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Apparatus and method for downhole formation testing using a spectrometer includes a carrier conveyable into a well borehole that traverses a subterranean formation of interest, a plurality of semiconductor light sources disposed on the carrier, a fluid sample cell that receives light emitted from th

Apparatus and method for downhole formation testing using a spectrometer includes a carrier conveyable into a well borehole that traverses a subterranean formation of interest, a plurality of semiconductor light sources disposed on the carrier, a fluid sample cell that receives light emitted from the plurality of semiconductor light sources, and at least one photodetector that detects light emitted from the plurality of semiconductor light sources and after the light interacts with a fluid in the fluid sample cell.

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What is claimed is: 1. A downhole formation testing spectrometer apparatus comprising: a carrier conveyable into a well borehole that traverses a subterranean formation of interest; a plurality of semiconductor light sources disposed on the carrier wherein each semiconductor light source in the plu

What is claimed is: 1. A downhole formation testing spectrometer apparatus comprising: a carrier conveyable into a well borehole that traverses a subterranean formation of interest; a plurality of semiconductor light sources disposed on the carrier wherein each semiconductor light source in the plurality emits a unique wavelength band; a fluid sample cell that receives light emitted from the plurality of semiconductor light sources; at least one photodetector that detects light emitted from the plurality of semiconductor light sources and after the light interacts with a fluid in the fluid sample cell; and a modulator configured to modulate a light intensity of each of the semiconductor light sources in the plurality at a different electrical frequency and to filter output from the at least one photodetector to determine the spectral contribution from each of the semiconductor light sources. 2. An apparatus according to claim 1, wherein the plurality of semiconductor light sources includes one or more laser diodes. 3. An apparatus according to claim 1, wherein the plurality of semiconductor light sources includes one or more LEDs. 4. An apparatus according to claim 1, wherein the at least one photodetector comprises a single photodetector having a response band at least as wide as an emitted bandwidth of from the plurality of semiconductor light sources. 5. An apparatus according to claim 1, wherein the modulator further modulates a wavelength of each light source of the plurality of semiconductor light sources. 6. An apparatus according to claim 1, wherein the modulator modulates an on-off cycle of each light source of the plurality of semiconductor light sources to modulate the light intensity. 7. An apparatus according to claim 1, wherein the electrical frequency of modulation of each of the light sources in the plurality of semiconductor light sources is selected from relatively prime frequencies. 8. An apparatus according to claim 1, wherein the modulator further modulates a temperature of the plurality of semiconductor light sources. 9. An apparatus according to claim 1, wherein the plurality of semiconductor light sources include at least a first laser diode and a second laser diode, the apparatus further comprising a non-linear optical medium carrying light emitted from the first laser diode and the second laser diode to the fluid sample cell. 10. An apparatus according to claim 8, wherein the modulator modulates temperature by changing an electrical current supplied to each light source in the plurality of semiconductor light sources. 11. An apparatus according to claim 9, wherein the non-linear optical medium comprises an optic fiber, the first laser diode emitting a first light having a first short wavelength, the second laser diode emitting a second light having a second short wavelength, the first light and the second light being mixed and passed through the optic fiber to generate a third wavelength corresponding to a sum of the energies of the emitted first short wavelength and second short wavelength and a fourth wavelength corresponding to a difference between the energies of the emitted first short wavelength and second short wavelength. 12. An apparatus according to claim 11 wherein the fourth wavelength corresponds to an infrared wavelength range, the fourth wavelength being used to perform infrared spectroscopy. 13. A method for downhole spectrometry comprising: conveying a carrier into a well borehole that traverses a subterranean formation of interest; emitting light from a plurality of semiconductor light sources disposed on the carrier wherein each semiconductor light source in the plurality emits a unique wavelength band; modulating an intensity of the light emitted from each semiconductor light source at a different electrical frequency using a modulator; receiving the light at a fluid sample cell; detecting the light emitted from the plurality of semiconductor light sources and after the light interacts with a fluid in the fluid sample cell using at least one photodetector; and filtering the detected light to determine the spectral contribution from each of the semiconductor light sources. 14. A method according to claim 13, wherein the plurality of semiconductor light sources includes one or more laser diodes and emitting the light comprises emitting light at a plurality of narrow wavelengths. 15. A method according to claim 13, wherein plurality of semiconductor light sources includes one or more LEDs and emitting the light comprises emitting light at a plurality of wideband wavelengths. 16. A method according to claim 13, wherein receiving the light comprises using a single photodetector having a response band at least as wide as an emitted bandwidth from the plurality of semiconductor light sources. 17. A method according to claim 13, wherein modulating the light further includes modulating a wavelength of each light source of the plurality of semiconductor light sources. 18. A method according to claim 13, wherein modulating an intensity of the emitted light includes modulating an on-off cycle of each light source of the plurality of semiconductor light sources. 19. A method according to claim 13, wherein the frequency of each of the light sources in the plurality of semiconductor light sources is selected from relatively prime frequencies. 20. A method according to claim 13, wherein modulating further includes modulating a temperature of the plurality of semiconductor light sources. 21. A method according to claim 13, wherein emitting light comprises emitting light from a first laser diode and a second laser diode, the method further comprising passing the emitted light through a non-linear optical medium to the fluid sample cell. 22. A method according to claim 20, wherein modulating the temperature comprises changing an electrical current supplied to each light source in the plurality of semiconductor light sources. 23. A method according to claim 21, wherein the non-linear optical medium comprises an optic fiber and emitting light comprises emitting a first light having a first short wavelength from the first laser diode and emitting a second light having a second short wavelength from the second laser diode, the method further comprising mixing the first light and the second light forming a mixed light passed through the optic fiber. 24. A method according to claim 23 further comprising generating a third light wavelength corresponding to a sum of the energies of the emitted first short wavelength and second short wavelength, and generating a fourth wavelength corresponding to a difference between the energies of the emitted first short wavelength and second short wavelength. 25. A method according to claim 24, wherein the fourth wavelength corresponds to an infrared wavelength range, the method further comprising using the fourth wavelength to perform infrared spectroscopy.