$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Methods for control of plasma transitions in sputter processing systems using a resonant circuit 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B23K-010/00
출원번호 US-0216424 (2005-08-30)
등록번호 US-8089026 (2012-01-03)
발명자 / 주소
  • Sellers, Jeff C
출원인 / 주소
  • MKS Instruments, Inc.
대리인 / 주소
    Proskauer Rose LLP.
인용정보 피인용 횟수 : 18  인용 특허 : 43

초록

Methods and apparatus for controlling a plasma used for materials processing feature cooperative action of a resonant circuit and a switch unit coupled to a plasma vessel and a power supply. A sensor for acquiring a signal associated with a state of a plasma in the plasma vessel supports closed-loop

대표청구항

1. A method for DC-plasma processing comprising: supplying power to a plasma vessel with a power supply, to ignite a plasma in the plasma vessel;measuring current across a resonant circuit that is in electrical communication with an output of the power supply;measuring voltage across the resonant ci

이 특허에 인용된 특허 (43)

  1. Scholl Richard A., Adjustable energy quantum thin film plasma processing system.
  2. Eastburn Lindsey ; Mass Leon, Apparatus and method for controlling high throughput sputtering.
  3. Ilic, Milan; Siddabattula, Kalyan N. C.; Malinin, Andrey B., Apparatus and method for fast arc extinction with early shunting of arc current in plasma.
  4. Szczyrbowski Joachim,DEX ; Teschner Gotz,DEX, Apparatus for coating substrates in a vacuum.
  5. Boling Norman L. (Santa Rosa CA), Apparatus for reducing the intensity and frequency of arcs which occur during a sputtering process.
  6. Sellers Jeff C. (Palmyra NY), Arc control and switching element protection for pulsed dc cathode sputtering power supply.
  7. Tetsuo Morita JP; Hiroshi Jou JP, Arc-extinguishing circuit and arc-extinguishing method.
  8. Nerone Louis R., Ballast circuit for gas discharge lamp.
  9. Anderson Glen L. (2922 Amity Rd. Hilliard OH 43204) Hammond Peter W. (614 Courtview Dr. Greensburg PA 15601) Yotive David S. (11600 St. Rt. 736 Marysville OH 43040), Circuit for detecting and diverting an electrical arc in a glow discharge apparatus.
  10. Manley Barry W. (Boulder CO) Billings Keith H. (Guelph CAX), Circuit for reversing polarity on electrodes.
  11. Porter Thomas W. (Clearwater FL) Ross ; Jr. Craig G. (Largo FL), Computer-based metering arrangement including a circuit interrupter.
  12. Teschner Gtz (Gelnhausen DEX), Device for the suppression of arcs.
  13. Barbour Erskine, Dual mode power supply and under voltage trip device.
  14. Kloeppel, Andreas; Daube, Christoph; Stollenwerk, Johannes; Linz, Thomas, Electric supply unit and method for reducing arcing during sputtering.
  15. Drummond Geoffrey N. ; Scholl Richard A., Enhanced reactive DC sputtering system.
  16. Drummond Geoffrey N. ; Scholl Richard A., Enhanced reactive DC sputtering system.
  17. Sellers Jeff C., Etch process employing asymmetric bipolar pulsed DC.
  18. Christie, David J., High peak power plasma pulsed supply with arc handling.
  19. Sun Chuen-Tsai (Pao-Shan Shiang TWX) Jang Jyh-Shing (Framingham MA) Fu Chi-Yung (San Francisco CA), Intelligent system for automatic feature detection and selection or identification.
  20. Heider,Peter; Runggaldier,Diethard; Streich,Bernhard, Method for determining the switching state of a contact and evaluation circuit corresponding thereto.
  21. Sakaue Yoshitaka (Nara JPX) Ohno Eiji (Hirakata JPX) Ide Kazuhisa (Osaka JPX) Nagata Kenichi (Nishinomiya JPX) Yamada Noboru (Hirakata JPX), Method for fabricating optical information storage medium.
  22. Farrington Ronald L. (Cedar Rapids IA) Porter Thomas W. (Clearwater FL), Microcomputer-controlled circuit breaker system.
  23. Farrington Ronald L. (Cedar Rapids IA), Microprocessor-controlled circuit breaker and system.
  24. Drummond, Geoffrey; Scholl, Richard A., Periodically clearing thin film plasma processing system.
  25. Norris, Stephen W.; Chamberlin, Roger; Morrie, David, Plasma arc torch system with pilot re-attach circuit and method.
  26. Fitzgerald ; Dennis J. ; Breshears ; Robert R., Plasma igniter for internal combustion engine.
  27. Nishimori Yasuhiro,JPX ; Taniguchi Michio,JPX ; Kondo Kazuki,JPX, Plasma monitoring apparatus.
  28. Denda, Atsushi; Ito, Yoshinao, Plasma monitoring method and semiconductor production apparatus.
  29. Imatake Mitsuko,JPX ; Sasaki Ichiro,JPX ; Otsubo Toru,JPX ; Tamura Hitoshi,JPX ; Kamimura Takashi,JPX, Plasma processing apparatus and processing method.
  30. Karino Kunio (Suita JPX) Moriguchi Haruo (Itami JPX) Fujiyoshi Toshikazu (Kawanishi JPX) Kinoshita Atsushi (Osaka JPX) Hashimoto Takashi (Suma-ku JPX), Plasma-arc power supply apparatus.
  31. Noboru Kuriyama JP; Yutaka Yatsu JP; Yoshio Kawamata JP; Takashi Fujii JP, Power supply unit for sputtering device.
  32. Sellers Jeff C., Preferential sputtering of insulators from conductive targets.
  33. Sellers Jeff C. (Palmyra NY), Preferential sputtering of insulators from conductive targets.
  34. Tobita Tomoyuki (Katsuta JPX) Yamamoto Yoshimi (Ibaraki-ken JPX) Fukunaga Masao (Tokyo JPX) Kobayahsi Teruo (Katsuta JPX) Nagasu Akira (Ibaraki-ken JPX), Process detection apparatus.
  35. Vona Daniel F. ; Gerrish Kevin S. ; Nasman Kevin P., Process detection system for plasma process.
  36. Scholl Richard A. ; Christie David J., Pulsed direct current power supply configurations for generating plasmas.
  37. Weber Harold J. (Sherborn MA), R.F. Sputtering apparatus including multi-network power supply.
  38. Wilbur Joseph, Ratiometric autotuning algorithm for RF plasma generator.
  39. Sellers, Jeff C., Sputtering apparatus using passive arc control system and method.
  40. Kenmotsu Akihiro (Fujisawa JPX) Kobayashi Shigeru (Setagaya JPX) Watanabe Kunihiko (Yokohama JPX) Matsuzaki Eiji (Yokohama JPX) Yoritomi Yoshifumi (Yokohama JPX) Koshita Toshiyuki (Yokohama JPX) Naka, Sputtering method and apparatus.
  41. Meacham, David D.; Haruff, John J., System for igniting and controlling a wafer processing plasma.
  42. Jahns Gary L., System for indirectly monitoring and controlling a process with particular application to plasma processes.
  43. Okano Manabu (Tokyo JPX), Topographically precise thin film coating system.

