which further comprises measuring the bonding energy between two wafers by measuring the force exerted during the displacement step or measuring the separation of the wafers while performing the disuniting operation. 3. The method of claim 2 wherein both the force exerted during the displacement step and the separation of the wafers is measured while performing the disuniting operation. 4. The method according to claim 1, wherein the temporary affixing step comprises contacting the gripper members with the wafer faces by applying a vacuum. 5. The method according to claim 1, wherein the temporary affixing step comprises providing the gripper members with the wafer faces by applying electrostatic forces. 6. The method according to claim 1, wherein the two gripper members are mounted to pivot relative to each other. 7. The method according to claim 1, wherein one or each gripper member comprises an electrode which has a different potential compared to that of a respective wafer face so as to provide temporary affixing by electrostatic forces. 8. The method according to claim 7, wherein each gripper member that includes an electrode further comprises dielectric material which surrounds the electrode.