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Systems and methods for compressing an encapsulant adjacent a semiconductor workpiece are disclosed. A method in accordance with one aspect includes placing a semiconductor workpiece and an encapsulant in a mold cavity and driving some of the encapsulant from the mold cavity to an overflow chamber.

Systems and methods for compressing an encapsulant adjacent a semiconductor workpiece are disclosed. A method in accordance with one aspect includes placing a semiconductor workpiece and an encapsulant in a mold cavity and driving some of the encapsulant from the mold cavity to an overflow chamber. The method can further include applying pressure to the encapsulant in the mold cavity via pressure applied to the encapsulant in the overflow chamber.

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I claim: 1. A method for encapsulating a semiconductor workpiece, comprising: placing a semiconductor workpiece and an encapsulant in a mold cavity, the mold cavity having an open position and a closed position; driving some of the encapsulant from the mold cavity to an overflow chamber; applying p

I claim: 1. A method for encapsulating a semiconductor workpiece, comprising: placing a semiconductor workpiece and an encapsulant in a mold cavity, the mold cavity having an open position and a closed position; driving some of the encapsulant from the mold cavity to an overflow chamber; applying pressure to the encapsulant in the mold cavity via pressure applied to the encapsulant in the overflow chamber; and severing encapsulant in the overflow chamber from encapsulant in the mold cavity while the mold cavity is in the closed position and the overflow chamber is pressurized. 2. The method of claim 1 wherein placing a semiconductor workpiece and an encapsulant in a mold cavity includes placing the semiconductor workpiece proximate to a first mold element, placing the encapsulant adjacent to the semiconductor workpiece, and moving at least one of the first mold element and a second mold element toward the other to at least partially enclose the semiconductor workpiece and the encapsulant. 3. The method of claim 2 wherein driving some of the encapsulant from the mold cavity into the overflow chamber is performed by moving at least one of the first mold element and a second mold element toward the other. 4. The method of claim 1 wherein applying pressure to the encapsulant in the mold cavity includes collapsing voids in the encapsulant. 5. The method of claim 1 wherein driving some of the encapsulant includes driving individual portions of the encapsulant into corresponding individual overflow chambers. 6. A method for encapsulating a semiconductor workpiece, comprising: disposing an encapsulant adjacent to a semiconductor workpiece; moving at least one of a first mold element and a second mold element relative to the other with the first and second mold elements forming, at least in part, a mold cavity around the semiconductor workpiece; forcing some of the encapsulant from the mold cavity into an overflow chamber as the at least one mold element moves relative to the other; pressurizing the overflow chamber, wherein pressurizing the overflow chamber includes applying pressure to the encapsulant in the mold cavity; and separating encapsulant in the overflow chamber from encapsulant in the mold cavity by moving at least a pressurized volume of the overflow chamber relative to the mold cavity. 7. The method of claim 6 wherein forcing some of the encapsulant into the overflow chamber includes applying a force on the encapsulant with the first or the second mold element. 8. The method of claim 6, further comprising controlling a spacing between the first and second mold elements to be at least approximately identical on successive encapsulation cycles for a corresponding succession of semiconductor workpieces. 9. The method of claim 8 wherein controlling the spacing between the first and second mold elements includes driving the at least one mold element into contact with a stop located at a fixed position relative to the other mold element. 10. The method of claim 6, further comprising stopping motion of the at least one mold element relative to the other at a predetermined location. 11. The method of claim 10 wherein stopping motion of the at least one mold element includes bearing the mold elements against each other. 12. The method of claim 6 wherein moving the at least one mold element includes distributing the encapsulant within the mold cavity. 13. The method of claim 12 wherein distributing the encapsulant includes directing the encapsulant adjacent to solder balls projecting from a surface of the semiconductor workpiece. 14. The method of claim 6 wherein applying pressure to the encapsulant in the mold cavity includes applying pressure via a communication port between the overflow chamber and the mold cavity. 15. The method of claim 6 wherein applying pressure includes moving a piston that is in fluid communication with the overflow chamber. 16. The method of claim 6 wherein applying pressure includes moving a piston within the overflow chamber. 