IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
UP-0249445
(2008-10-10)
|
등록번호 |
US-7745768
(2010-07-19)
|
우선권정보 |
FR-07 07336(2007-10-19) |
발명자
/ 주소 |
- Leyre, Xavier
- Napierala, Bruno
|
출원인 / 주소 |
|
대리인 / 주소 |
Lowe Hauptman Ham & Berner, LLP
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
4 |
초록
▼
The present invention relates to an absolute target system intended to be incorporated in observation satellites. To establish an absolute target system provided with maximum accuracy, the present invention proposes coupling a star sensor (4) to an optical metrological system (5N, 5R). Since these t
The present invention relates to an absolute target system intended to be incorporated in observation satellites. To establish an absolute target system provided with maximum accuracy, the present invention proposes coupling a star sensor (4) to an optical metrological system (5N, 5R). Since these two items of equipment are normally already on board the satellites, in particular for formation flight missions, this solution adds no extra weight or cost.
대표청구항
▼
The invention claimed is: 1. An absolute target system comprising: a star sensor having a catalogue of stars listing a set of known bright stars, whose absolute accuracy is known, with a catalogue accuracy of the catalogue incorporated in the absolute target system, an optical metrological sensor t
The invention claimed is: 1. An absolute target system comprising: a star sensor having a catalogue of stars listing a set of known bright stars, whose absolute accuracy is known, with a catalogue accuracy of the catalogue incorporated in the absolute target system, an optical metrological sensor to accurately determine relative positions of the bright stars, with a measurement accuracy with which is associated a frame of reference, said star sensor and said optical metrological sensor cooperating so that the star sensor can be used to roughly point the optical metrological sensor in a target direction corresponding to a known bright star in the star catalogue, the optical metrological sensor then accurately determining the direction of said known bright star in its own frame of reference, so making it possible to know a target direction with optimized absolute accuracy, corresponding approximately to a measurement accuracy of the optical metrological sensor, within tolerance of the catalogue accuracy. 2. The absolute target system according to claim 1, the known bright star presents a magnitude that can be 3, 4, 5 or 6. 3. The absolute target system according to claim 1, wherein the optical metrological sensor comprises a set of detectors of CCD, CMOS or APS type. 4. The absolute target system according to claim 1, wherein the optical metrological sensor presents an accuracy enabling it to determine a relative position of a target object at 20 meters to within approximately 10 microns, so making it possible to achieve a target angular accuracy less than or equal to approximately 0.1 second of arc. 5. The absolute target system according to claim 1, wherein calibration of the optical metrological sensor is adapted to be performed on the ground, using an incoherent fibre-connected optical source with a power of the order of a milliwatt. 6. Satellite comprising an observation instrument, including the absolute target system according to claim 1, enabling it to accurately point the observation instrument to a celestial body. 7. An absolute pointing method using the absolute target system according to claim 1, said star sensor presenting a wide field of view and the optical metrological sensor presenting a detection field and a target axis, wherein: initially, the star sensor brings the known bright star, chosen as target direction, into a detection field of the optical metrological sensor via any displacement control and application means of said absolute target system, or even, the wide field of view of the star sensor and the detection field of the optical metrological sensor overlap, by appropriate accommodation of said star sensor and optical metrological sensor, then, the optical metrological sensor measures the target direction in its own frame of reference, the accurate knowledge of the target direction corresponding to the known bright star in the frame of reference of the optical metrological sensor and of the absolute position of said known bright star due to the star catalogue making it possible to ultimately deduce the absolute target direction accurately. 8. The method according to claim 7, wherein there is a star catalogue on the ground, with an accuracy greater than the catalogue accuracy of the star catalogues incorporated in said absolute target system, and in that said star catalogue on the ground is referred to in order to increase the absolute accuracy concerning the knowledge of the coordinates of said known bright star, so as to increase the accuracy of the absolute target direction.
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