이 특허를 인용한 특허 (18)

  1. Bhutta, Imran Ahmed, Electronically variable capacitor and RF matching network incorporating same.
  2. Bhutta, Imran Ahmed, High speed high voltage switching circuit.
  3. Bhutta, Imran, High voltage switching circuit.
  4. Buchanan, Walter Riley, Membrane plasma reactor.
  5. Choi, Sang-Don, Method and apparatus for detecting arc in plasma chamber.
  6. Bolles, Michael; Sun, Yin Sheng; Buck, Lindsay; Russell, Glyn, Optical emission system including dichroic beam combiner.
  7. Bolles, Michael; Sun, Yin Sheng; Buck, Lindsay; Russell, Glyn, Optical emission system including dichroic beam combiner.
  8. Buchanan, Walter Riley, Plasma reactor for liquid and gas.
  9. Buchanan, Walter Riley; Forsee, Grant William, Quasi-resonant plasma voltage generator.
  10. Bhutta, Imran Ahmed, RF impedance matching network.
  11. Bhutta, Imran Ahmed, RF impedance matching network.
  12. Bhutta, Imran Ahmed, RF impedance matching network.
  13. Bhutta, Imran Ahmed, RF impedance matching network.
  14. Mavretic, Anton, RF impedance matching network.
  15. Mavretic, Anton, RF impedance matching network.
  16. Mavretic, Anton, Switching circuit.
  17. Mavretic, Anton, Switching circuit.
  18. Mavretic, Anton, Switching circuit for RF currents.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로