17. The method of claim 16, wherein forcing some of the encapsulant from the mold cavity includes pressing the encapsulant against the piston, moving the piston, and increasing a volume of the overflow chamber bounded by the piston. 18. The method of claim 16 wherein moving the piston includes moving the piston in a first direction, and wherein the method further comprises moving the piston in a second direction opposite the first direction at least until the piston separates the encapsulant in the overflow chamber from the encapsulant in the mold cavity. 19. The method of claim 18, further comprising at least partially hardening the encapsulant in the overflow chamber before separating the encapsulant in the overflow chamber from the encapsulant in the mold cavity. 20. The method of claim 6 wherein: the overflow chamber is bounded by a first piston on a first side and a second piston on a second side; pressuring the overflow chamber comprises forcing at least the first piston toward the encapsulant; and wherein separating encapsulant in the overflow chamber comprises moving at least the second piston. 21. The method of claim 20 wherein the first piston and the second piston are generally aligned along a common axis. 22. The method of claim 6 wherein the mold cavity has a generally circular shape, and wherein forcing some of the encapsulant from the mold cavity includes forcing individual portions of the encapsulant into corresponding overflow chambers positioned around a periphery of the mold cavity. 23. The method of claim 6 wherein disposing an encapsulant adjacent to a semiconductor workpiece includes disposing the encapsulant adjacent to a generally circular semiconductor wafer having multiple semiconductor dies. 24. The method of claim 6 wherein disposing an encapsulant adjacent to a semiconductor workpiece includes disposing the encapsulant adjacent to a singulated semiconductor die. 25. The method of claim 6, further comprising driving solder balls carried by the semiconductor workpiece through the encapsulant and into a flexible liner in the mold cavity as the at least one mold element moves relative to the other. 26. The method of claim 6 wherein: the semiconductor workpiece includes a generally circular wafer; moving at least one of the first and second mold elements relative to the other includes driving the at least one mold element into contact with a stop located at a fixed position relative to the other mold element; and wherein applying pressure to the encapsulant includes moving a piston within the overflow chamber and collapsing cavities in the encapsulant in the mold cavity. 27. A method for encapsulating a semiconductor workpiece, comprising: placing a semiconductor workpiece in a mold cavity; introducing an encapsulant into the mold cavity and adjacent to the workpiece; pressing an overflow portion of the encapsulant from the mold cavity into an overflow chamber; pressing conductive elements projecting from a surface of the workpiece into a flexible material at a wall of the mold cavity and out of the encapsulant, separating the overflow portion in the overflow chamber from the encapsulant within the mold cavity by moving the overflow chamber relative to the mold cavity while the mold cavity is in a closed position and the overflow chamber is pressurized; and removing the flexible material from the conductive elements. 28. The method of claim 27 wherein pressing conductive elements includes pressing volumes of solder. 29. The method of claim 27 wherein pressing conductive elements includes pressing solder balls. 30. The method of claim 27 wherein pressing conductive elements includes pressing conductive bumps. 31. The method of claim 27 wherein pressing conductive elements includes pressing conductive elements into a flexible film. 32. The method of claim 31 wherein pressing conductive elements includes pressing conductive elements into a flexible film having a thickness of at least 200 microns. 33. The method of claim 27, further comprising: removing the workpiece from the mold cavity after encapsulation; and removing the flexible material from the mold cavity prior to encapsulating a subsequent workpiece. 34. The method of claim 27 wherein pressing conductive elements includes moving a first portion of a mold relative to a second portion of the mold, the first and second portions of the mold bounding, at least in part, the mold cavity. 35. The method of claim 6 wherein moving the overflow cavity relative to the mold cavity comprises moving the mold cavity while the overflow chamber remains stationary. 36. A method for encapsulating a semiconductor workpiece, comprising: placing a semiconductor workpiece and an encapsulant in a mold cavity, the mold cavity having an open position and a closed position; driving some of the encapsulant from the mold cavity to an overflow chamber; applying pressure to the encapsulant in the mold cavity via pressure applied to the encapsulant in the overflow chamber; and severing encapsulant in the overflow chamber from encapsulant in the mold cavity while maintaining each of the overflow chamber and the mold cavity at a constant interior volume.