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[미국특허] Method and apparatus for testing devices using serially controlled intelligent switches 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-001/02
출원번호 US-0862751 (2007-09-27)
등록번호 US7977959 (2011-06-28)
발명자 / 주소
  • Berry, Tommie Edward
  • Sporck, Alistair Nicholas
출원인 / 주소
  • FormFactor, Inc.
대리인 / 주소
    Kirton & McConkie
인용정보 피인용 횟수 : 1  인용 특허 : 95

초록 ▼

Methods and apparatus for testing devices using serially controlled intelligent switches have been described. In some embodiments, a probe card assembly can be provided that includes a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial c

대표청구항 ▼

The invention claimed is: 1. A probe card assembly, comprising:a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to at least one serial control line, the plurality of ICs including switches coupled to test probes, each of the switches being programmable res

이 특허에 인용된 특허 (95) 인용/피인용 타임라인 분석

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이 특허를 인용한 특허 (1) 인용/피인용 타임라인 분석

  1. Berry, Tommie Edward; Sporck, Alistair Nicholas, Method and apparatus for testing devices using serially controlled intelligent switches.
    상세보기

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