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| 국가/구분 | United States(US) Patent 등록 |
|---|---|
| 국제특허분류(IPC7판) |
|
| 출원번호 | UP-0489747 (2006-07-18) |
| 등록번호 | US-7786512 (2010-09-20) |
| 발명자 / 주소 |
|
| 출원인 / 주소 |
|
| 대리인 / 주소 |
|
| 인용정보 | 피인용 횟수 : 5 인용 특허 : 527 |
A non-volatile memory array includes a multiplicity of memory cells, each of whose area is less than 4 F2 per cell (where F is a minimum feature size), and periphery elements to control the memory cells. The present invention also includes a non-volatile memory array which includes word lines and bi
A non-volatile memory array includes a multiplicity of memory cells, each of whose area is less than 4 F2 per cell (where F is a minimum feature size), and periphery elements to control the memory cells. The present invention also includes a non-volatile memory array which includes word lines and bit lines generally perpendicular to the word lines, with a word line pitch of less than 2 F. In one embodiment, the word lines are made of polysilicon spacers.
What is claimed is: 1. A non-volatile memory array comprising: word lines; and bit lines generally perpendicular to said word lines, wherein: (a) a pitch between two neighboring word lines is less than 2 F, (b) said pitch is a word line width and a word line spacing, and (c) a minimum spacing is el
What is claimed is: 1. A non-volatile memory array comprising: word lines; and bit lines generally perpendicular to said word lines, wherein: (a) a pitch between two neighboring word lines is less than 2 F, (b) said pitch is a word line width and a word line spacing, and (c) a minimum spacing is electrically limited to the point at which a dielectric between neighboring word lines breaks down. 2. The array of claim 1 and wherein said word line pitch is between 1 F and 2 F. 3. The array according to claim 1 and wherein said array is a NROM (nitride read only memory) array. 4. The array according to claim 1 and wherein a distance from a first word line to a word line two away from said first word line is 2 F. 5. The array according to claim 1 and wherein said word line width is at least 0.5 F and said spacing is less than 0.5 F. 6. The array according to claim 1 and wherein said dielectric is oxide-nitride-oxide. 7. The array according to claim 1 and wherein said word lines are formed from polysilicon spacers. 8. The array according to claim 7 and wherein said word lines are at least 0.1 F wide. 9. A non-volatile memory chip comprising: (a) an array of memory cells each of whose area is less than 4 F2 per cell, wherein F is a minimum feature size; (b) wherein said array also comprises word lines and bit lines generally perpendicular to said word lines such that a pitch between two neighboring word lines is less than 2 F, said pitch is a word line width and a word line spacing, and a minimum spacing is electrically limited to the point at which a dielectric between neighboring word lines breaks down; and (c) periphery elements to control said memory cells. 10. The chip according to claim 5 and wherein said cells are NROM cells. 11. The chip according to claim 9 wherein gates of rows of said memory cells are formed together into word lines and wherein a word line width is at least 0.5 F and a word line spacing is less than 0.5 F. 12. The chip according to claim 11 and wherein said rows are formed of metal. 13. The chip according to claim 9 wherein gates of rows of said memory cells are formed together into word lines and wherein said word lines are formed from polysilicon spacers. 14. The chip according to claim 13 and wherein said word lines are at least 0.1 F wide. 15. The chip according to claim 13 and wherein a distance from a first word line to a word line two away from said first word line is 2 F. 16. A non-volatile memory array comprising: polysilicon spacer word lines; and bit lines generally perpendicular to said word lines, wherein: (a) a pitch between two neighboring word lines is less than 2 F, (b) said pitch is a word line width and a word line spacing, and (c) a minimum spacing is electrically limited to the point at which a dielectric between neighboring word lines breaks down. 17. The array according to claim 16 and wherein said spacer word lines are at least 0.1 F wide. 18. The array according to claim 16 and wherein a distance from a first word line to a word line two away from said first word line is 2 F. 19. The array according to claim 16 and wherein the width of said word lines is less than 1 F. 20. The array according to claim 19 and wherein said word lines generally pass low currents during programming.
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