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[미국특허] Catadioptric projection objective 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G02B-017/00
출원번호 US-0100233 (2008-04-09)
등록번호 US7869122 (2010-12-28)
발명자 / 주소
  • Shafer, David
  • Ulrich, Wilhelm
  • Dodoc, Aurelian
  • Von Buenau, Rudolf
  • Mann, Hans-Juergen
  • Epple, Alexander
출원인 / 주소
  • Carl Zeiss SMT AG
대리인 / 주소
    Fish & Richardson P.C.
인용정보 피인용 횟수 : 2  인용 특허 : 205

초록

A catadioptric projection objective for imaging a pattern provided in an object plane of the projection objective onto an image plane of the projection objective comprises: a first objective part for imaging the pattern provided in the object plane into a first intermediate image; a second objective

대표청구항

What is claimed is: 1. A catadioptric projection objective for imaging a pattern provided in an object plane of the projection objective onto an image plane of the projection objective comprising:an optical axis;a plurality of lenses and at least one concave mirror having a continuous mirror surface

이 특허에 인용된 특허 (205) 인용/피인용 타임라인 분석

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이 특허를 인용한 특허 (2) 인용/피인용 타임라인 분석

  1. Mann, Hans-Juergen; Schoeppach, Armin; Zellner, Johannes, Microlithographic imaging optical system including multiple mirrors.
  2. Mann, Hans-Juergen; Schoeppach, Armin; Zellner, Johannes, Microlithographic imaging optical system including multiple mirrors.

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